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GB/T 4937.2-2006Semiconductor devices -- Mechanical and climatic test methods -- Part 2: Low air pressure (English PDF)

半导体器件机械和气候试验方法第2部分：低气压

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Issued by

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

Level / Type

National · Recommended

Issue date

August 23, 2006

Implementation date

February 1, 2007

Scope

GB/T 4937.2-2006 is the English-translated version of 半导体器件机械和气候试验方法第2部分：低气压.

GB/T 4937.2-2006 — This standard applies to low pressure testing of semiconductor devices. The purpose of this test is a side fixed components and material ability to prevent electrical breakdown failure, and this failure is due to air pressure decreases, the air insulation and other insulating material weakening caused.

This item applies only to face trial work voltage exceeding 1 000 V devices. This test applies to all air sealing semiconductor devices. This test applies only to military and space fields.

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Document preview — GB/T 4937.2-2006

National Standard of the People's Republic of China

ICS: 31.080
Classification: L 40
Replacing: GB/T 4937-1995 Partial

Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

What this standard covers1
Document data2
Standards quoted by this document3

What this standard covers

This standard applies to low pressure testing of semiconductor devices. The purpose of this test is a side fixed components and material ability to prevent electrical breakdown failure, and this failure is due to air pressure decreases, the air insulation and other insulating material weakening caused. This item applies only to face trial work voltage exceeding 1 000 V devices. This test applies to all air sealing semiconductor devices. This test applies only to military and space fields. The term low pressure test methods and IEC 60068-2-13 largely the same, but in view of the special requirements of semiconductor devices, the use of this part of the terms.

Document data

International classification (ICS): 31.080.

Chinese classification (CCS): L40.

Estimated length of the Chinese original: 7,760 words.

Adopted international standard: IEC 60749-2-2002, IDT.

Supersedes the earlier edition GB/T 4937-1995 Partial.

Standards quoted by this document

IEC 60068-2-13

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 5 pages — is available in the English PDF.

Referenced standards

Cited by

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