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GB/Z 17626.33-2023Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

May 23, 2023

Implementation date

June 1, 2024

Scope

GB/Z 17626.33-2023 (Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters) is available as an English-translated PDF.

GB/Z 17626.33-2023 is the Chinese standard "Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters".

Its scope clause reads: This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following content: --- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field); --- Current I (for example: transient field induction or within the system under test); --- Voltage U (for example: induced by transient field or in the system under test); --- Induced charge.

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Document preview — GB/Z 17626.33-2023

National Standard of the People's Republic of China

ICS
33.100.10, 33.100.20
Classification
L 06

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

  • Preface
  • Introduction
  • 1 Scope
  • 2 Normative references
  • 3 Terms and Definitions
  • 4 Measurement of High Power Transient Response
  • 5 Measurement of low frequency response
  • 6 Calibration procedure
  • Appendix A (Normative) Description of Measured Response Characteristics
  • Appendix B (Informative) Characteristics of Measuring Sensors
  • Appendix C (Normative) HPEM measurement procedure
  • Appendix D (informative) Two-port representation of measurement link unit

1 Scope

This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following content:

--- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field);

--- Current I (for example: transient field induction or within the system under test);

--- Voltage U (for example: induced by transient field or in the system under test);

--- Induced charge Q on cables or other conductors:

Note: The charge Q on the conductor is a basic quantity with definite significance at any frequency: However, the voltage U is a constant only at low frequencies

A defined (subordinate) quantity: At high frequencies, the voltage cannot be determined from the line integral of the electric field, since this integral is path-dependent: so, yes

Due to the pulse with a fast rising edge (with a large number of high-frequency components), it is not appropriate to use voltage as the measurement quantity: In this case, it is necessary to measure the voltage

Load capacity:

These measurands are usually complex time-varying waveforms that can be approximately described by scalar parameters or "measurable parameters":

include:

--- the peak value of the response;

---Waveform rise time;

--- The falling time (or duration) of the waveform;

---Pulse Width;

--- The norm obtained from the waveform in the mathematical sense:

This document provides information on the measurement methods and characteristic parameters of these waveforms, but does not provide information on the specific level requirements for measurement:

information:

2 Normative references

The contents of the following documents constitute the essential provisions of this document through normative references in the text: Among them, dated references

For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document:

Note: GB/T 4365-2003 Electrotechnical Terminology Electromagnetic Compatibility (IEC 60050-161:1990, IDT)

IEC 61000-2-9 Electromagnetic Compatibility Part 2: Environment Part 9: HEMP Environment Description Radiated Disturbance [Electro- magnetic compatibility (EMC)-Part 2:Environment-Section 9: Description of HEMP environment-Radiated disturbance]

Note: GB/T 18039:10-2018 Electromagnetic Compatibility Environment HEMP Environment Description Radiation Disturbance (IEC 61000-2-9:1996, IDT)

IEC 61000-2-10 Electromagnetic compatibility Part 2-10: Description of the environment HEMP environment Conducted disturbances

GB/T 17626.3 | GB/T 17626.5 | GB/T 17626.2 | GB/Z 17626.40 | GB/Z 17626.35 | GB/Z 17626.32 | […]

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 94 pages — is available in the English PDF.

Referenced standards

Normative references

IEC 60050 · IEC 61000 · GB/T 18039

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