GB/T 5594.5-1985Test methods for properties of structure ceramic used in electronic components. Test method for volume resistivity (English PDF)
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Issued by
National Bureau of Standards
Level / Type
National · Recommended
Issue date
November 27, 1985
Implementation date
December 1, 1986
Scope
GB/T 5594.5-1985 (Test methods for properties of structure ceramic used in electronic components. Test method for volume resistivity) is available as an English-translated PDF.
GB/T 5594.5-1985 — This standard applies to the electronic structure of the ceramic components measured volume resistivity in the range of 500 �� to room temperature.
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Document preview — GB/T 5594.5-1985
National Standard of the People's Republic of China
- ICS
- 31.03
- Classification
- L 32
Issued by: National Bureau of Standards
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard applies to the electronic structure of the ceramic components measured volume resistivity in the range of 500 � to room temperature.
Document data
International classification (ICS): 31.03.
Chinese classification (CCS): L32.
Estimated length of the Chinese original: 3,357 words.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 2 pages — is available in the English PDF.
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Related Standards
GB/T 5594.1-1985 — Test methods for properties of structure ceramic used in electronic components. Test method for gas-tightness
GB/T 5594.2-1985 — Test methods for properties of structure ceramic used in electronic components--Test method for Youngelastic modulus and Poisson ratio
GB/T 5594.3-2015 — Test methods for properties of structure ceramic used in electronic components and device - Part 3: Test method for mean coefficient of linear expansion
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GB/T 5594.5-1985
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