GB/T 5594.4-1985Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value (English PDF)
电子元器件结构陶瓷材料性能测试方法 介质损耗角正切值的测试方法
GB/T 5594.4 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 5594.4-2015 | Test methods for properties of structure ceramic used in electronic component and device - Part 4: Test method for permittivity and dielectric loss angle tangent value | Valid |
| GB/T 5594.4-1985 | Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value | Obsolete |
GB/T 5594.4-1985 is obsolete. It has been replaced by GB/T 5594.4-2015. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
National Bureau of Standards
Level / Type
National · Recommended
Issue date
November 27, 1985
Implementation date
December 1, 1986
Scope
GB/T 5594.4-1985 is the English-translated version of 电子元器件结构陶瓷材料性能测试方法 介质损耗角正切值的测试方法.
GB/T 5594.4-1985 is the Chinese national standard "Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value".
It was issued on November 27, 1985 by the National Bureau of Standards, and took effect on December 1, 1986. It is obsolete: it has been replaced by GB/T 5594.4-2015.
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Document preview — GB/T 5594.4-1985
National Standard of the People's Republic of China
Issued by: National Bureau of Standards
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: National Bureau of Standards.
Date of issue: 1985-11-27.
Date of implementation: 1986-12-01.
Status: obsolete, replaced by GB/T 5594.4-2015.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 48118-2026Ceramic copper-clad substrate for power semiconductor modules
- GB/T 45767-2025Silicon nitride ceramic substrates
- GB/T 39863-2021Alumina ceramic substrate for copper clad laminate
- GB/T 39975-2021Aluminum nitride ceramic dissipate heat substrates
- GB/T 5593-2015Structure ceramic materials used in electronic component and device
- GB/T 14619-2013Alumina ceramic substrates for thick film integrated circuits
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Related Standards
GB/T 5594.5-1985 — Test methods for properties of structure ceramic used in electronic components. Test method for volume resistivity
GB/T 5594.3-1985 — Test methods for properties of structure ceramic used in electronic components--Test method for mean coefficient of linear expansion
GB/T 5594.6-2015 — Test methods for properties of structure ceramics used in eletronic components and device—Part 6: Test method for chemical durability
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GB/T 5594.4-1985
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