GB/T 36165-2018Determination of average grain size of metal—Electron backscatter diffraction (EBSD) method (English PDF)
金属平均晶粒度的测定 电子背散射衍射（EBSD）法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
May 14, 2018
Implementation date
February 1, 2019
Scope
GB/T 36165-2018 is the English-translated version of 金属平均晶粒度的测定 电子背散射衍射（EBSD）法.
GB/T 36165-2018 sets out how to measure the average grain size of metals by electron backscatter diffraction (EBSD) in a scanning electron microscope.
It covers the principle, equipment, sampling, sample preparation, calibration and verification, the measurement steps and the test report, and a normative annex calculates the grain size number from the average equivalent circle diameter.
Because EBSD separates grains by crystal orientation, the method suits all crystal structure types, metals whose grain boundaries are hard to reveal by conventional metallography and fine-grained materials.
It applies to fully recrystallized polycrystalline metals, and other crystalline materials that give good EBSD patterns can be measured by reference to it. It was issued on 14 May 2018 and has applied since 1 February 2019.
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Document preview — GB/T 36165-2018
National Standard of the People's Republic of China
- ICS
- 77.040.99
- Classification
- H 24
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Principle
- 5 equipment
- 6 sampling
- 7 sample preparation
- 8 Calibration and Verification
- 9 Measurement step
- 10 Inspection Report
- Appendix A (Normative Appendix) Calculate grain size level based on average equal circle diameter
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
Introduction
The EBSD method of this standard divides the grains according to the crystal orientation and is applicable to all crystal structure types.
The EBSD method of this standard is suitable for metal materials whose grain boundaries are difficult to display by conventional metallographic methods.
The EBSD method of this standard has higher resolution than the metallographic method and is suitable for metal materials with fine grain.
This standard is also applicable to the quantitative analysis of the average grain size of the main phase structure of the composite material.
1 Scope
This standard specifies the principle, equipment, sampling, sample preparation, calibration and method for the determination of grain size by electron backscatter diffraction (EBSD). Verification and measurement steps.
This standard applies to the measurement of the average grain size of a fully recrystallized polycrystalline metal material. Others can produce high quality and high calibration rate electronic back The crystal material of the scattering diffraction pattern can be performed by referring to this method.
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this document. For undated references, the latest edition (including all amendments) applies to this document.
GB/T 13298 metal microstructure inspection method
GB/T 19501 Microbeam analysis method for electron backscatter diffraction analysis
GB/T 27788 Microbeam Analysis Scanning Electron Microscope Image Magnification Calibration Guide
GB/T 30067 Metallographic terminology
Electrolytic polishing method for YB/T 4377 metal sample
3 Terms and definitions
The following terms and definitions as defined in GB/T 19501 and GB/T 30067 apply to this document.
3.1 Electron backscatter diffraction
The crystal structure, orientation and phase were determined by scanning the electron beam in a scanning electron microscope to determine the crystal structure, orientation and phase of the Kikuchi diffraction pattern excited by the surface of the sample (about 70°). The method of closing information.
3.2 Electron backscatter diffraction pattern
The pattern composed of the Kikuchi diffraction band can determine the type and orientation of the crystal in the excitation region according to the geometric characteristics of the diffraction pattern.
3.3 (crystal) orientation
The relationship between the crystal coordinate system and the sample coordinate system. For example, in a cubic system, the three crystal axes of the crystal [100], [010] and [001] The relative orientation of the sample coordinate system such as the rolling direction, transverse direction and normal direction of the rolled sheet.
Note: Crystal orientation can be described in a variety of ways such as Euler angles, directional cosine matrices, or rotated (Rodrigues) vectors.
3.4 Misorientation
The rotational relationship of the orientation of one data point relative to the orientation of another data point, the minimum angle of rotation that causes the two crystal lattices to completely coincide.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 13298Inspection Methods of Microstructure for Metals
- GB/T 19501Microbeam analysis - General guide for electron backscatter diffraction analysis
- GB/T 27788Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- GB/T 30067Standard terminology relating to metallography
- YB/T 4377Electrolytic polishing method of metallic specimens
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Related Standards
GB/T 13298-2015 — Inspection Methods of Microstructure for Metals
GB/T 19501-2013 — Microbeam analysis - General guide for electron backscatter diffraction analysis
GB/T 27788-2020 — Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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