GB/T 45968-2025Optical near stoichiometric lithium niobate crystal used in quantum information (English PDF)
量子信息用光学级近化学计量比铌酸锂晶体
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
August 1, 2025
Implementation date
February 1, 2026
Scope
GB/T 45968-2025 is the English-translated version of 量子信息用光学级近化学计量比铌酸锂晶体.
GB/T 45968-2025 is the Chinese standard "Optical near stoichiometric lithium niobate crystal used in quantum information".
Its scope clause reads: This document specifies the technical requirements, test methods, inspection and acceptance criteria for optical grade near-stoichiometric lithium niobate crystals for quantum information. packaging, labeling, storage and transportation, etc. This document applies to quantum information with thicknesses of 0.5 mm and 1 mm, diameters of 3 inches (in), 4 inches, and 6 inches, and x-cut and z-cut Design, production, inspection and acceptance of optical grade near stoichiometric lithium niobate crystal double polished wafers.
The main applications are optical superlattice, electrical Optical modulators, lithium niobate optical waveguide devices, lithium niobate single crystal films, etc. Note. 1 in=25.4 mm. Its clauses include terms and definitions.
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Document preview — GB/T 45968-2025
National Standard of the People's Republic of China
- ICS
- 31.030
- Classification
- Q 65
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Requirements
- 4.1 Appearance
- 4.2 Lithium content
- 4.3 Crystal Orientation Deviation
- 4.4 Total thickness change
- 4.5 Linear thickness variation
- 4.6 Curvature
- 4.7 Warpage
- 4.8 Roughness
- 4.9 Optical uniformity
- 4.10 Extinction ratio
- 4.11 Degree of Monodomainization
- 4.12 Coercive Electric Field Strength
- 4.13 Laser Damage Threshold
- 4.14 Light transmittance
- 4.15 Primary electro-optical coefficient
- 5 Detection Methods
- 5.1 Testing Environment
- 5.2 Surface quality
- 5.3 diameter
- 5.4 Thickness
- 5.5 Orientation plane length and second orientation plane length
- 5.6 Lithium Content
- 5.7 Crystal Orientation Deviation
- 5.8 Total thickness change
- 5.9 Local thickness variation
- 5.10 Curvature
- 5.11 Warpage
- 5.12 Roughness
- 5.13 Optical uniformity
- 5.14 Extinction ratio
- 5.15 Degree of Monodomainization
- 5.16 Coercive Electric Field Strength
- 5.17 Laser Damage Threshold
- 5.18 Light transmittance
- 5.19 Primary electro-optical coefficient
- 6 Inspection and Acceptance Rules
- 6.1 Inspection and Acceptance
- 6.2 Batch
- 6.3 Inspection Classification
- 6.4 Inspection Items
- 6.5 Batch inspection
- 6.6 Periodic Inspection
- 7 Packaging, labeling, storage and transportation
- 7.1 Packaging
- 7.2 Tags
- 7.3 Storage
- 7.4 Transportation
- Appendix A (Normative) Test Method for Lithium Content
- Appendix B (Normative) Determination of primary electro-optical coefficient
1 Scope
This document specifies the technical requirements, test methods, inspection and acceptance criteria for optical grade near-stoichiometric lithium niobate crystals for quantum information.
packaging, labeling, storage and transportation, etc.
This document applies to quantum information with thicknesses of 0.5 mm and 1 mm, diameters of 3 inches (in), 4 inches, and 6 inches, and x-cut and z-cut
Design, production, inspection and acceptance of optical grade near stoichiometric lithium niobate crystal double polished wafers. The main applications are optical superlattice, electrical
Optical modulators, lithium niobate optical waveguide devices, lithium niobate single crystal films, etc.
Note. 1 in=25.4 mm.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 191 Pictorial markings for packaging, storage and transportation
GB/T 1185 Surface defects of optical parts
GB/T 1216 Outside micrometer
GB/T 2828.1-2012 Sampling procedures for inspection by attributes Part 1.Sampling for batch inspection based on acceptance quality limit (AQL) plan
GB/T 3389 Piezoelectric ceramic material performance test method performance parameter test
GB/T 6426 Quasi-static test method for hysteresis loops of ferroelectric ceramic materials
GB/T 6618 Test method for thickness and total thickness variation of silicon wafers
GB/T 6619 Silicon wafer curvature test method
GB/T 6620 Non-contact test method for silicon wafer warpage
GB/T 7962.2 Test methods for colorless optical glass Part 2.Optical homogeneity - Fizeau plane interferometry
GB/T 11297.12 Measurement method of extinction ratio of optical crystals
GB/T 20919 Electronic digital outside micrometer
GB/T 22453 Borate nonlinear optical single crystal element quality test method
GB/T 30857 Test method for thickness and thickness variation of sapphire substrates
GB/T 30866 Test method for diameter of silicon carbide single crystal wafers
GB/T 31227 Method for measuring surface roughness of sputtered thin films using atomic force microscopy
GB/T 34210 Method for determination of crystal orientation of sapphire single crystal
JB/T 9495.3 Measurement method of transmittance of optical crystals
3 Terms and Definitions
The following terms and definitions apply to this document.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 191Graphical symbols marking for handling and storage of packages
- GB/T 1185Surface imperfections of optical elements
- GB/T 1216External micrometer
- GB/T 2828.1-2012Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
- GB/T 3389Test methods for the properties of piezoelectric ceramics - Test for the performance parameter
- GB/T 6426Quasi-static test method for ferroelectric hysteresis loop in ferroelectric ceramics
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Related Standards
GB/T 11297.12-2012 — Test method for extinction ratio of optical crystal
GB/T 1185-2006 — Surface imperfections of optical elements
GB/T 11852-2003 — Tolerances and specification of taper gauges
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