GB/T 43341-2023Nanotechnology—Measurement of defect concentration of graphene—Raman spectroscopy method (English PDF)
纳米技术 石墨烯的缺陷浓度测量 拉曼光谱法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
November 27, 2023
Implementation date
June 1, 2024
Scope
GB/T 43341-2023 is the English-translated version of 纳米技术 石墨烯的缺陷浓度测量 拉曼光谱法.
GB/T 43341-2023 describes how to measure the defect concentration of graphene by Raman spectroscopy.
Clause 1 covers the principle, the instrument parameter requirements, sample preparation, the testing steps and data analysis and processing, and the contents list adds measurement uncertainty, the test report and informative annexes giving a typical Raman spectrum of graphene, typical test examples and a test report example.
It applies to point defect concentration measurement of single-layer graphene with a lateral size of not less than 2 µm, uniform physical properties and a clean surface.
Its introduction states that at a specific excitation light energy the defect concentration is directly related to the peak area ratio of the D and G modes of the Raman spectrum. Issued on 27 November 2023, it has applied since 1 June 2024.
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Document preview — GB/T 43341-2023
National Standard of the People's Republic of China
- ICS
- 71.040.50
- Classification
- G 30
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- PrefaceI
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Principle
- 5 Instruments and Equipment
- 6 Sample preparation
- 7 Test Step
- 8 Data analysis and processing
- 9 Measurement uncertainty
- 10 Test Report
- Appendix A (informative) Typical Raman spectrum of graphene
- Appendix B (informative) Typical test examples
- Appendix C (informative) Test report example
- Reference
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.
Introduction
Graphene is composed of a single layer of carbon atoms arranged in a hexagonal honeycomb lattice. Due to its excellent electrical, optical, mechanical and thermal properties, such as Such as high mobility, high transmittance, good flexibility and high thermal conductivity, it has broad application prospects in many fields. Defect concentration as an evaluation It is an important parameter for estimating the quality of graphene and has an important impact on its mobility, thermal conductivity, mechanical properties, etc. Therefore, the defect concentration of graphene is The measurement can not only reveal its intrinsic properties from a scientific perspective, but also provide technical guidance for the production and application of graphene.
Raman spectroscopy technology has the advantages of high efficiency, accuracy, non-destructiveness, simple sample preparation, and the ability to measure large areas, and has been widely used.
In quality testing of graphene. Raman spectroscopy technology can measure various properties of graphene, such as the number of layers, doping levels, stress levels and Defect concentration, etc. Under a specific excitation light energy, the defect concentration of graphene is directly related to the peak area ratio of the D mode and G mode of its Raman spectrum.
Therefore, the defect concentration of graphene can be measured through Raman spectroscopy.
Defect concentration measurements in nanotechnology graphene Raman spectroscopy Warning: This document involves the use of lasers, which may cause irreversible damage to the eyes. It is recommended to wear when using laser Wear corresponding laser protective glasses to avoid looking directly at the laser, which may cause the laser to be reflected by the optical components and enter the eyes. It is also recommended that operators take Receive relevant safety training.
1 Scope
This document describes the method of measuring graphene defect concentration using Raman spectroscopy, including principles, instrument parameter requirements, sample preparation, and test testing steps and data analysis and processing.
This document is applicable to the point defect concentration measurement of single-layer graphene with a lateral size of not less than 2 µm, uniform physical properties, and clean surface.
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.
GB/T 33252 Nanotechnology Laser Confocal Raman Microscope Performance Test
JJF1544 Raman spectrometer calibration specifications
3 Terms and definitions
The following terms and definitions apply to this document.
3.1 Graphene
graphene layergraphenelayer single-layer graphene;monolayergraphene A single carbon atom is combined with three surrounding carbon atoms to form a honeycomb structure of carbon atom monolayer.
Note 1. It is an important building block of many carbon nanoobjects.
Note 2. Since graphene has only one layer, it is often called single-layer graphene. Graphene is abbreviated as 1LG to distinguish it from double layer graphite, which is abbreviated as 2LG. ene and few-layer graphene, abbreviated as FLG.
Note 3. Graphene has boundaries and has defects and grain boundaries where carbon-carbon bonds are broken. [Source: GB/T 30544.13-2018,3.1.2.1]
3.2 Defect
Local deviations from the regularity of atomic arrangement in the ideal lattice of a two-dimensional material. [Source: GB/T 30544.13-2018,3.4.1.1]
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 25 pages — is available in the English PDF.
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