GB/T 19501-2013Microbeam analysis - General guide for electron backscatter diffraction analysis (English PDF)

3.1 Electron backscatter diffraction electronbackscatterdiffraction; EBSD

When the crystal samples with high tilt when the incident electron beam irradiation, the back-scattered electron diffraction and atomic planes occurred.

3.2 Electron backscatter pattern electronbackscatterpattern; EBSP

Having a quasi-linear characteristics, and is intercepted by the detector by the electron backscatter diffraction pattern generated, namely Kikuchi band, which can be displayed on the fluorescent

Light screen or on photographic film.

3.3 Center of the pattern patterncentre; PC

A little screen on the plane, its vertical electron beam through the sample points.

3.4 Sample and screen distance specimen-to-screendistance; SSD

Center of the pattern and the surface of the sample beam bombardment distance between points.

NOTE. If the distance between the sample and the screen is smaller, it will be reduced to the center of the pattern EBSP orientation, it will be observed more Kikuchi band.

3.5 Hough transform

Automatically detects the shape of the image within the special characteristics of the mathematical technique of image processing.

Note. In EBSD, the linear Hough transform is used to identify the location and orientation of the Kikuchi band EBSP such pattern index can be calibrated. Each band Kikuchi

In the Hough space is converted to a maximum value are identified. This Hough transform is a special case of Radon transform nature. Under normal circumstances,

Hough transform for binary images, Radon transform grayscale images.