JB/T 6307.4-1992Test methods for power semiconductor modules - Bipolar transistor arms and pairs of arms (English PDF)
电力半导体模块测试方法 双极型晶体管臂和臂对
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Issued by
MIIT
Level / Type
Industry · Recommended
Issue date
June 26, 1992
Implementation date
January 1, 1993
Scope
JB/T 6307.4-1992 is the English-translated version of 电力半导体模块测试方法 双极型晶体管臂和臂对.
JB/T 6307.4-1992 is the Chinese machinery industry standard covering test methods for power semiconductor modules - Bipolar transistor arms and pairs of arms. It was issued on 26 June 1992 and has been in force since 1 January 1993, as a first edition.
The document is under the responsibility of the Ministry of Industry and Information Technology. This page is published from the official record of the 1992 edition.
The figures, limits and tables the standard contains are those of the document itself, delivered in full with the English translation.
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Document preview — JB/T 6307.4-1992
National Standard of the People's Republic of China
Issued by: Ministry of Industry and Information Technology of the People's Republic of China
Contents
- [Preview only]
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 3.1 Type
- 3.2 Basic parameters
- 4 Types and basic parameters
- 4.1 Types
- 4.2 Model designation
- 4.3 Nominal operating conditions
- 4.4 Safety and hygiene
- 4.5 Welding
- 4.6 Bridge (After crane operation mechanism assembled)
- 4.7 Assembly
- 4.8 Electrical control equipment
- 4.9 Steel pretreatment and painting
- 5 Technical requirements
- 5.1 General requirements
- 5.2 Safety requirements
- 5.3 Cold and hot working forming
- 5.4 Rated load test
- 5.5 Whole machine noise test
- 5.6 Static rigidity test
- 5.7 Dynamic load test
- 5.8 Crane span deviation
- 5.9 Diagonal difference of bridge
- 6 Test methods
- 6.1 Exit-factory inspection
- 6.2 Type inspection
- 7 Inspection rules
- 7.1 Marking
- 7.2 Packaging, transportation and storage
- 7.3 Transportation
- 7.4 Storage
- 8 Marking, packaging, transportation and storage
- 9 标志和标签 9 Marking and labeling
1 Foreword
JB/T 6307.4-1992 was issued by Ministry of Industry and Information Technology of the People's Republic of China on 26 June 1992.
It is one of 8 parts of the JB/T 6307 series.
The JB/T prefix marks a recommended standard. It is not law in itself: it becomes binding when a contract names it, when a regulation or a mandatory standard refers to it, or when a producer declares conformity with it.
2 Scope Preview
JB/T 6307.4-1992 carries no ICS number and no Chinese Standard Classification code.
This catalogue holds 21,922 other JB/T standards.
Of the 5,298 JB/T standards that do carry an ICS number, 1,460 (28%) fall under ICS 25, in the field of manufacturing engineering.
3 About this standard
Issued by: Ministry of Industry and Information Technology of the People's Republic of China
English translation: about 20 pages
4 Related standards
Other parts of this standard:
JB/T 6307.1-1992 — Rectifier diode pairs of arms
JB/T 6307.1-2026 — Testing methods for power semiconductor modules - Rectifier diode modules - Part 1: Arm and pair of arms
JB/T 6307.2-1992 — Rectifier diode single-phase bridges
JB/T 6307.2-2026 — Testing methods for power semiconductor modules - Rectifier diode modules - Part 2: Single phase bridge
JB/T 6307.3-1992 — Rectifier diode three-phase bridges
JB/T 6307.3-2026 — Testing methods for power semiconductor modules - Rectifier diode modules - Part 3: Three phase bridge
JB/T 6307.5-1994 — Test methods for power semiconductor modules - Bipolar transistor single-phase bridges and three-phase bridges
Standards on related subjects:
GB/T 31487.3-2015 — Direct current de-icing devices -- Part 3: Tests
GB/T 13422-2013 — Semiconductor converters - Electrical test methods
GB/T 3859.1-2013 — Semiconductor converters -- General requirements and line commutated Converters -- Part 1-1: Specification of basic requirements
5 Classification and status
Chinese Standard Classification (CCS): K 46
Prefix JB/T: recommended standard.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 20 pages — is available in the English PDF.
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Related Standards
JB/T 6307.5-1994 — Test methods for power semiconductor modules - Bipolar transistor single-phase bridges and three-phase bridges
JB/T 6307.3-1992 — Test methods for power semiconductor modules - Rectifier diode three-phase bridges
JB/T 6307.3-2026 — Testing methods for power semiconductor modules - Rectifier diode modules - Part 3: Three phase bridge
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JB/T 6307.4-1992
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