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GB/T 5594.4-2015Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value (English PDF)

电子元器件结构陶瓷材料性能测试方法第4部分：介电常数和介质损耗角正切值的测试方法

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

May 15, 2015

Implementation date

January 1, 2016

Scope

GB/T 5594.4-2015 is the English-translated version of 电子元器件结构陶瓷材料性能测试方法第4部分：介电常数和介质损耗角正切值的测试方法.

GB/T 5594.4-2015 is the Chinese standard "Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value".

Its scope clause reads: This part of GB/T 5594 specifies the use of electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates Test method for dielectric constant and dielectric loss tangent of ceramic materials.

This part applies to electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates.

The rate of 1MHz, the temperature from room temperature to 500 °C under the conditions of dielectric constant and dielectric loss tangent test. Its clauses include normative reference documents; terms and definitions; test principle.

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Document preview — GB/T 5594.4-2015

National Standard of the People's Republic of China

ICS: 31.030
Classification: L 90
Replacing: GB/T 5594.4-1985

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

1 Scope
2 normative reference documents
3 terms and definitions
4 test principle

1 Scope

This part of GB/T 5594 specifies the use of electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates

Test method for dielectric constant and dielectric loss tangent of ceramic materials.

This part applies to electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates.

The rate of 1MHz, the temperature from room temperature to 500 °C under the conditions of dielectric constant and dielectric loss tangent test.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article

Pieces. For undated references, the latest edition (including all modifications) applies to this document.

Electronic components - Structural ceramic materials GB/T 5593-2015

Terminology of electronic ceramics - Terminology GB/T 9530-1988

3 terms and definitions

GB/T 9530-1988 Definitions and the following terms and definitions apply to this document.

3.1 Permittivity

One of the main parameters of the dielectric properties of the reaction dielectric, the capacitance of the capacitor consisting of the dielectric and the same geometric size of the vacuum capacitor

The ratio of the capacitance is called the dielectric constant epsilon (dimensionless).

3.2 Dielectric loss tangent value

tandelta

The ratio of active power to reactive power under the action of alternating electric field is a dimensionless physical quantity that characterizes the dielectric loss.

4 test principle

4.1 Meaning of dielectric loss

The dielectric loss of the ceramic material represents a property of the energy loss when the AC field is passed through the material. Can also be said to accept the material

AC power field, due to polarization or absorption of the phenomenon of the production process, resulting in a loss of power. It has two basic properties, namely, dielectric

Constant epsilon and dielectric loss tangent tandelta.

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

Referenced standards

Cited by

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Editions of GB/T 5594.4

Edition	Title	Revision	Status
GB/T 5594.4-2015	Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value	current edition	Current
GB/T 5594.4-1985	Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value	previous edition	Superseded

This page sells the current edition, GB/T 5594.4-2015. Earlier editions are listed for reference only.

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