GB/T 7676.9-2017Direct acting indicating analogue electrical measuring instruments and their accessories—Part 9: Recommended test methods (English PDF)

National Standard of the People's Republic of China

ICS

17.220.20

Classification

N 21

Replacing

GB/T 7676.9-1998

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

• Foreword V.
• 1 Scope
• 2 Normative references
• 3 Terms and definitions
• 4 General test conditions
• 4.1 Overview
• 4.2 reference conditions
• 4.4 Tap
• 4.5 Thermal stability
• 4.6 Pretreatment time
• 4.7 mechanical zero adjustment
• 4.8 electric zero adjustment
• 4.9 Test Equipment Uncertainty
• 4.10 reading method
• 4.11 multi-phase test
• 4.12 AC instrument DC test
• 4.13 multi-measuring range and multi-function test instrument
• 4.14 test lead
• 4.15 resistance test table
• 5 Basic Uncertainty Test
• 5.1 Test conditions
• 5.2 ammeter and voltmeter
• 5.3 Power Meter and Reactive Power Meter
• 5.4 Analog Frequency Table
• 5.5 spring-loaded frequency table
• 5.6 Phase Table
• 5.7 Power Factor Table
• 5.8 synchronization indicator
• 5.9 resistance meter (impedance meter), conductivity meter
• 5.10 interchangeable shunt
• 5.11 Interchangeable series resistor (resistor)
• 5.12 Interchangeable Hall Current Sensor
• 5.13 interchangeable Hall voltage sensor
• 5.14 other interchangeable electronic converter
• 6 changes in the amount of test
• 6.1 The amount of change caused by ferromagnetic stents
• 6.2 Changes caused by ambient temperature
• 6.3 humidity-induced changes in the amount of test
• 6.4 Position-induced changes
• 6.5 changes caused by the external magnetic field
• 6.6 The amount of change caused by the DC ripple being measured
• 6.7 AC Distortion caused by measurement changes
• 6.8 AC variation measured due to crest factor
• 6.9 The amount of change caused by the frequency of the measured exchange
• 6.10 The amount of change caused by AC voltage/current components being measured
• 6.11 Changes in Power Factor
• 6.12 Battery voltage changes caused by change
• 6.13 Change caused by unbalanced current
• 6.14 conductive stent caused by the change
• 6.15 Changes caused by external electric field
• 6.16 Voltage and power factor effects caused by changes in volume
• 6.18 Auxiliary power supply voltage changes caused by
• 6.19 Auxiliary power frequency changes caused by
• 6.20 Self-heating caused by the change
• 6.21 Shunt thermoelectric potential impact test
• 6.22 Open Loop Hall Sensor Hysteresis Changes
• 7 Electromagnetic compatibility test
• 7.1 Electrostatic discharge immunity test
• 7.2 RF electromagnetic field radiation immunity test
• 7.4 Conducted disturbances of RF field immunity immunity test
• 7.5 Surge immunity test
• 7.6 ringing wave immunity test
• 8 other tests
• 8.1 Marking and appearance inspection
• 8.2 anti-contact seal test
• 8.3 Terminal Inspection
• 8.4 overshoot test
• 8.5 Response Time Trial
• 8.6 Mechanical zero (or range regulator) adjustment test
• 8.7 deviation from zero test
• 8.8 Zero Stability Test
• 8.9 Power meter and reactive power meter or its converter is only on the voltage line power test
• 8.10 Resistance table (impedance meter) maximum current test
• 8.11 Stop and limit test
• 8.12 Synchronization indicator frequency drop test
• 8.13 Synchronization indicator frequency drag test
• 8.14 Synchronization indicator open test
• 8.15 AC voltage test and accessible parts test
• 8.16 Test with external circuit connection
• 8.17 Test for connection to the mains supply
• 8.18 Anti-shock structure requirements test
• 8.19 Assessment of battery requirements
• 8.20 Solar Radiation Test (for Group C meters)
• 8.21 instrument short-term overload test
• 8.22 Annex Short-term overload test
• 8.23 Continuous overload test