GB/T 30656-2014Polished monocrystalline silicon carbide wafers (English PDF)
碳化硅单晶抛光片
GB/T 30656 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 30656-2023 | Polished monocrystalline silicon carbide wafers | Valid |
| GB/T 30656-2014 | Polished monocrystalline silicon carbide wafers | Obsolete |
GB/T 30656-2014 is obsolete. It has been replaced by GB/T 30656-2023. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Level / Type
National · Recommended
Issue date
December 31, 2014
Implementation date
September 1, 2015
Scope
GB/T 30656-2014 is the English-translated version of 碳化硅单晶抛光片.
GB/T 30656-2014 is the Chinese national standard "Polished monocrystalline silicon carbide wafers". It was issued on December 31, 2014 by the General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China and the Standardization Administration of China, and took effect on September 1, 2015. It is obsolete: it has been replaced by GB/T 30656-2023.
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Document preview — GB/T 30656-2014
National Standard of the People's Republic of China
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China.
Date of issue: 2014-12-31.
Date of implementation: 2015-09-01.
Status: obsolete, replaced by GB/T 30656-2023.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 47082-2026Test method for stacking faults in polished monocrystalline silicon carbide wafers
- GB/T 47404-2026Monocrystalline silicon carbide
- GB/T 32278-2025Test method for thickness and flatness of monocrystalline silicon carbide wafers
- GB/T 43885-2024Silicon carbide epitaxial wafers
- GB/T 43313-2023Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics
- GB/T 41765-2022Test method for dislocation density of monocrystalline silicon carbide
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