GB/T 17626.1-2006[Replaced by GB/Z 17626.1-2024] Electromagnetic compatibility -- Testing and measurement techniques -- Overview of immunity tests (English PDF)
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine
Level / Type
National · Recommended
Issue date
December 1, 2006
Implementation date
July 1, 2007
Scope
GB/T 17626.1-2006 ([Replaced by GB/Z 17626.1-2024] Electromagnetic compatibility -- Testing and measurement techniques -- Overview of immunity tests) is available as an English-translated PDF.
GB/T 17626.1-2006 - This Part covers testing and measuring techniques for electric and electronic equipment (apparatus and systems) in its electromagnetic environment.
The object of this Part is to give applicability assistance to the technical committees of IEC or other bodies, users and manufacturers of electrical and electronic equipment on EMC standards within the GB/T 17626 series on testing and measurement techniques and to provide general recommendations concerning the choice of relevant tests.
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Document preview — GB/T 17626.1-2006
National Standard of the People's Republic of China
- ICS
- 33.100
- Classification
- L 06
Issued by: General Administration of Quality Supervision, Inspection and Quarantine
Contents
- Foreword...3
- 1 Scope...6
- 2 Normative References...6
- 3 General...9
- 4 Definitions...9
- 5 Structure of the GB/T 17626 Series Standards...9
- 6 Selection of Tests...10
Foreword
GB/T 17626 Electromagnetic compatibility – Testing and measurement techniques series
standards consist of the following parts:
--- GB/T 17626.1-2006 Electromagnetic compatibility - Testing and measurement
techniques - Overview of immunity tests
--- GB/T 17626.2-2006 Electromagnetic compatibility - Testing and measurement
techniques - Electrostatic discharge immunity test
--- GB/T 17626.3-2006 Electromagnetic compatibility - Testing and measurement
techniques - Radiated radio-frequency electromagnetic field immunity test
--- GB/T 17626.4-1998 Electromagnetic compatibility -Testing and measurement
techniques - Electrical fast transient/burst immunity test
--- GB/T 17626.5-1999 Electromagnetic compatibility - Testing and measurement
techniques - Surge immunity test
--- GB/T 17626.6-1998 Electromagnetic compatibility - Testing and measurement
techniques - Immunity to conducted disturbances, induced by radio-frequency fields
--- GB/T 17626.7-1998 Electromagnetic compatibility - Testing and measurement
techniques - General guide on harmonics and interharmonics measurements and
instrumentation, for power supply systems and equipment connected thereto
--- GB/T 17626.8-2006 Electromagnetic compatibility - Part 8: Testing and measurement
techniques - Power frequency magnetic field immunity test
--- GB/T 17626.9-1998 Electromagnetic compatibility - Testing and measurement
techniques - Pulse magnetic field immunity test
--- GB/T 17626.10-1998 Electromagnetic compatibility - Testing and measurement
techniques - Damped oscillatory magnetic field immunity test
--- GB/T 17626.11-1999 Electromagnetic compatibility - Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations immunity tests
--- GB/T 17626.12-1998 Electromagnetic compatibility - Testing and measurement
techniques - Oscillatory waves immunity test
--- GB/T 17626.13-2006 Electromagnetic compatibility - Testing and measurement
techniques - Harmonics and interharmonics including mains signaling at a.c. power port
low frequency immunity test
--- GB/T 17626.14-2005 Electromagnetic Compatibility - Testing and measurement
techniques - Voltage fluctuation immunity test
--- GB/T 17626.17-2005 Electromagnetic Compatibility - Testing and measurement
techniques - Ripple on d.c. input power port immunity test
--- GB/T 17626.27-2006 Electromagnetic compatibility - Testing and measurement
techniques - Unbalance immunity test
--- GB/T 17626.28-2006 Electromagnetic compatibility - Testing and measurement
techniques - Variation of power frequency immunity test
--- GB/T 17626.29-2006 Electromagnetic compatibility - Testing and measurement
techniques - Voltage dips short interruptions and voltage variations on d.c. input power
port immunity tests
This Part is Part 1 of GB/T 17626.
This Part equivalently adopts IEC 61000-4-1(2000) Electromagnetic compatibility (EMC) –
Part 4: Testing and measurement techniques – Part 1: Overview of immune tests. This Part
gives practical guidance on test and measurement techniques and provides general advice on
the selection of relevant tests.
This Part replaced GB/T 17626.1-1998 Electromagnetic compatibility - Testing and
measurement techniques - Overview of immunity tests since the date of implementation.
Compared with GB/T 17626.1-1998, the major changes of this Part are as follows:
--- Delete Clause 6 Environmental Conditions, Clause 8 Selection of Severity Levels, and
Clause 9 Evaluation of Test Results;
--- Delete Appendix A brief description of the immunity test and Appendix B the
characteristics of the conducted transient test;
--- Add Table 1 select the immunity test according to the installation location (environment);
--- Add Table 2 scope of application of the immunity test based on the EUT port.
This Part was proposed by China Electricity Council.
This Part shall be under the jurisdiction of National Technical Committee on Electromagnetic
Compatibility of Standardization Administration of China (SAC/TC 246).
Drafting organization of this Part: State Grid Wuhan High Voltage Research Institute.
Chief drafting staffs of this Part: Wang Qin, Wu Xiong, Wan Baoquan, Zhang Guangzhou, and
Lu Yao.
