GB/T 27788-2011Microbeam analysis - Scanning-electron microscopy - Guidelines for calibrating image magnification (English PDF)
微束分析 扫描电镜 图像放大倍率校准导则
GB/T 27788 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 27788-2020 | Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification | Valid |
| GB/T 27788-2011 | Microbeam analysis - Scanning-electron microscopy - Guidelines for calibrating image magnification | Obsolete |
GB/T 27788-2011 is obsolete. It has been replaced by GB/T 27788-2020. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Level / Type
National · Recommended
Issue date
December 30, 2011
Implementation date
August 1, 2012
Scope
GB/T 27788-2011 is the English-translated version of 微束分析 扫描电镜 图像放大倍率校准导则.
GB/T 27788-2011 is the Chinese national standard "Microbeam analysis - Scanning-electron microscopy - Guidelines for calibrating image magnification".
It was issued on December 30, 2011 by the General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China and the Standardization Administration of China, and took effect on August 1, 2012. It is obsolete: it has been replaced by GB/T 27788-2020.
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Document preview — GB/T 27788-2011
National Standard of the People's Republic of China
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China.
Date of issue: 2011-12-30.
Date of implementation: 2012-08-01.
Status: obsolete, replaced by GB/T 27788-2020.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 17722-2026Microbeam analysis - Method for the thickness measurement of gold coating layers by SEM
- GB/T 45468-2025Microbeam analysis — FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample
- GB/T 36165-2018Determination of average grain size of metal—Electron backscatter diffraction (EBSD) method
- GB/T 33838-2017Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- GB/T 31563-2015Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
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