GB/T 4722-2017Test methods for rigid copper clad laminates for printed circuits board (English PDF)
印制电路用刚性覆铜箔层压板试验方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
May 31, 2017
Implementation date
December 1, 2017
Scope
GB/T 4722-2017 is the English-translated version of 印制电路用刚性覆铜箔层压板试验方法.
GB/T 4722-2017 specifies the test methods for the appearance, the size, the physical and chemical properties, the mechanical properties, the electrical properties and the environmental performance of rigid copper clad laminates for printed circuit boards, which it abbreviates to CCLs, and clause 1 states that it applies to rigid copper clad laminates for printed circuits.
Clause 2 cites GB/T 1409, GB/T 2423.28-2005 and GB/T 4207-2012, together with a microscopy method for measuring the thickness of metallic and oxide coatings whose number the draft does not finish printing.
Clause 3, General requirements, fixes the standard atmospheric conditions for normal testing and the narrower conditions for arbitration testing, the way test treatment conditions are written, the temperature variation permitted in the environmental test chamber over time and across the working area, the sampling and etching methods for preparing samples, and the test report.
The test clauses then run from Appearance, which covers the copper foil surface, the surface not covered with foil and the insulating substrate after etching, through size, with length and width, the vertical measured by a diagonal method with the ruler method kept for arbitration, thickness, and bow and twist, to physical and chemical properties, which covers the cleanability of metal surfaces, chemical resistance, halogen content, vertical and horizontal flammability, thermal stress, solderability by the side leaching method, the glass transition temperature by the DSC, DMA and TMA methods, the Z-axis and X/Y-axis coefficients of thermal expansion, the thermal decomposition temperature by TGA, the thermal stratification time, heat resistance and ultraviolet light transmittance.
Mechanical properties covers pulling strength, peel strength in four conditions, bending strength, dimensional stability and punching force; electrical performance covers breakdown voltage in the parallel layer, electrical strength, volume and surface resistivity, insulation resistance, the dielectric constant and dielectric loss tangent by three methods, resistance to arc and the tracking index; and environmental performance covers pressure vessel thermal stress and water absorption.
Each test subclause is laid out in the same way, with its purpose, its instruments and materials, its chemical reagents where any are used, the sample, the procedure and the report, and the normative Appendix A adds four CCL etching methods, using ammonium persulfate, ferric chloride, acid copper chloride and alkaline chloride.
The foreword records that the classification of the methods was refined from electrical and non-electrical performance into these six groups and that many of the tests, among them the halogen content, the glass transition temperature, the thermal expansion coefficients, the heat resistance and the ultraviolet light transmittance, are new compared with the 1992 edition.
The standard was proposed by the Ministry of Industry and Information Technology of the People's Republic of China and is held by the National Standard Committee on Printed Circuit (SAC/TC47).
It replaces GB/T 4722-1992, was issued on May 31, 2017 and has applied since December 1, 2017.
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Document preview — GB/T 4722-2017
National Standard of the People's Republic of China
- ICS
- 31.180
- Classification
- L 30
- Replacing
- GB/T 4722-1992
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- 1 Scope
- 2 normative reference document
- 3.1 Test conditions
- 3.1.1 Standard atmospheric conditions for normal testing
- 3.1.2 Criteria for Arbitration Testing Atmospheric conditions
- 3.1.3 Test treatment conditions Representation
- 3.2 Temperature change of environmental test chamber
- 3.2.1 Changes in temperature over time in the work area
- 3.2.2 changes in temperature within the work area with space
- 3.3 Preparation of the sample
- 3.3.1 Sampling method
- 3.3.2 Etching method of sample
- 3.4 Test Report
- 4 Appearance
- 4.1 copper foil surface and not covered with foil surface appearance
- 4.1.1 Purpose
- 4.1.2 Instruments and materials
- 4.1.3 Sample
- 4.1.4 Procedure
- 4.1.5 Test report
- 4.2 Insulation substrate after etching
- 4.2.1 Purpose
