GB/T 32267-2015Terminology of performance testing for analytical instrument (English PDF)
分析仪器性能测定术语
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
December 10, 2015
Implementation date
January 1, 2017
Scope
GB/T 32267-2015 is the English-translated version of 分析仪器性能测定术语.
GB/T 32267-2015 is the Chinese standard "Terminology of performance testing for analytical instrument". Its scope clause reads: This standard defines the performance measurement analysis instruments related terms and definitions.
This standard applies to involve electronic optical instruments, mass spectrometry, X-ray machines, spectrometers, chromatography equipment, spectral instruments, electrochemical analyzer , Optical microscopy and image analysis instruments, all levels of standard thermal analysis instruments 9 categories index measuring the performance of the instruments, technical documents, books Compilation. Its clauses include basic terms.
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Document preview — GB/T 32267-2015
National Standard of the People's Republic of China
- ICS
- 71.040
- Classification
- N 04
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- 1 Scope
- 2 Basic terms
- 3 electronic optical instruments
- 5 X-ray equipment
- 6 spectrometer
- 7 Chromatograph
- 8 spectroscopic instrument
- 9 electrochemical devices
- 10 optical microscopy and image analysis instruments
- 11 28 Thermal Analysis Instruments
- References
1 Scope
This standard defines the performance measurement analysis instruments related terms and definitions.
This standard applies to involve electronic optical instruments, mass spectrometry, X-ray machines, spectrometers, chromatography equipment, spectral instruments, electrochemical analyzer , Optical microscopy and image analysis instruments, all levels of standard thermal analysis instruments 9 categories index measuring the performance of the instruments, technical documents, books
Compilation.
2 Basic terms
2.1 The detection limit
The lowest concentration cL (or at a certain minimum degree of confidence signal analysis by a specific analytical method can detect distinguished xL determined
Quality qL).
cL & (or qL) = (xL-xb)/m = k · sb
Where.
xL --- minimum mean signal analysis;
xb --- blank signal average;
m --- a calibration curve in the low concentration range of the slope;
k --- factors associated with confidence;
Sb --- blank signal standard deviation value.
Note. The International Federation of Pure and Applied Chemistry (IUPAC) regulations, xb and Sb experiments with enough number of measurements n>=10 determined. Recommended k = 3, in
Under normal conditions the measured value to comply with, a confidence level of 99.73%. Three times the standard deviation of the blank signal values corresponding to the concentration (or mass) is seized
The limit.
2.2 Limit of quantification
The lower limit of a component quantitative analysis method that can actually be measured.
Note. IUPAC prescribed to 10 times the standard deviation of the blank signal values corresponding to the concentration (or mass) of the limit of quantification.
2.3 Sensitivity
Signal to be measured changes in response to the amount of concentration (or mass) is a unit of measurement of the object caused.
Note. You can also be understood as the slope of the calibration curve.
2.4 Accuracy
Under certain conditions the measurement value was measured by measuring its true value closeness.
Note. commonly referred to as the true value refers to the theoretical true value (such as the angles of a triangle equals 180 °), conventional true value (of the International Conference, the International Organization for Standardization, or on the public
Recognize the magnitude) and relative truth value (such as the magnitude of the reference material certificate given). It excludes all defects on the measurement time by measuring the resulting sound […]
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 35 pages — is available in the English PDF.
Referenced standards
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- GB/T 42263-2022Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
- GB/T 42274-2022Determination of the content and distribution of trace elements (magnesium, gallium) in aluminum nitride materials—Secondary ion mass spectrometry
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