GB/T 20724-2006Method of thickness measurement for thin crystal by convergent beam electron diffraction (English PDF)
薄晶体厚度的会聚束电子衍射测定方法
GB/T 20724 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| GB/T 20724-2021 | Microbeam analysis - Method of thickness measurement for thin crystals by convergent beam electron diffraction | Valid |
| GB/T 20724-2006 | Method of thickness measurement for thin crystal by convergent beam electron diffraction | Obsolete |
GB/T 20724-2006 is obsolete. It has been replaced by GB/T 20724-2021. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Level / Type
National · Recommended
Issue date
December 25, 2006
Implementation date
August 1, 2007
Scope
GB/T 20724-2006 is the English-translated version of 薄晶体厚度的会聚束电子衍射测定方法.
GB/T 20724-2006 is the Chinese national standard "Method of thickness measurement for thin crystal by convergent beam electron diffraction".
It was issued on December 25, 2006 by the General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China and the Standardization Administration of China, and took effect on August 1, 2007. It is obsolete: it has been replaced by GB/T 20724-2021.
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Document preview — GB/T 20724-2006
National Standard of the People's Republic of China
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China
Contents
- Document data
1 Document data
Sector: National standard (Recommended).
Issuing body: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China; Standardization Administration of China.
Date of issue: 2006-12-25.
Date of implementation: 2007-08-01.
Status: obsolete, replaced by GB/T 20724-2021.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
Referenced standards
Cited by
- GB/T 43748-2024Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
- GB/T 43883-2024Microbeam analysis - Analytical electron microscopy - Method for determining the number density of nanoparticles in a metal
- GB/T 43088-2023Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals
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