GB/T 29057-2012Practice for evaluation of polycrystalline silicon rods by float-zone crystal growth and spectroscopy (English PDF)
用区熔拉晶法和光谱分析法评价多晶硅棒的规程
GB/T 29057 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 29057-2023 | Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy | Valid |
| GB/T 29057-2012 | Practice for evaluation of polycrystalline silicon rods by float-zone crystal growth and spectroscopy | Obsolete |
GB/T 29057-2012 is obsolete. It has been replaced by GB/T 29057-2023. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Level / Type
National · Recommended
Issue date
December 31, 2012
Implementation date
October 1, 2013
Scope
GB/T 29057-2012 is the English-translated version of 用区熔拉晶法和光谱分析法评价多晶硅棒的规程.
GB/T 29057-2012 is the Chinese national standard "Practice for evaluation of polycrystalline silicon rods by float-zone crystal growth and spectroscopy".
It was issued on December 31, 2012 by the General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China and the Standardization Administration of China, and took effect on October 1, 2013. It is obsolete: it has been replaced by GB/T 29057-2023.
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Document preview — GB/T 29057-2012
National Standard of the People's Republic of China
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China.
Date of issue: 2012-12-31.
Date of implementation: 2013-10-01.
Status: obsolete, replaced by GB/T 29057-2023.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 1558-2023Test method for substitutional carbon content in silicon by infrared absorption
- GB/T 30652-2023Trichlorosilane for silicon epitaxial
- GB/T 35306-2023Determination of carbon and oxygen content in single crystal silicon—Low temperature fourier transform infrared spectrometry method
- GB/T 24581-2022Test method for III and V impurities content in single crystal silicon—Low temperature FT-IR analysis method
- GB/T 1557-2018Test method for determining interstitial oxygen content in silicon by infrared absorption
- GB/T 25074-2017Solar-grade polycrystalline silicon
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