GB/T 13387-1992Test method for measuring flat length on slices of electronic materials (English PDF)
电子材料晶片参考面长度测量方法
GB/T 13387 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 13387-2009 | Test method for measuring flat length wafers of silicon and other electronic materials | Valid |
| GB/T 13387-1992 | Test method for measuring flat length on slices of electronic materials | Obsolete |
GB/T 13387-1992 is obsolete. It has been replaced by GB/T 13387-2009. This page sells the obsolete edition, for projects and contracts that still cite it.
This is a limited preview
Buy now to download the full PDF
Need quotation for your management?
Get a formal quotation for GB/T 13387-1992 in 30 minutes.
Issued by
State Bureau of Technical Supervision
Level / Type
National · Recommended
Issue date
February 19, 1992
Implementation date
October 1, 1992
Scope
GB/T 13387-1992 is the English-translated version of 电子材料晶片参考面长度测量方法.
GB/T 13387-1992 is the Chinese national standard "Test method for measuring flat length on slices of electronic materials". It was issued on February 19, 1992 by the State Bureau of Technical Supervision, and took effect on October 1, 1992. It is obsolete: it has been replaced by GB/T 13387-2009.
Found what you need?
Document preview — GB/T 13387-1992
National Standard of the People's Republic of China
Issued by: State Bureau of Technical Supervision
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: State Bureau of Technical Supervision.
Date of issue: 1992-02-19.
Date of implementation: 1992-10-01.
Status: obsolete, replaced by GB/T 13387-2009.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 35305-2026Gallium arsenide monocrystals and polished wafers for solar cells
- GB/T 47097-2026Polished monocrystalline aluminium nitride wafers
- GB/T 30856-2025GaAs substrates for LED epitaxial chips
- GB/T 30858-2025Polished mono-crystalline sapphire substrate wafers
- GB/T 30656-2023Polished monocrystalline silicon carbide wafers
- GB/T 12965-2018Monocrystalline silicon as cut wafers and lapped wafers
How to Download GB/T 13387-1992
- 1
Add to cart
Click "Download PDF" on this page and choose "Buy this standard". You can add more standards before checkout.
- 2
Checkout
Enter your email and billing details. Payment is processed securely by Stripe (cards or bank transfer). Prefer bank details? Request a quotation (min. order $300).
- 3
Instant delivery (0–9 sec)
Delivery is automatic: within seconds of payment you'll receive an email with a secure download link. The link stays valid for 72 hours.
- 4
Invoice included
A tax invoice is attached to the confirmation email. Need a custom invoice? Contact us.
Related Standards
GB/T 10003-2026 — Biaxially oriented polypropylene (BOPP) film
GB/T 10004-2026 — Plastic/Plastic laminated films and pouches for packaging
GB/T 10007-2026 — Rigid cellular plastics - Determination of shear properties
Secure payment via Stripe
Payments accepted
GB/T 13387-1992
$135.00