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GB/T 45968-2025Optical near stoichiometric lithium niobate crystal used in quantum information (English PDF)

量子信息用光学级近化学计量比铌酸锂晶体

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

August 1, 2025

Implementation date

February 1, 2026

Scope

GB/T 45968-2025 is the English-translated version of 量子信息用光学级近化学计量比铌酸锂晶体.

GB/T 45968-2025 is the Chinese standard "Optical near stoichiometric lithium niobate crystal used in quantum information".

Its scope clause reads: This document specifies the technical requirements, test methods, inspection and acceptance criteria for optical grade near-stoichiometric lithium niobate crystals for quantum information. packaging, labeling, storage and transportation, etc. This document applies to quantum information with thicknesses of 0.5 mm and 1 mm, diameters of 3 inches (in), 4 inches, and 6 inches, and x-cut and z-cut Design, production, inspection and acceptance of optical grade near stoichiometric lithium niobate crystal double polished wafers.

The main applications are optical superlattice, electrical Optical modulators, lithium niobate optical waveguide devices, lithium niobate single crystal films, etc. Note. 1 in=25.4 mm. Its clauses include terms and definitions.

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Document preview — GB/T 45968-2025

National Standard of the People's Republic of China

ICS: 31.030
Classification: Q 65

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Preface
1 Scope
2 Normative references
3 Terms and Definitions
4 Requirements
4.1 Appearance
4.2 Lithium content
4.3 Crystal Orientation Deviation
4.4 Total thickness change
4.5 Linear thickness variation
4.6 Curvature
4.7 Warpage
4.8 Roughness
4.9 Optical uniformity
4.10 Extinction ratio
4.11 Degree of Monodomainization
4.12 Coercive Electric Field Strength
4.13 Laser Damage Threshold
4.14 Light transmittance
4.15 Primary electro-optical coefficient
5 Detection Methods
5.1 Testing Environment
5.2 Surface quality
5.3 diameter
5.4 Thickness
5.5 Orientation plane length and second orientation plane length
5.6 Lithium Content
5.7 Crystal Orientation Deviation
5.8 Total thickness change
5.9 Local thickness variation
5.10 Curvature
5.11 Warpage
5.12 Roughness
5.13 Optical uniformity
5.14 Extinction ratio
5.15 Degree of Monodomainization
5.16 Coercive Electric Field Strength
5.17 Laser Damage Threshold
5.18 Light transmittance
5.19 Primary electro-optical coefficient
6 Inspection and Acceptance Rules
6.1 Inspection and Acceptance
6.2 Batch
6.3 Inspection Classification
6.4 Inspection Items
6.5 Batch inspection
6.6 Periodic Inspection
7 Packaging, labeling, storage and transportation
7.1 Packaging
7.2 Tags
7.3 Storage
7.4 Transportation
Appendix A (Normative) Test Method for Lithium Content
Appendix B (Normative) Determination of primary electro-optical coefficient

1 Scope

This document specifies the technical requirements, test methods, inspection and acceptance criteria for optical grade near-stoichiometric lithium niobate crystals for quantum information.

packaging, labeling, storage and transportation, etc.

This document applies to quantum information with thicknesses of 0.5 mm and 1 mm, diameters of 3 inches (in), 4 inches, and 6 inches, and x-cut and z-cut

Design, production, inspection and acceptance of optical grade near stoichiometric lithium niobate crystal double polished wafers. The main applications are optical superlattice, electrical

Optical modulators, lithium niobate optical waveguide devices, lithium niobate single crystal films, etc.

Note. 1 in=25.4 mm.

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document.

For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to

This document.

GB/T 191 Pictorial markings for packaging, storage and transportation

GB/T 1185 Surface defects of optical parts

GB/T 1216 Outside micrometer

GB/T 2828.1-2012 Sampling procedures for inspection by attributes Part 1.Sampling for batch inspection based on acceptance quality limit (AQL) plan

GB/T 3389 Piezoelectric ceramic material performance test method performance parameter test

GB/T 6426 Quasi-static test method for hysteresis loops of ferroelectric ceramic materials

GB/T 6618 Test method for thickness and total thickness variation of silicon wafers

GB/T 6619 Silicon wafer curvature test method

GB/T 6620 Non-contact test method for silicon wafer warpage

GB/T 7962.2 Test methods for colorless optical glass Part 2.Optical homogeneity - Fizeau plane interferometry

GB/T 11297.12 Measurement method of extinction ratio of optical crystals

GB/T 20919 Electronic digital outside micrometer

GB/T 22453 Borate nonlinear optical single crystal element quality test method

GB/T 30857 Test method for thickness and thickness variation of sapphire substrates

GB/T 30866 Test method for diameter of silicon carbide single crystal wafers

GB/T 31227 Method for measuring surface roughness of sputtered thin films using atomic force microscopy

GB/T 34210 Method for determination of crystal orientation of sapphire single crystal

JB/T 9495.3 Measurement method of transmittance of optical crystals

3 Terms and Definitions

The following terms and definitions apply to this document.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.

Referenced standards

Normative references

Similar standards

GB/T 28159-2025|GB/T 28859-2025|GB/T 29846-2025|GB/T 29847-2025|GB/T 31379.1-2025|GB/T 31379.2-2025

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