- 4.2.2 Instruments and Materials
- 4.2.3 Sample
- 4.2.4 Procedure
- 4.2.5 Test Report
- 5 size
- 5.1 Length and width
- 5.1.1 Purpose
- 5.1.2 Instruments and Materials
- 5.1.3 Sample
- 5.1.4 Procedure
- 5.1.5 Report
- 5.2 Vertical
- 5.2.1 Purpose
- 5.2.2 Instruments and Materials
- 5.2.3 Sample
- 5.2.4 Procedure
- 5.2.5 Report
- 5.3 thickness
- 5.3.1 Purpose
- 5.3.2 Instruments and Materials
- 5.3.3 Sample
- 5.3.4 Procedure
- 5.3.5 Report
- 5.4 bow and twist
- 5.4.1 Purpose
- 5.4.2 Instruments and Materials
- 5.4.3 Specimen
- 5.4.4 Procedure
- 5.4.5 Report
- 6 Physical and chemical properties
- 6.1 Cleanability of metal surfaces
- 6.1.1 Purpose
- 6.1.2 Instruments and Materials
- 6.1.3 Chemical reagents
- 6.1.4 Sample
- 6.1.5 Procedure
- 6.1.6 Report
- 6.2 Chemical resistance
- 6.2.1 Purpose
- 6.2.2 Instruments and Materials
- 6.2.4 Sample
- 6.2.5 Procedure
- 6.2.6 Report
- 6.3 Halogen content
- 6.3.1 Purpose
- 6.3.2 Instruments and Materials
- 6.3.3 Chemical reagents
- 6.3.4 Sample
- 6.3.5 Procedure
- 6.3.6 Report
- 6.4 Flammability
- 6.4.1 Vertical combustion
- 6.4.2 Horizontal combustion
- 6.5 Thermal stress
- 6.5.1 Purpose
- 6.5.3 Sample
- 6.5.4 Procedure
- 6.5.5 Report
- 6.6 Solderability (side leaching method)
- 6.6.1 Purpose
- 6.6.2 Instruments and Materials
- 6.6.3 Chemical Reagent
- 6.6.4 Sample
- 6.6.5 Procedure
- 6.6.6 Report
- 6.7 Glass transition temperature
- 6.7.1 DSC (Differential Scanner) method
- 6.7.2 DMA (dynamic mechanical analyzer) method (bending mode and drawing mode)
- 6.7.3 TMA (thermomechanical analyzer) probe method (Z axis method)
- 6.8 Z-axis thermal expansion coefficient (TMA probe method)
- 6.8.1 Purpose
- 6.8.2 Instruments and Materials
- 6.8.3 Sample
- 6.8.4 Procedure
- 6.8.5 Calculation formula
- 6.8.6 Report
- 6.9 Thermal decomposition temperature (Td) (TGA method)
- 6.9.1 Purpose
- 6.9.2 Instruments and Materials
- 6.9.3 Sample
- 6.9.4 Procedure
- 6.9.5 Report
- 6.10 X/Y axis thermal expansion coefficient (TMA stretching method)
- 6.10.1 Purpose
- 6.10.3 Sample
- 6.10.4 Procedure
- 6.10.5 Calculate Equation
- 6.10.6 Report
- 6.11 Thermal stratification time (TMA probe method)
- 6.11.1 Purpose
- 6.11.3 Sample
- 6.11.4 Procedure
- 6.11.5 Assessment
- 6.11.6 Report
- 6.12 Heat resistance
- 6.12.1 Purpose
- 6.12.2 Instruments and Materials
- 6.12.3 Sample
- 6.12.4 Procedure
- 6.12.5 Report
- 6.13 Ultraviolet light (UV) transmittance
- 6.13.1 Purpose
- 6.13.2 Instruments and Materials
- 6.13.3 Sample
- 6.13.4 Procedure
- 6.13.5 Calculation of results
- 6.13.6 Report
- 7 Mechanical properties
- 7.1 Pulling strength
- 7.1.1 Purpose
- 7.1.3 Sample
- 7.1.4 Procedure
- 7.1.5 Report
- 7.2 Peel strength
- 7.2.1 Peel strength under acceptance
- 7.2.2 peel strength after thermal stress
- 7.2.3 peel strength at high temperature
- 7.2.4 Peel strength after exposure to process solution
- 7.3 bending strength
- 7.3.1 Purpose
- 7.3.2 Instruments and Materials
- 7.3.3 Specimen
- 7.3.4 Procedure
- 7.3.5 Calculation of results
- 7.3.6 Report
- 7.4 Dimensional stability
- 7.4.1 Purpose
- 7.4.3 Sample
- 7.4.4 Procedure
- 7.4.5 Result calculation
- 7.4.6 Report
- 7.5 Punching force
- 7.5.1 Purpose
- 7.5.2 Instruments and Materials
- 7.5.3 Specimens
- 7.5.4 Procedure
- 7.5.5 Assessment
- 7.5.6 Report
- 8 Electrical performance
- 8.1 Breakdown voltage (parallel layer)
- 8.1.1 Purpose
- 8.1.2 Test conditions
- 8.1.3 Instruments and Materials
- 8.1.4 Sample
- 8.1.5 Procedure
- 8.1.6 Report
- 8.2 Electrical strength
- 8.2.1 Purpose
- 8.2.2 Test conditions
- 8.2.3 Instruments and Materials
- 8.2.4 Sample
- 8.2.5 Procedure
- 8.2.6 Result calculation
- 8.2.7 Report
- 8.3 Volume resistivity and surface resistivity
- 8.3.1 Purpose
- 8.3.2 Instruments and Materials
- 8.3.3 Sample
- 8.3.4 Procedure
- 8.3.5 Calculation of results
- 8.3.6 Report
- 8.4 Insulation resistance
- 8.4.1 Purpose
- 8.4.2 Instruments and Materials
- 8.4.3 Sample
- 8.4.4 Procedure
- 8.4.5 Report
- 8.5 Dielectric constant and dielectric loss tangent
- 8.5.1 Two-fluid tank method
- 8.5.2 Parallel plate method
- 8.5.3 Q table method
- 8.6 Resistance to arc
- 8.6.1 Purpose
- 8.6.2 Test conditions
- 8.6.3 Instruments and Materials
- 8.6.4 Sample
- 8.6.5 Procedure
- 8.6.6 Report
- 8.7 compared to the tracking index
- 8.7.1 Purpose
- 8.7.3 Sample
- 8.7.4 Procedure
- 8.7.5 Report
- 9.1 Pressure vessel thermal stress
- 9.1.1 Purpose
- 9.1.2 Instruments and Materials
- 9.1.3 Sample
- 9.1.4 Procedure
- 9.1.5 Assessment
- 9.1.6 Report
- 9.2 Water absorption
- 9.2.3 Specimen
- 9.2.4 Procedure
