GB/T 45767-2025Silicon nitride ceramic substrates (English PDF)
氮化硅陶瓷基片
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
June 30, 2025
Implementation date
January 1, 2026
Scope
GB/T 45767-2025 is the English-translated version of 氮化硅陶瓷基片.
GB/T 45767-2025 is the Chinese national standard covering the ceramic plate a power semiconductor module is built on — the classification and marking, the flexural strength in three- or four-point bending, the thermal conductivity and the thermal expansion coefficient that has to sit close to that of the chip it carries, the dielectric constant and loss, the volume resistivity and electric strength, the density and porosity, the surface roughness, the hardness and fracture resistance, and the inspection rules. First edition, under the China Building Materials Federation. In force from 1 January 2026. Issued on 30 June 2025, it has been in force since 1 January 2026.
Document preview — GB/T 45767-2025
National Standard of the People's Republic of China
- ICS
- 81.060.30
- Classification
- Q 32
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 3.1
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document is proposed by China Building Materials Federation.
This document is under the jurisdiction of the National Technical Committee for Standardization of Industrial Ceramics (SAC/TC194).
This document was drafted by: Sinoma High-Tech Nitride Ceramics Co., Ltd., Hengyang Kaixin Special Materials Technology Co., Ltd., Zhejiang Polyhedron New Materials Co., Ltd., Zhejiang Litai Composite Materials Co., Ltd., Jilin Changyu Special Ceramics New Materials Technology Co., Ltd., Shandong Industrial Ceramics Porcelain Research and Design Institute Co., Ltd., Zhejiang Dehui Electronic Ceramics Co., Ltd., Zhuzhou Ruidel Intelligent Equipment Co., Ltd., Henan Nolante New Materials Technology Co., Ltd., Shandong Sinoceramic Functional Materials Co., Ltd., Hebei Gaofu Silicon Nitride Materials Co., Ltd., Rogers Technology (Suzhou) Co., Ltd.
Co., Ltd., Shanghai Institute of Ceramics, Chinese Academy of Sciences, China National Testing Holding Group Zibo Co., Ltd., Zhuzhou Aisenda New Materials Technology Co., Ltd., Taisheng New Materials Technology Co., Ltd., Jiangsu Fulehua Power Semiconductor Research Institute Co., Ltd., and Kimike Materials Technology (Suzhou) Co., Ltd., Fujian Zhenjing New Materials Technology Co., Ltd., Anyang Henry Hi-Tech Industrial Co., Ltd., Nantong Sanzhi Precision Ceramics Co., Ltd., An Huilanxun Communication Technology Co., Ltd., Jiangxi Silicon Nitride New Materials Co., Ltd., Fujian Huaqing Electronic Materials Technology Co., Ltd., Loudi Andi Yas Electronic Ceramics Co., Ltd., Wuxi Haigood New Technology Co., Ltd., Jinan University, Hunan Weishang Technology Co., Ltd., Xinhua County, Hunan Province Xinxing Electronic Ceramics Co., Ltd., Zhejiang Zhengtian New Materials Technology Co., Ltd., and Shandong Minghui Special Ceramics Co., Ltd.
The main drafters of this document are: Sun Feng, Shang Chaofeng, Zhang Hui, Wang Zaiyi, Dong Tingxia, Zhang Yelei, Dong Weiqiang, Chen Changzhu, Li Yongquan, Luan Ting, Zhang Jingxian, Zhang Guojun, Wang Yujin, Li Yingxin, Jiang Danyu, Wang Xingang, Li Kai, Wu Ping, Zhang Yunhe, Sun Wei, Tian Zhuo, Huang Shidong, Gao Liwen, Li Bowen, Dai Weiming, Ge Zhuang, Liu Weiping, Qu Peng, Xia Jinghao, Li Qiuju, Yan Yongjie, Zhu Wei, Lin Wensong, Li Guang, Huang Wensi, Kang Dinghua, Mo Xuekui, Chen Pingsong, Yan Hui, Zeng Xiaofeng, Yuan Zhenwei, Zhang Hengju, Huang Rongxia, Zhang Xuelian, Cao Jianhui, Jiang Weixin, Liu Shen, Zhao Degang, Lin Delong, Wang Meiling.
Silicon nitride ceramic substrate
1 Scope
This document specifies the product classification and marking, technical requirements, test methods, inspection rules, marking, packaging, transportation, etc. of silicon nitride ceramic substrates. and storage.
This document is applicable to silicon nitride ceramic substrates for power semiconductor modules and can be used as a reference for silicon nitride ceramic substrates for other functions.
2 Normative references
GB/T 191
GB/T 1408.1
GB/T 2828.1
GB/T 5594.4
GB/T 5594.5
GB/T 6062
GB/T 9530
GB/T 10700
GB/T 14619-2013
GB/T 16534
GB/T 16535
GB/T 16555
GB/T 17991
GB/T 22588
GB/T 25995
GB/T 39975-2021
GB/T 41605
GB/T 45763
3 Terms and Definitions
The terms and definitions defined in GB/T 9530 and GB/T 17991 and the following apply to this document.
3.1
A sheet-like silicon nitride ceramic support on which conductor patterns, membrane elements, or electronic components can be printed.
Note. Hereinafter referred to as substrate.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 191Graphical symbols marking for handling and storage of packages
- GB/T 2828.1Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
- GB/T 5594.4Test methods for properties of structure ceramic used in electronic components and device—Part 4: Test method for permittivity and dielectric loss angle tangent value
- GB/T 10700Test methods for elastic moduli of fine ceramics (advanced ceramics, advanced technical ceramics) - Bending method
- GB/T 14619-2013Alumina ceramic substrates for thick film integrated circuits
- GB/T 16555Chemical analysis of refractories containing carbon, silicon carbide or nitride
GB/T 1408.1 · GB/T 5594.5 · GB/T 6062 · GB/T 9530 · GB/T 16534 · GB/T 16535 · GB/T 17991 · GB/T 25995 · GB/T 41605 · GB/T 45763
Editions of GB/T 45767
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 45767-2025 | Silicon nitride ceramic subtrates | current edition | Current |
This page sells the current edition, GB/T 45767-2025. Earlier editions are listed for reference only.
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Related Standards
GB/T 10700-2006 — Test methods for elastic moduli of fine ceramics (advanced ceramics, advanced technical ceramics) - Bending method
GB/T 14619-2013 — Alumina ceramic substrates for thick film integrated circuits
GB/T 16555-2025 — Chemical analysis of refractories containing carbon, silicon carbide or nitride
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