GB/T 43538-2023Quality and technical requirements for metal packages used for integrated circuits (English PDF)
集成电路金属封装外壳质量技术要求
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
December 28, 2023
Implementation date
July 1, 2024
Scope
GB/T 43538-2023 is the English-translated version of 集成电路金属封装外壳质量技术要求.
GB/T 43538-2023 is the Chinese national standard covering quality and technical requirements for metal packages used for integrated circuits. Issued on 28 December 2023, it has been in force since 1 July 2024.
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Document preview — GB/T 43538-2023
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 55
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- PrefaceIII
- 1 Scope1
- 2 Normative references1
- 3 Terms and Definitions1
- 4 Technical requirements5
- 4:1 Materials5
- 4:2 Plating5
- 4:3 Design and structure5
- 4:4 Electrical properties5
- 4:5 Appearance quality6
- 4:6 Environmental adaptability6
- Appendix A (normative) Coating quality test method7
- A:1 Gold plating layer quality test method7
- A:2 Nickel plating quality test method7
- Appendix B (Normative) Metal casing appearance quality requirements9
- B:1 Quality Requirements9
- B:2 Inspection conditions29
Foreword
This document complies with the provisions of GB/T 1:1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting:
Please note that some content in this document may be subject to patents: The publisher of this document assumes no responsibility for identifying patents:
This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China:
This document is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78):
This document was drafted by: China Electronics Technology Standardization Institute, Guangdong Gaozhi Emerging Industry Development Research Institute, Hefei Shengda Electronic Technology Technology Industrial Co:, Ltd:, Hebei Zhongci Electronic Technology Co:, Ltd:, Qingdao Kairui Electronics Co:, Ltd:, Guangdong Zhongshaoxuan Standardization Technology Research Institute Co:, Ltd:, Shenzhen Qiyue Technology Co:, Ltd:
The main drafters of this document: An Qi, Huang Zhigang, Hu Haitao, Zhao Jing, Chen Xiangbo, Cui Congjun, and Chang Shousheng:
Technical requirements for the quality of integrated circuit metal packaging casings
1 Scope
This document specifies the materials, plating, design and structure, electrical characteristics, appearance quality and environmental adaptability of integrated circuit metal packaging casings:
technical requirements and inspection methods:
This document applies to the development, production, delivery and use of integrated circuit metal packaging casings (hereinafter referred to as "casings"):
2 Normative reference documents
GB/T 4937
GB/T 4937
GB/T 4937
GB/T 4937
GB/T 4937
GB/T 16526
GB/T 19248
IEC 60749
IEC 60749
IEC 60749
3 Terms and definitions
The following terms and definitions apply to this document: 3:1 wall sidewall The inner surface of the housing that forms the sealed cavity:
NOTE: Contains and protects product circuitry with connections extending to leads inside the enclosure: 3:2 base The main support area at the bottom of the enclosure:
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 27 pages — is available in the English PDF.
Referenced standards
Editions of GB/T 43538
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 43538-2023 | Quality and technical requirements for metal packages used for integrated circuits | current edition | Current |
This page sells the current edition, GB/T 43538-2023. Earlier editions are listed for reference only.
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Related Standards
GB/T 16526-1996 — Test method of measuring the lead-to-lead and loading capacitance of package leads
GB/T 19248-2003 — Test method for measuring the resistance of package leads
GB/T 4937.1-2006 — Semiconductor devices -- Mechanical and climatic test methods -- Part 1: General
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