- 9.2.5 Calculation of results
- 9.2.6 Report
- Appendix A (Normative Appendix) CCL Etching Method
- A.1 Ammonium persulfate etching method
- A.2 Ferric chloride etching method
- A.3 Acid Copper Chloride Etching Method
- A.4 Alkaline chloride etching method
- Index
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
This standard replaces GB/T 4722-1992 "Test method for copper clad laminate for printed circuit".
This standard compared with GB/T 4722-1992, in addition to editorial changes in the main technical changes are as follows.
--- name changed to "printed circuit with rigid copper clad laminate test method";
--- This standard refers to the overall classification of the method from the electrical and non-electrical performance test refined into appearance, size, physical and chemical properties, machine Mechanical properties, electrical properties and environmental tests;
Applicable to rigid copper clad laminates (see Chapter 1);
--- normative reference documents added GB/T 6462-2005, removed GB/T 2036 and GB/T 2423.3 (see Chapter 2, Chapter 2 of the 1992 edition);
- increased the temperature requirements of the test conditions and the environmental test chamber (room) (see 3.1);
- Four alternative methods of sample preparation are provided for the selection of ferrous trichloride for arbitration (see 3.3.2 and Appendix A);
- increase the appearance of the insulating substrate after etching (see Chapter 4);
- Removal of the laminated copper foil per unit area mass (etch method) test method, increased the width/length of the test method (see Chapter 5, Chapter 22 of the 1992 edition);
--- increase the diagonal method to measure the vertical, keep the ruler method for the arbitration method (see 5.2);
- an increase in the thickness of the measurement point diagram (see 5.3);
--- bow/distorted result value expressed as a percentage value (see 5.4);
--- increase the metal surface can be clean, chemical resistance, substrate halogen content, glass transition temperature (Tg, deltaTg), Z-axis thermal expansion (Td), X/Y-axis thermal expansion coefficient, thermal stratification time (TMA method), heat resistance, and ultraviolet light transmittance (see Chapter 6);
- increase the vertical combustion method of the test sample pretreatment oven baking conditions, ignition flame height from (19 ± 1) mm to (20 ± 1) mm, increasing the FV-2 combustion judgment level. Increased the combustion formula of horizontal combustion method and FHB combustion (See 6.4);
--- The thermal shock bubble was renamed thermal stress, increased dip welding method, for the arbitration and identification test increased pre-baking conditions, thermal stress temperature The degree and time conditions are subject to the specification of the product (see chapter 6.5, chapter 17 of the 1992 edition);
- Lead-free solders in instruments and materials should be agreed upon by both parties (see 6.6);
--- pull-off rate "to 5 ~ 50N/s force evenly increase the tension" to "select the appropriate pull the file to (50 ± 2) mm/min The speed of the pull lead "(see 7.1, 1992 edition of 15.5.4);
- After removal of dry heat, exposure to solvent vapor, exposure to simulated peel conditions after stripping strength. Increased stripping under acceptance From the strength, increased anti-stripping instrument with automatic recording curve recorder to determine the value of the map, modified the exposure to the process solution under the stripping The width of the strip (see 7.2, 1992, Chapter 16);
--- modified bending strength test test thickness range, the parameter selection to list the form that increased the high temperature of the various resin materials Temperature selection table (see 7.3, 1992, chapter 25);
--- Increased shear board size stability sampling, increased thermal stability under the conditions of drying, dry heat conditions increased from 125 °C to 150 ° C. Modified sampling and positioning diagram. An increase in the value of the numerical processing of the deletion method (see 7.4, 1992 edition Chapter 21);
--- Remove the copper foil resistance test method, surface corrosion test method, edge corrosion test. Increased breakdown voltage (parallel layer), Resistant arcs (see Chapter 8, Chapters 6, 8 and 9 of the 1992 edition);
--- The applicable thickness range for electrical strength is changed from 0.8mm or less to 0.5mm or less. By manual step-by-step boost to automatic boost, Increased electrical strength calculation formula (see 8.2, 1992 edition 13.1);
