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GB/T 33714-2017Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy (English PDF)

纳米技术纳米颗粒尺寸测量原子力显微术

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

May 12, 2017

Implementation date

December 1, 2017

Scope

GB/T 33714-2017 is the English-translated version of 纳米技术纳米颗粒尺寸测量原子力显微术.

GB/T 33714-2017 is the method for sizing nanoparticles with an atomic force microscope, characterising the particle size from the measured height of the particles.

It applies to nanoparticles dispersed on the surface of a flat substrate.

It sets out the basic principles and the imaging modes, in which the microscope scans the sample surface with a tip carried on a micro-cantilever, then the instrument, the pretreatment of the measuring sample, the measurement method, the measurements, the assessment of uncertainty and what the measurement report has to contain.

Its informative annexes give a method for depositing nanoparticles, examples of particle height measurement, an uncertainty assessment and a recommended report format.

It defines agglomerate and aggregate, and cites GB/T 27760, GB/T 30544.1-2014 and ISO 18115-2 for its other terms. Issued on 12 May 2017, it has applied since 1 December 2017.

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Document preview — GB/T 33714-2017

National Standard of the People's Republic of China

ICS: 19.020
Classification: N 04

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Preface
1 Scope
2 normative reference document
3 Terms and definitions
4 Basic principles and patterns
5 instrument
6 Pretreatment of measuring sample
7 Measurement method
8 Measurements
9 Uncertainty Assessment
10 Measurement Report
Appendix A (informative) Method for the deposition of nanoparticles
Appendix B (informative) Particle height measurement Example
Appendix C (Informative Annex) Uncertainty Assessment
Appendix D (informative) Recommended measurement report format
References

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009.

WARNING: This standard does not address all possible safety issues. Before applying this standard, it is the user's responsibility to take appropriate safety and Health measures, and to ensure compliance with the provisions of the relevant national laws and regulations.

1 Scope

This standard specifies the use of atomic force microscopy (atomic force microscopy, referred to as AFM) to measure the height of nanoparticles to characterize the Rice particle size method.

This standard applies to the measurement of nanoparticles dispersed on the surface of the flat substrate.

2 Normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this document. For undated references, the latest edition (including all modifications) applies to this document.

GB/T 27760 Method for calibrating sub-nanometer height measurements by atomic force microscopy using Si (111) plane atomic steps

GB/T 30544.1-2014 Nanotechnology terminology - Part 1: Core terminology

ISO 18115-2 Surface Chemical Analysis Terminology Part 2 Scanning Probe Microscopy Terminology (Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy)

3 Terms and definitions

The following terms and definitions, as defined in GB/T 27760, GB/T 30544.1 and ISO 18115-2, apply to this document.

3.1 Agglomerate

The buildup of the weakly bound particles, aggregates, or a mixture of both, has an outer surface area that is close to the sum of the surface areas of its individual particles.

Note 1: The forces that support the aggregates are weak, such as van der Waals forces or simple physical entanglement.

Note 2: Agglomerates are also referred to as secondary particles, while source particles are referred to as primary particles.

Note 3: Using imaging techniques, such as AFM, it is generally difficult to distinguish agglomeration (ie, artifacts) or pre-existing aggregates formed during the deposition of the sample.

3.2 Aggregates

Strongly bound or fused particles of new particles, the outer surface area may be less than the sum of the individual particle surface area.

Note 1: The forces that support the aggregates are strong forces, such as covalent bonds or from sintering or complex physical entanglement.

Note 2: Aggregates are also referred to as secondary particles, while source particles are referred to as primary particles.

Note 3: Using imaging techniques, such as AFM, it is generally difficult to distinguish between reunification and aggregation.

4 Basic principles and patterns

4.1 AFM works

As shown in Figure 1, the AFM uses a micro-cantilever with a tip to scan the surface of the sample. One end of the micro-cantilever is connected by an AFM controller

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.

Referenced standards

Normative references

ISO 18115-2

Cited by

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