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SJ/T 11394-2009Measure methods of semiconductor light emitting diodes (English PDF)

半导体发光二极管测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

November 17, 2009

Implementation date

January 1, 2010

Scope

SJ/T 11394-2009 is the English-translated version of 半导体发光二极管测试方法.

SJ/T 11394-2009 — Measure methods of semiconductor light emitting diodes

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Document preview — SJ/T 11394-2009

National Standard of the People's Republic of China

ICS: 31.260
Classification: L 45
Replacing: SJ/T 2355.1-1983; SJ/T 2355.2-1983; SJ/T 2355.3-1983; SJ/T 2355.4-1983; SJ/T 2355.5-1983; SJ/T 2355.6-1983; SJ/T 2355.7-1983

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2
Standards quoted by this document3

What this standard covers

This standard specifies the electrical characteristics of the semiconductor light-emitting diode test method, the optical characteristics of test methods, optical characteristics test method, the color characteristics of test methods, test methods and thermal characteristics of electrostatic discharge sensitivity testing methods.

Document data

International classification (ICS): 31.260.

Chinese classification (CCS): L45.

Estimated length of the Chinese original: 32,382 words.

Supersedes the earlier edition SJ/T 2355.1-1983; SJ/T 2355.2-1983; SJ/T 2355.3-1983; SJ/T 2355.4-1983; SJ/T 2355.5-1983; SJ/T 2355.6-1983; SJ/T 2355.7-1983.

Standards quoted by this document

GB/T 3977-2001; GB/T 4365-2003; GB/T 5698-2001; GB/T 5702-2003; GB/T 7921-1997; GB/T 7922-2003; GB/T 11499-2001; GB/T 15651-1995; CIE 127-1997; ANSI/ESD STM 5.1-2001; ANSI/ESD STM 5.2-1999

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.

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