Electromagnetic Compatibility – Testing and Measurement
Techniques – Overview of immunity Tests
1 Scope
This Part covers testing and measuring techniques for electric and electronic equipment
(apparatus and systems) in its electromagnetic environment.
The object of this Part is to give applicability assistance to the technical committees of IEC or
other bodies, users and manufacturers of electrical and electronic equipment on EMC standards
within the GB/T 17626 series on testing and measurement techniques and to provide general
recommendations concerning the choice of relevant tests.
2 Normative References
The provisions in following documents become the provisions of this Part through reference in
this Part of GB/T 17626. For dated references, the subsequent amendments (excluding
corrigendum) or revisions do not apply to this Part, however, parties who reach an agreement
based on this Part are encouraged to study if the latest versions of these documents are
applicable. For undated references, the latest edition of the referenced document applies.
GB/T 4365-2003 Electrotechnical terminology - Electromagnetic compatibility (IEC
60050(161): 1990, IDT)
GB/T 17624.1-1998 Electromagnetic compatibility - General - Application and
interpretation of fundamental definitions and terms (idt IEC 61000-1-1:1992)
GB 17625.1-2003 Electromagnetic compatibility – Limits - Limits for harmonic current
emissions (equipment input current<=16A per phase) (IEC 61000-3-2:2001, IDT)
GB 17625.2-1999 Electromagnetic compatibility - limits - Limitation of voltage
fluctuations and flicker in low-voltage supply systems for equipment with rated
current<=16A (idt IEC 61000-3-3:1994)
GB/Z 17625.3-2000 Electromagnetic compatibility – Limits - Limitation of voltage
fluctuations and flicker in low-voltage power supply systems for equipment with rated
current greater than 16A (idt IEC 61000-3-5:1994)
GB/Z 17625.6-2003 Electromagnetic compatibility – Limits - Limitation of emission of
In general, this test should be limited to products which are susceptible to magnetic fields (for
example Hall effect devices, CRT and special products to be installed in high magnetic field
environments). Exclusions include equipment which is intended for use in a low magnetic field
environment.
lambda Test according to GB/T 17626.9 (Pulse magnetic field immunity test)
This test is mainly applicable to products to be installed in electrical plants (for example
telecontrol centers in close proximity to switchgear).
lambda Test according to GB/T 17626.10 (Damped oscillatory magnetic field immunity test)
This test is mainly applicable to products to be installed in high-voltage substations.
lambda Test according to GB/T 17626.11 (Voltage dips, short interruptions and voltage
variations immunity test)
This test is applicable to equipment with a rated input current of less than 16 A per phase,
connected to a.c. mains.
lambda Test according to GB/T 17626.12 (Oscillatory wave immunity test)
The ring wave test is applicable to equipment connected to a.c. mains in certain countries (for
example the mains network in the USA). The damped oscillatory wave test is applicable to
equipment used in power plants and high-voltage substations (for example static relays).
lambda Test according to GB/T 17626.13 (Harmonics, interharmonics including mains
signalling at a.c. power port, low-frequency immunity tests)
This test may be applied to equipment sensitive to precise zero crossing in time on the a.c.
mains or to specific harmonic components.
lambda Test according to GB/T 17626.14 (Voltage fluctuation immunity test)
In general, voltage fluctuations have an amplitude not exceeding 10 %; therefore, most
equipment is not disturbed by voltage fluctuations. However, this test may be applicable to
equipment intended to be installed at locations where the mains have larger fluctuations.
lambda Test according to GB/T 17626.15 (Flickermeter – Functional and design specifications)
This is a specification for a flickermeter, intended to indicate correct flicker perception level
for all practical voltage fluctuation waveforms, especially with regard to the emission
requirements according to GB 17625.2, GB/Z 17625.3 and IEC 61000-3-11.
lambda Test according to IEC 61000-4-16:1999 (Test for immunity to conducted, common mode
disturbances in the frequency range 0 Hz to 150 kHz)
......
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 10 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 4365-2003Electrotechnical terminology -- Electromagnetic compatibility
- GB 17625.1-2003Electromagnetic compatibility - Limits - Part 1: Limits for harmonic current emissions(equipment input current <=16 A per phase)
- GB 17625.2-1999[GB/T 17625.2-2007] Electromagnetic compatibility (EMC) -- Limits -- Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <=16 A per phase and not subject to conditional conn
- GB/Z 17625.3-2000Electromagnetic compatibility - Limits - Limitation of voltage fluctuations and flicker in low-voltage power supply systems for equipment with rated current greater than 16 A
- GB/Z 17625.6-2003Electromagnetic compatibility - Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16A
- GB/T 17626.9Electromagnetic compatibility - Testing and measurement techniques - Part 9: Impulse magnetic field immunity test
GB/T 17626 · GB/T 17624.1-1998 · IEC 61000 · GB/T 17626.10 · GB/T 17626.13 · GB/T 17626.14 · GB/T 17626.15
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Related Standards
GB 17625.2-2007 — [GB/T 17625.2-2007] Electromagnetic compatibility (EMC) -- Limits -- Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <=16 A per phase and not subject to conditional conn
GB/T 17626.11-2023 — Electromagnetic compatibility - Testing and measurement techniques - Part 11: Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
GB/T 17626.12-2023 — Electromagnetic compatibility - Testing and measurement techniques - Part 12: Ring wave immunity test
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