GB/T 42839-2023Semiconductor integrated circuits - Analog digital (AD) converter (English PDF)

1 Scope

This document specifies the classification, technical requirements, inspection methods, and

Inspection rules, marking, packaging, transportation and storage.

This document applies to AD converters designed and manufactured using semiconductor integrated circuit technology.

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations

For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.

GB/T 4589.1-2006 Semiconductor devices Part 10.General specifications for discrete devices and integrated circuits

GB/T 4937.3-2012 Mechanical and climatic test methods for semiconductor devices Part 3.External visual inspection

GB/T 4937.4-2012 Mechanical and climatic test methods for semiconductor devices Part 4.Strongly accelerated steady-state damp heat test (HAST)

GB/T 4937.11-2018 Mechanical and climatic test methods for semiconductor devices Part 11.Rapid temperature change double liquid bath method

GB/T 4937.13-2018 Mechanical and climatic test methods for semiconductor devices Part 13.Salt spray

GB/T 4937.14-2018 Mechanical and climatic test methods for semiconductor devices Part 14.Terminal strength (lead robustness)

GB/T 4937.15-2018 Mechanical and climatic test methods for semiconductor devices Part 15.Soldering heat resistance of through-hole mounted devices

GB/T 4937.21-2018 Mechanical and climatic test methods for semiconductor devices Part 21.Solderability

GB/T 4937.23 Mechanical and climatic test methods for semiconductor devices Part 23.High temperature operating life

GB/T 4937.26 Mechanical and climatic test methods for semiconductor devices Part 26.Electrostatic discharge (ESD) sensitivity test

Human Body Model (HBM)

GB/T 4937.27 Mechanical and climatic test methods for semiconductor devices Part 27.Electrostatic discharge (ESD) sensitivity test

Machine Model(MM)

GB/T 9178 Integrated circuit terminology

GB/T 12750-2006 Semiconductor device integrated circuits Part 11.Specifications for semiconductor integrated circuits (excluding hybrid circuits)

GB/T 17574-1998 Semiconductor devices integrated circuits Part 2.Digital integrated circuits

SJ/T 10147 Integrated circuit anti-static packaging tube

SJ/T 11587 Technical requirements for anti-static packaging of electronic products

IEC 60749-9.2017 Mechanical and climatic test methods for semiconductor devices Part 9.Marking durability (Semiconductorde-

IEC 60749-24.2004 Mechanical and climatic test methods for semiconductor devices Part 24.Steady-state damp heat (Semiconductor […]