JB/T 2989-2016Sheet metal micrometers (English PDF)
板厚千分尺
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Issued by
MIIT
Level / Type
Industry · Recommended
Issue date
January 15, 2016
Implementation date
June 1, 2016
Scope
JB/T 2989-2016 is the English-translated version of 板厚千分尺.
JB/T 2989-2016 is a recommended Chinese machinery industry standard for sheet metal micrometers. It gives the terms and definitions, the types and basic parameters, the requirements, the test methods, the inspection conditions and inspection methods, and the marking and packaging for this instrument.
It applies to mechanical-reading and electronic digital sheet metal micrometers with a scale value of 0.01 mm or 0.001 mm, a resolution of 0.001 mm, a micrometer screw pitch of 0.5 mm, 1 mm or other values, measuring spans of 10 mm, 15 mm, 25 mm or 50 mm and an upper limit of the measuring range reaching 300 mm.
Among the standards it quotes are GB/T 1216, GB 4208, GB/T 17163 and GB/T 17626.2. It replaces JB/T 2989-1999.
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Document preview — JB/T 2989-2016
National Standard of the People's Republic of China
- ICS
- 25.060.20
- Replacing
- JB/T 2989-1999
Issued by: Ministry of Industry and Information Technology of the People's Republic of China
Contents
- Foreword
- Scope
- Normative references
- About this standard
- Related standards
- Classification and status
1 Foreword
JB/T 2989-2016 was issued by MIIT on 15 January 2016 and has been in force since 1 June 2016.
It replaces the earlier edition JB/T 2989-1999.
2 Scope
JB/T 2989-2016 is a recommended Chinese machinery industry standard for sheet metal micrometers. It gives the terms and definitions, the types and basic parameters, the requirements, the test methods, the inspection conditions and inspection methods, and the marking and packaging for this instrument. It applies to mechanical-reading and electronic digital sheet metal micrometers with a scale value of 0.01 mm or 0.001 mm, a resolution of 0.001 mm, a micrometer screw pitch of 0.5 mm, 1 mm or other values, measuring spans of 10 mm, 15 mm, 25 mm or 50 mm and an upper limit of the measuring range reaching 300 mm. Among the standards it quotes are GB/T 1216, GB 4208, GB/T 17163 and GB/T 17626.2. It replaces JB/T 2989-1999.
3 Normative references
JB/T 2989-2016 cites the following standards, which apply in full or in part through the references made to them in its clauses.
GB/T 1216-2004
GB/T 2423.3-2006
GB/T 2423.22-2012 — Environmental testing - Part 2: Test methods - Test N: Change of temperature
GB 4208-2008
GB/T 17163-2008
GB/T 17164-2008
GB/T 17626.2-2006
GB/T 17626.3-2006
GB/T 20919-2007
4 About this standard
Issued by: MIIT
English translation: about 15 pages
5 Related standards
Other editions:
JB/T 2989-1999 (earlier edition)
6 Classification and status
International classification (ICS): 25.060.20
Prefix JB/T: recommended standard.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 1216-2004External micrometer
- GB/T 2423.3-2006Environmental testing - Part 2: Testing method - Test Cab: Damp heat, steady state
- GB/T 2423.22-2012Environmental testing - Part 2: Test methods - Test N: Change of temperature
- GB/T 17163-2008Glossary of terms for dimensional measuring instruments - General terms
- GB/T 17164-2008Glossary of terms for dimensional measuring instruments - Product terms
- GB/T 17626.2-2006Electromagnetic compatibility -- Testing and measurement techniques -- Electrostatic discharge immunity test
GB 4208-2008
Similar standards
Editions of JB/T 2989
| Edition | Title | Revision | Status |
|---|---|---|---|
| JB/T 2989-2016 | Sheet metal micrometers | current edition | Current |
| JB/T 2989-1999 | Sheet metal micrometers | previous edition | Superseded |
This page sells the current edition, JB/T 2989-2016. Earlier editions are listed for reference only.
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Related Standards
GB/T 2423.22-2012 — Environmental testing - Part 2: Test methods - Test N: Change of temperature
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JB/T 10096-2026 — Cases for power semiconductor devices - Selection guidance
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