GB/T 4377-2018Semiconductor integrated circuits—Measuring method of voltage regulators (English PDF)
半导体集成电路 电压调整器测试方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
March 15, 2018
Implementation date
August 1, 2018
Scope
GB/T 4377-2018 is the English-translated version of 半导体集成电路 电压调整器测试方法.
GB/T 4377-2018 sets out the methods for measuring the parameters of voltage regulators in semiconductor integrated circuits.
After terms and definitions and general provisions on the test environment, test precautions and instruments, it gives test methods for voltage regulation, current regulation, power supply ripple rejection ratio, output voltage temperature coefficient and long-term stability, output noise voltage, dissipation current and its variation, short-circuit current, output impedance and reference voltage.
It also covers start-up time, minimum input-output voltage difference, transient response to changes in input voltage and load current, output current limit, thermal shutdown and hysteresis temperature, output voltage and its deviation, and thermal regulation.
Device manufacturers and test laboratories use it to characterise regulators. It replaces GB/T 4377-1996, was issued on 15 March 2018 and has applied since 1 August 2018.
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Document preview — GB/T 4377-2018
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 56
- Replacing
- GB/T 4377-1996
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- 1 Scope
- 2 Terms and Definitions
- 3 General
- 3.1 Test Environment Requirements
- 3.2 Test Considerations
- 3.3 Test Instruments and Equipment
- 4 Parameter Test
- 4.1 Voltage Regulation (SV)
- 4.2 Current Regulation (SI)
- 4.3 Power Supply Ripple Spur Ratio
- 4.4 Output Voltage Temperature Coefficient (ST)
- 4.5 Long-Term Stability of Output Voltage (St)
- 4.6 Output Noise Voltage (VNO)
- 4.7 Dissipation Current (ID) and Dissipation Current Variation (deltaID)
- 4.8 Short Circuit Current (IOS)
- 4.9 Output Impedance (ZO)
- 4.10 Reference Voltage (VREF)
- 4.11 Startup Time (tS)
- 4.12 Minimum input and output voltage difference (VDROP)
- 4.13 Input Voltage Change Transient Response Time (t1) and Input Voltage Change Transient Overshoot Voltage [VOM(VI)]
- 4.14 Load current change transient response time (t2) and load current change transient overshoot voltage [VOM(IO)]
- 4.15 Output Current Limit (ILimit)
- 4.16 Thermal Shutdown Temperature (TSHDN) and Hysteresis Temperature (deltaTSHDN)
- 4.17 Output Voltage (VO) and Output Voltage Deviation (deltaVO)
- 4.18 Thermal Regulation (Sh)
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard replaces GB/T 4377-1996 "Basic Principles for Test Methods for Voltage Regulators of Semiconductor Integrated Circuits". Compared with GB/T 4377-1996, the main technical changes are as follows.
--- Modify the power supply ripple rejection ratio Srip, output noise voltage VNO, dissipation current ID and dissipation current change deltaID, thermal regulation Sh 4 parameter test method;
--- Deleted the phrase "does not apply to double-ended (input) port devices" in the original standard;
--- Deleted the "starting voltage range VOR" in the original standard, and replaced it with "starting time tS";
--- Increased start-up time tS, output current limit ILimit, thermal shutdown temperature TSHDN and hysteresis temperature deltaTSHDN, and output voltage VO and output voltage deviation deltaVO 4 item parameter test method.
1 Scope
This standard specifies the voltage regulator (hereinafter referred to as the device) parameter test method.
This standard applies to the testing of voltage regulator parameters in the field of semiconductor integrated circuits.
2 Terms and Definitions
The following terms and definitions apply to this document.
2.1 Voltage regulation
The rate of change of the output voltage with changes in the input voltage, usually by changing the DC input voltage and measuring the corresponding output voltage change To determine the voltage regulation rate.
2.2 Current regulation
The rate of change of output voltage with changes in output current, usually by changing the DC output current and measuring the corresponding DC output The pressure changes to determine the current regulation rate.
2.3 Power supply ripple rejection ratio
The ratio of the input power variation to the output voltage variation.
2.4 Output voltage temperature coefficient
The rate of change of the output voltage with changes in ambient temperature, usually by changing the ambient temperature and recording the corresponding output voltage change Determine the temperature coefficient of the output voltage.
2.5 Output voltage long-term stability
The rate of change of the output voltage over time is determined by testing the change in output voltage value over time.
2.6 Output noise voltage
The noise generated by the device itself at the output voltage, usually measured at the device's internal circuit versus output voltage, at a specified DC input voltage Interference.
2.7 Dissipative Current and Dissipation Current Changes
The ground current value when the input voltage and output current are the specified values determine the change of the dissipated current when the input and output conditions change.
The measured dissipated current when the output current is "0" is also referred to as a quiescent current (Iq).
2.8 Short-circuit current
The output current at the output of the device is short-circuited, and the short-circuit current is usually measured at the specified input voltage.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.
Similar standards
Editions of GB/T 4377
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 4377-2018 | Semiconductor integrated circuits—Measuring method of voltage regulators | current edition | Current |
| GB/T 4377-1996 | Semiconductor integrated circuits—Measuring method of voltage regulators | previous edition | Superseded |
This page sells the current edition, GB/T 4377-2018. Earlier editions are listed for reference only.
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