SJ/T 11399-2009Measurement methods for chips of light emitting diodes (English PDF)
半导体发光二极管芯片测试方法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
November 17, 2009
Implementation date
January 1, 2010
Scope
SJ/T 11399-2009 is the English-translated version of 半导体发光二极管芯片测试方法.
SJ/T 11399-2009 — This standard specifies the semiconductor light-emitting diode chip (hereinafter referred to as chips) of radiometry, photometry, colorimetry, electrical, thermal, parameters and electromagnetic compatibility testing methods. This standard applies to visible light semiconductor light-emitting diode chip.
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Document preview — SJ/T 11399-2009
National Standard of the People's Republic of China
- ICS
- 31.260
- Classification
- L 45
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This standard specifies the semiconductor light-emitting diode chip (hereinafter referred to as chips) of radiometry, photometry, colorimetry, electrical, thermal, parameters and electromagnetic compatibility testing methods. This standard applies to visible light semiconductor light-emitting diode chip. Ultraviolet and infrared light emitting diode chip and wafer reference tests performed.
Document data
International classification (ICS): 31.260.
Chinese classification (CCS): L45.
Estimated length of the Chinese original: 12,139 words.
Standards quoted by this document
GB/T 5698-2001; GB/T 11499-2001; GB/T 15651-1995; SJ/T 11394-2009
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 8 pages — is available in the English PDF.
Referenced standards
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