GB/T 39343-2020Processor device single event effects experiment design and procedure for aerospace (English PDF)

1 Scope

This standard specifies the design and procedures of single-event tests for aerospace processor devices:

This standard applies to the design and process control of single-event experiments for aerospace processor devices, and can be implemented by reference to other applications:

2 Normative references

The following documents are indispensable for the application of this document: For dated reference documents, only the dated version applies to this article

Pieces: For undated references, the latest version (including all amendments) applies to this document:

GB 18871-2002 Basic standard for ionizing radiation protection and radiation source safety

3 Terms and definitions, abbreviations

3:1 Terms and definitions

The following terms and definitions apply to this document:

3:1:1

Processordevice

A device containing a processor inside can be a device that refers and executes instructions in normal use:

3:1:2

Single event effects; SEE A term describing many effects in a single event event:

3:1:3

Single event phenomenon; SEP The collective term for a series of responses of semiconductor devices triggered by the impact of a single high-energy particle, including effects caused by neutrons and protons:

3:1:4

Single Event Upset; SEU A single high-energy particle acts on the device to cause a radiation effect to change the logic state of the device:

3:1:5

Single event latchup; SEL A single high-energy particle triggers the thyristor in the device to turn on, forming a low resistance and high current state:

3:1:6

Single event functional interrupt; SEFI A single high-energy particle acts on the device, causing the device under test to lose or disrupt its function: Only by resetting and reconfiguration can the device be restored

Features:

3:1:7

Linear energy transfer linear energy transfer; LET The energy deposited per unit length in the material along the incident direction: