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JB/T 8290-2011Non-destructive testing instruments - Magnetic particle flaw detectors (English PDF)

无损检测仪器 磁粉探伤机

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Issued by

MIIT

Level / Type

Industry · Recommended

Issue date

December 20, 2011

Implementation date

April 1, 2012

Scope

JB/T 8290-2011 is the English-translated version of 无损检测仪器 磁粉探伤机.

JB/T 8290-2011 is the Chinese standard "Non-destructive testing instruments - Magnetic particle flaw detectors". Its scope clause reads: This Standard specifies the technical requirements, inspection methods, inspection rules, marking and packaging of magnetic particle flaw detectors (hereinafter referred to as "flaw detectors").

This Standard is applicable to alternating current, direct current, half-wave rectified and full-wave rectified flaw detectors; it is not applicable to the yoke type magnetic particle flaw detectors. Its clauses include terms and definitions; technical requirements.

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Document preview — JB/T 8290-2011

National Standard of the People's Republic of China

Replacing
JB/T 8290-1998

Issued by: Ministry of Industry and Information Technology of the People's Republic of China

Contents

  • Foreword4
  • 1 Scope6
  • 2 Normative References6
  • 3 Terms and Definitions7
  • 4 Technical Requirements7
  • 4.1 Environmental and Operating Conditions7
  • 4.2 Type and Specification7
  • 4.3 Magnetizing System7
  • 4.4 Holding Device8
  • 4.5 Magnetic Ink Transfer System9
  • 4.6 Lighting Device9
  • 4.7 Demagnetizing Device9
  • 4.8 Safety Requirements9
  • 4.9 Transportation Bump Resistance Performance11
  • 4.10 Other Requirements11
  • 5 Quality Assurance11
  • 6 Inspection Methods12
  • 6.1 Inspection Conditions12
  • 6.2 Appliances Used for Inspection12
  • Longitudinal Magnetizing Ampere Turns12
  • Magnetizing Current and Rated Longitudinal Magnetizing Ampere Turns13
  • 6.5 Inspection on Bypass Current14
  • 6.6 Inspection on Tangential Magnetic Field Strength14
  • Magnetizing Device14
  • 6.8 Inspection on Remanence Induction Strength14
  • 6.9 Inspection on Illumination14
  • 6.10 Inspection on Temperature14
  • 6.11 Inspection on Continuity of Protective Grounding Circuit15
  • 6.12 Inspection on Insulation Resistance15
  • 6.13 Inspection on Dielectric Strength15
  • 6.14 Inspection on Transportation Bump Resistance Performance15
  • 6.15 Visual Inspection16
  • 7 Inspection Rules16
  • 7.1 Exit-factory Inspection16
  • 7.2 Type Inspection16
  • 7.3 Judgment Rules16
  • 8 Marking and packaging17
  • 8.1 Marking17
  • 8.2 Packaging17
  • Table 1 Basic Types and Specifications of Magnetic Particle Flaw Detectors8
  • Detectors10
  • Table 3 Specified Continuity Value of Protective Grounding Circuit10
  • Table 4 Specified Value of Voltage for Dielectric Strength Test11

1 Scope

This Standard specifies the technical requirements, inspection methods, inspection rules, marking and packaging of magnetic particle flaw detectors (hereinafter referred to as "flaw detectors").

This Standard is applicable to alternating current, direct current, half-wave rectified and full-wave rectified flaw detectors; it is not applicable to the yoke type magnetic particle flaw detectors.

2 Normative References

The following standards contain provisions which, through reference in this text, constitute the provisions of this Standard. For dated references, the subsequent amendments (excluding corrections) or revisions of these publications do not apply.

However, the parties who enter into agreement based on this Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. For undated references, the latest edition of the normative document referred to applies.

GB/T 2611-2007 General Requirements for Testing Machines

GB/T 5097-2005 Non-destructive Testing - Penetrant Testing and

Magnetic Particle Testing - Viewing Conditions (ISO 3509.2001, IDT)

GB/T 19001 Quality Management Systems - Requirements (GB/T 19001-2008, ISO 9001.2008, IDT)

GB/T 12604.5-2008 Non-destructive Testing - Terminology - Terms Used in

Magnetic Particle Testing

JB/T 6147-2007 Requirements for the Packaging, Packaging Marking and Handling of Testing Machine Products

JB/T 7406.2-1994 Testing Machine Terminology - Non-destructive Test

Instrument

3 Terms and Definitions

For the purposes of this Standard, the terms and definitions established in GB/T 12604.5 and JB/T 7406.2 apply.

4 Technical Requirements

4.1

Environmental and Operating C... […]

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.

Referenced standards

Similar standards

Editions of JB/T 8290

EditionTitleRevisionStatus
JB/T 8290-2011Non-destructive testing instruments - Magnetic particle flaw detectorscurrent editionCurrent
JB/T 8290-1998Non-destructive testing instruments - Magnetic particle flaw detectorsprevious editionSuperseded

This page sells the current edition, JB/T 8290-2011. Earlier editions are listed for reference only.

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