GB/T 5594.1-1985Test methods for properties of structure ceramic used in electronic components. Test method for gas-tightness (English PDF)
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Issued by
National Bureau of Standards
Level / Type
National · Recommended
Issue date
November 27, 1985
Implementation date
December 1, 1986
Scope
GB/T 5594.1-1985 (Test methods for properties of structure ceramic used in electronic components. Test method for gas-tightness) is available as an English-translated PDF.
GB/T 5594.1-1985 — This standard applies to electronic ceramics at room temperature under air tightness test component structure.
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Document preview — GB/T 5594.1-1985
National Standard of the People's Republic of China
- ICS
- 31.03
- Classification
- L 32
Issued by: National Bureau of Standards
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard applies to electronic ceramics at room temperature under air tightness test component structure.
Document data
International classification (ICS): 31.03.
Chinese classification (CCS): L32.
Estimated length of the Chinese original: 1,169 words.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 1 pages — is available in the English PDF.
Referenced standards
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Related Standards
GB/T 5594.2-1985 — Test methods for properties of structure ceramic used in electronic components--Test method for Youngelastic modulus and Poisson ratio
GB/T 5594.3-2015 — Test methods for properties of structure ceramic used in electronic components and device - Part 3: Test method for mean coefficient of linear expansion
GB/T 5594.4-2015 — Test methods for properties of structure ceramic used in electronic components and device - Part 4: Test method for permittivity and dielectric loss angle tangent value
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GB/T 5594.1-1985
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