GB/Z 17626.33-2023Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters (English PDF)
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Issued by
State Administration for Market Regulation, China National Standardization Administration
Level / Type
National · Recommended
Issue date
May 23, 2023
Implementation date
June 1, 2024
Scope
GB/Z 17626.33-2023 (Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters) is available as an English-translated PDF.
GB/Z 17626.33-2023 is the Chinese standard "Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters".
Its scope clause reads: This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following content: --- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field); --- Current I (for example: transient field induction or within the system under test); --- Voltage U (for example: induced by transient field or in the system under test); --- Induced charge.
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Document preview — GB/Z 17626.33-2023
National Standard of the People's Republic of China
- ICS
- 33.100.10, 33.100.20
- Classification
- L 06
Issued by: State Administration for Market Regulation, China National Standardization Administration
Contents
- Preface
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Measurement of High Power Transient Response
- 5 Measurement of low frequency response
- 6 Calibration procedure
- Appendix A (Normative) Description of Measured Response Characteristics
- Appendix B (Informative) Characteristics of Measuring Sensors
- Appendix C (Normative) HPEM measurement procedure
- Appendix D (informative) Two-port representation of measurement link unit
1 Scope
This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following content:
--- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field);
--- Current I (for example: transient field induction or within the system under test);
--- Voltage U (for example: induced by transient field or in the system under test);
--- Induced charge Q on cables or other conductors:
Note: The charge Q on the conductor is a basic quantity with definite significance at any frequency: However, the voltage U is a constant only at low frequencies
A defined (subordinate) quantity: At high frequencies, the voltage cannot be determined from the line integral of the electric field, since this integral is path-dependent: so, yes
Due to the pulse with a fast rising edge (with a large number of high-frequency components), it is not appropriate to use voltage as the measurement quantity: In this case, it is necessary to measure the voltage
Load capacity:
These measurands are usually complex time-varying waveforms that can be approximately described by scalar parameters or "measurable parameters":
include:
--- the peak value of the response;
---Waveform rise time;
--- The falling time (or duration) of the waveform;
---Pulse Width;
--- The norm obtained from the waveform in the mathematical sense:
This document provides information on the measurement methods and characteristic parameters of these waveforms, but does not provide information on the specific level requirements for measurement:
information:
2 Normative references
The contents of the following documents constitute the essential provisions of this document through normative references in the text: Among them, dated references
For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document:
Note: GB/T 4365-2003 Electrotechnical Terminology Electromagnetic Compatibility (IEC 60050-161:1990, IDT)
IEC 61000-2-9 Electromagnetic Compatibility Part 2: Environment Part 9: HEMP Environment Description Radiated Disturbance [Electro- magnetic compatibility (EMC)-Part 2:Environment-Section 9: Description of HEMP environment-Radiated disturbance]
Note: GB/T 18039:10-2018 Electromagnetic Compatibility Environment HEMP Environment Description Radiation Disturbance (IEC 61000-2-9:1996, IDT)
IEC 61000-2-10 Electromagnetic compatibility Part 2-10: Description of the environment HEMP environment Conducted disturbances
GB/T 17626.3 | GB/T 17626.5 | GB/T 17626.2 | GB/Z 17626.40 | GB/Z 17626.35 | GB/Z 17626.32 | […]
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 94 pages — is available in the English PDF.
Referenced standards
Normative references
IEC 60050 · IEC 61000 · GB/T 18039
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Related Standards
GB/T 18039.10-2018 — Electromagnetic compatibility (EMC) -- Environment -- Description of HEMP environment -- Radiated disturbance
GB/T 18039.11-2025 — Electromagnetic compatibility - Environment - Part 11: Classification of HEMP environments
GB/T 18039.3-2017 — Electromagnetic compatibility -- Environment -- Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems
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