GB/T 48118-2026Ceramic copper-clad substrate for power semiconductor modules (English PDF)
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Issued by
State Administration for Market Regulation
Level / Type
National · Recommended
Issue date
August 28, 2026
Implementation date
March 1, 2027
Scope
GB/T 48118-2026 (Ceramic copper-clad substrate for power semiconductor modules) is available as an English-translated PDF.
GB/T 48118-2026 is a national standard for ceramic copper-clad substrates used in power semiconductor modules, made by the direct copper cladding process, abbreviated DBC.
It covers classification and marking, technical requirements, test methods and inspection rules, together with marking, packaging, transportation and storage. The terms section defines the ceramic copper-clad substrate and surface defects such as sintering bubble blistering and bulge.
It applies to DBC ceramics used in power semiconductors, including resistor substrates, semiconductor cooling devices, integrated circuits, power modules and micromotors.
Ceramic substrates made by other copper-cladding processes can use it as a reference. Issued on 28 August 2026 and applicable from 1 March 2027, it replaces no earlier standard.
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Document preview — GB/T 48118-2026
National Standard of the People's Republic of China
- ICS
- 81.060.30
- Classification
- Q 32
Issued by: State Administration for Market Regulation
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents".
1 Scope
This document specifies the classification and marking of ceramic copper-clad laminates for power semiconductors prepared using the direct copper cladding process (hereinafter referred to as "DBC").
Technical requirements, test methods, inspection rules, as well as marking, packaging, transportation and storage.
This document applies to DBC ceramics used in power semiconductors such as resistor substrates, semiconductor cooling devices, integrated circuits, power modules, and micromotors.
Copper-clad laminates, and other copper-clad ceramic laminates using other copper-clad processes can be used as a reference.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are listed below.
For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies to this document.
GB/T 2828.1 Sampling Procedures for Inspection by Attributes - Part 1: Sampling Schemes Retrieved by Acceptable Quality Limit (AQL) for Lot-by-Lot Inspection
GB/T 4722-2017 Test methods for rigid copper-clad laminates for printed circuits
GB/T 5593 Structural Ceramic Materials for Electronic Components
GB/T 5594.4 Test methods for the properties of structural ceramic materials for electronic components - Part 4: Dielectric constant and dielectric loss tangent Value testing methods
GB/T 6062 Product Geometric Specification (GPS) - Nominal Characteristics of Contact (Stylus) Instruments Using Surface Structure Profile Method
GB/T 9530 Terminology for Electronic Ceramics
GB/T 9531.1 Technical Requirements for Electronic Ceramic Components
GB/T 39862 Determination of thermal conductivity of high thermal conductivity ceramics
GB/T 45763 Fine Ceramics - Test Method for Room Temperature Bending Strength of Thin Ceramic Plates - Three-Point Bending or Four-Point Bending Method
3 Terms and Definitions
The terms and definitions defined in GB/T 5593 and GB/T 9530, as well as the following terms and definitions, apply to this document.
3.1 Ceramic copper-clad substrate
A ceramic composite plate in which copper is directly bonded to the surface of a ceramic substrate at high temperature.
Note: There are two types. single-sided ceramic copper clad laminate and double-sided ceramic copper clad laminate.
3.2 Sintering bubble blistering
The phenomenon of copper surface bulging at the interface between copper and ceramic substrate during the sintering process.
3.3 Bulge
The surface protrusion is caused by localized accumulation of copper material.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 9 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 2828.1Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
- GB/T 4722-2017Test methods for rigid copper clad laminates for printed circuits board
- GB/T 5593Structure ceramic materials used in electronic component and device
- GB/T 5594.4Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value
- GB/T 6062Geometrical product specifications (GPS) -- Surface texture: Profile method -- Nominal characteristic of contact (stylus) instruments
- GB/T 9530Terms for electronic ceramics
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Related Standards
GB/T 2828.1-2012 — Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
GB/T 2828.10-2010 — Sampling procedures for inspection by attributes -- Part 10: Introduction to the GB/T 2828 series of standards for sampling for inspection by attributes
GB/T 2828.11-2008 — Sampling procedures for inspection by attributes Part 11: Procedures for assessment of declared quality levels for small population
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