--- Change the method name surface resistance to surface resistivity. An increase of 96 h after wet heat treatment was retained in a wet box and measured After 20 wet heat cycles, the samples were retained in a humid chamber to measure two treatment test conditions (see 8.3, 1992, section 7 chapter);
--- modified the insulation resistance of the sample size and number and hole spacing. Increased water boil after the measurement (see 8.4, 1992 edition of the 12th chapter);
- a two-fluid tank method with a dielectric constant and dielectric loss tangent test, parallel plate method (see 8.5);
--- modified the pressure vessel thermal stress sample size and sample cooking time, an increase of 5 levels of surface quality rating and schematic diagram (see 9.1, chapter 28 of the 1992 edition);
--- the sample water absorption to the oven in the (105 ~ 110) °C drying 1h. The results are changed from the difference before and after immersion (See 9.2, chapter 27 of the 1992 edition);
--- Added Appendix A CCL Etching Method.
1 Scope
This standard specifies the appearance, size, physical and chemical properties of rigid copper clad laminates for printed circuit boards (hereinafter referred to as CCLs) Mechanical properties, electrical properties, environmental performance of the test method.
This standard applies to rigid copper clad laminates for printed circuits.
2 Normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this document. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 1409 measurement of electrical insulation materials in the frequency, audio, high frequency (including the wavelength of meters, etc.), the permittivity and dielectric loss factor Of the recommended method
GB/T 2423.28-2005 Environmental testing for electric and electronic products - Part 2: Test methods - Test T. Soldering
GB/T 4207-2012 Determination of resistance to traceability and comparison of electrical traces for solid insulation materials
Metallic and oxide coatings - Thickness measurement - Microscopy method GB/T
3 General requirements
3.1 Test conditions
3.1.1 Standard atmospheric conditions for normal testing
Unless otherwise specified, the test shall be carried out under the following conditions.
a) Temperature. 15 ° C to 35 ° C;
b) relative humidity. 20% to 80%;
c) Atmospheric pressure. test site air pressure.
3.1.2 Standard conditions for arbitration tests
If the test parameters are dependent on temperature, humidity and air pressure, the test shall be carried out under standard atmospheric conditions of the following arbitration test.
a) Temperature. (23 ± 2) ° C;
b) relative humidity. 45% to 55%;
c) Atmospheric pressure. 86kPa ~ 106kPa.
3.1.3 Test condition representation
The test conditions can be expressed in English letters and numbers, expressed as follows.
a) English letters indicate the type of processing.
1) A is the original state of acceptance, without treatment;
2) C is treated in constant temperature and humidity air;
3) D is immersed in constant temperature water for treatment;
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 82 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 1409Recommended methods for the determination of the permittivity and dielectric dissipation factor of electrical insulating materials at power, audio and radio frequencies including meter wavelengths
- GB/T 2423.28-2005Environmental testing for electric and electronic products - Part 2: Test methods - Test T: Soldering
- GB/T 4207-2012Method for the determination of the proof and the comparative tracking indices of solid insulating materials
Cited by
- GB 47371-2026Safety technical specification for electric bicycle charging piles
- GB/T 48118-2026Ceramic copper-clad substrate for power semiconductor modules
- GB/T 28859-2025Epoxy powder encapsulation material for electronic packaging
- GB/T 46379-2025Bismaleimide triazine (BT) base material for integrated circuit packaging
- GB/T 44295-2024Epoxide woven E-glass prepreg for multilayer printed boards
- GB/T 43059-2023Requirements of flatness control for printed boards and printed board assemblies
Similar standards
Editions of GB/T 4722
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 4722-2017 | Test methods for rigid copper clad laminates for printed circuits board | current edition | Current |
| GB/T 4722-1992 | Test methods for rigid copper clad laminates for printed circuits board | previous edition | Superseded |
This page sells the current edition, GB/T 4722-2017. Earlier editions are listed for reference only.
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