GB/T 14264-2024Terminology of semiconductor materials (English PDF)
半导体材料术语
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Issued by
State Administration for Market Regulation; Standardization Administration of China
Level / Type
National · Recommended
Issue date
April 25, 2024
Implementation date
November 1, 2024
Scope
GB/T 14264-2024 is the English-translated version of 半导体材料术语.
GB/T 14264-2024 is the Chinese standard "Terminology of semiconductor materials".
Its scope clause reads: This document defines general terms and definitions for semiconductor materials, terms and definitions for materials preparation and processes, and defects, as well as abbreviations: This document applies to the research and development, production, preparation and related fields of semiconductor materials:. Its clauses include general terms.
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Document preview — GB/T 14264-2024
National Standard of the People's Republic of China
- ICS
- 29.045
- Classification
- H80
Issued by: State Administration for Market Regulation; Standardization Administration of China
Contents
- Preface
- 1 Scope
- 2 Normative references
- 3 General terms
- 4 Material preparation and process
- 5 Defects
- 6 Abbreviations and abbreviations
1 Scope
This document defines general terms and definitions for semiconductor materials, terms and definitions for materials preparation and processes, and defects, as well as abbreviations:
This document applies to the research and development, production, preparation and related fields of semiconductor materials:
2 Normative references
This document has no normative references:
3 General terms
3:1
Semiconductor
The conductivity is between that of a conductor and an insulator: The resistivity is about 10-5ohm·cm~1012ohm·cm at room temperature:
A solid that has two types of carriers, negatively charged electrons and negatively charged electrons, and has a negative temperature coefficient of resistance, photoconductivity effect, and rectification effect:
substance:
Note: Semiconductors are divided into single crystal, polycrystalline and amorphous according to their structure:
3:2
An ideal semiconductor whose lattice is complete and free of impurities, and in which the number of electrons and holes participating in conduction is almost equal under thermal equilibrium conditions:
Note: An intrinsic semiconductor is a semiconductor that contains only trace amounts of impurities and has electrical conductivity very close to that of an ideal semiconductor:
3:3
A semiconductor material composed of atoms of a single element:
Note: Such as silicon, germanium, diamond, etc:
3:4
A semiconductor material formed by two or more different elements in a certain atomic ratio:
Note: Gallium arsenide (GaAs), indium phosphide (InP), cadmium telluride (CdTe), silicon carbide (SiC), gallium nitride (GaN), gallium oxide (GaO), indium gallium nitride (InGaN) and
Aluminum gallium indium phosphide (AlGaInP), etc:
3:5
It is usually a semiconductor material with a bandgap of not less than 2:3 eV:
Note: Common wide bandgap semiconductor materials include silicon carbide (SiC), gallium nitride (GaN), zinc oxide (ZnO), gallium oxide (beta-Ga2O3), diamond, aluminum nitride (AlN) etc:
3:6
Semi-insulating GaAs
Gallium arsenide single crystal with resistivity greater than 1×107ohm·cm:
Note: Used as substrate material for microelectronic devices:
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 54 pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 35305-2026Gallium arsenide monocrystals and polished wafers for solar cells
- GB/T 43894.2-2026Practice for determining semiconductor wafer near-edge geometry - Part 2: Roll-off amount (ROA)
- GB/T 47080-2026Test method for the dislocation density of polished single crystal diamond wafers
- GB/T 47082-2026Test method for stacking faults in polished monocrystalline silicon carbide wafers
- GB/T 47089-2026Test method for determining the geometrical parameters of patterns on patterned sapphire substrates
- GB/T 47097-2026Polished monocrystalline aluminium nitride wafers
Similar standards
Editions of GB/T 14264
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 14264-2024 | Terminology of semiconductor materials | current edition | Current |
| GB/T 14264-2009 | Semiconductor materials - Terms and definitions | previous edition | Superseded |
This page sells the current edition, GB/T 14264-2024. Earlier editions are listed for reference only.
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