GB/T 1550-1997Standard methods for measuring conductivity type of extrinsic semiconducting materials (English PDF)
非本征半导体材料导电类型测试方法
GB/T 1550 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 1550-2018 | Test methods for conductivity type of extrinsic semiconducting materials | Valid |
| GB/T 1550-1997 | Standard methods for measuring conductivity type of extrinsic semiconducting materials | Obsolete |
GB/T 1550-1997 is obsolete. It has been replaced by GB/T 1550-2018. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
State Bureau of Technical Supervision
Level / Type
National · Recommended
Issue date
June 3, 1997
Implementation date
December 1, 1997
Scope
GB/T 1550-1997 is the English-translated version of 非本征半导体材料导电类型测试方法.
GB/T 1550-1997 is the Chinese national standard "Standard methods for measuring conductivity type of extrinsic semiconducting materials". It was issued on June 3, 1997 by the State Bureau of Technical Supervision, and took effect on December 1, 1997. It is obsolete: it has been replaced by GB/T 1550-2018.
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Document preview — GB/T 1550-1997
National Standard of the People's Republic of China
Issued by: State Bureau of Technical Supervision
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: State Bureau of Technical Supervision.
Date of issue: 1997-06-03.
Date of implementation: 1997-12-01.
Status: obsolete, replaced by GB/T 1550-2018.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
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- GB/T 29057-2023Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
- GB/T 12963-2022Electronic-grade polycrystalline silicon
- GB/T 26069-2022Annealed monocrystalline silicon wafers
- GB/T 41325-2022Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
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