GB/T 19403.1-2003Semiconductor devices -- Integrated Circuits -- Part 11: Section 1: Internal visual examination for semiconductor integrated circuit (excluding hybrid circuits) (English PDF)
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China
Level / Type
National · Recommended
Issue date
November 24, 2003
Implementation date
August 1, 2004
Scope
GB/T 19403.1-2003 (Semiconductor devices -- Integrated Circuits -- Part 11: Section 1: Internal visual examination for semiconductor integrated circuit (excluding hybrid circuits)) is available as an English-translated PDF.
GB/T 19403.1-2003 — This standard specifies the IC 's internal materials, structures and processes, validation and conformance with applicable regulatory requirements.
Should normally be sealed in the sealing cap or 100% of the device before the internal visual inspection to detect the device may cause failure during normal use of internal defects and eliminate the corresponding device.
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Document preview — GB/T 19403.1-2003
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 56
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the IC 's internal materials, structures and processes, validation and conformance with applicable regulatory requirements. Should normally be sealed in the sealing cap or 100% of the device before the internal visual inspection to detect the device may cause failure during normal use of internal defects and eliminate the corresponding device. This test can also be sampling method used before the sealing cap to determine Zhifang quality control for semiconductor devices and operating effectiveness of the program.
Document data
International classification (ICS): 31.200.
Chinese classification (CCS): L56.
Estimated length of the Chinese original: 22,230 words.
Adopted international standard: IEC 60748-11-1-1992, IDT.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 43931-2024General specification for microwave integrated circuit chip for aerospace
- GB/T 42836-2023Microwave semiconductor integrated circuits—Frequency mixer
- GB/T 42837-2023Microwave semiconductor integrated circuits—Amplifier
- GB/T 43366-2023General specification for discrete semiconductor devices of space application
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