GB/T 4937-1995Mechanical and climatic test methods for semiconductor devices (English PDF)
半导体器件机械和气候试验方法
GB/T 4937 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 4937.2-2006 | Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure | Valid |
| GB/T 4937-1995 | Mechanical and climatic test methods for semiconductor devices | Obsolete |
GB/T 4937-1995 is obsolete. It has been replaced by GB/T 4937.2-2006. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
State Bureau of Technical Supervision
Level / Type
National · Recommended
Issue date
January 2, 1995
Implementation date
August 1, 1996
Scope
GB/T 4937-1995 is the English-translated version of 半导体器件机械和气候试验方法.
GB/T 4937-1995 is the Chinese national standard "Mechanical and climatic test methods for semiconductor devices". It was issued on January 2, 1995 by the State Bureau of Technical Supervision, and took effect on August 1, 1996. It is obsolete: it has been replaced by GB/T 4937.2-2006.
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Document preview — GB/T 4937-1995
National Standard of the People's Republic of China
Issued by: State Bureau of Technical Supervision
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: State Bureau of Technical Supervision.
Date of issue: 1995-01-02.
Date of implementation: 1996-08-01.
Status: obsolete, replaced by GB/T 4937.2-2006.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
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Related Standards
GB/T 4937.1-2006 — Semiconductor devices -- Mechanical and climatic test methods -- Part 1: General
GB/T 4937.2-2006 — Semiconductor devices -- Mechanical and climatic test methods -- Part 2: Low air pressure
GB/T 4937.3-2012 — Semiconductor devices -- Mechanical and climatic tests methods -- Part 3: External visual examination
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GB/T 4937-1995
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