GB/Z 17626.33-2023Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters (English PDF)

foreword

This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents"

drafting:

This document is part 33 of GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology": GB/T (Z) 17626 has been issued

the following sections:

---GB/T 17626:1-2006 Electromagnetic Compatibility Test and Measurement Technology Immunity Test General;

---GB/T 17626:2-2018 Electromagnetic Compatibility Test and Measurement Technology Electrostatic Discharge Immunity Test;

---GB/T 17626:3-2016 Electromagnetic Compatibility Test and Measurement Technology Radio Frequency Electromagnetic Field Radiation Immunity Test;

---GB/T 17626:4-2018 Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test;

---GB/T 17626:5-2019 Electromagnetic compatibility test and measurement technology surge (shock) immunity test;

---GB/T 17626:6-2017 Electromagnetic Compatibility Test and Measurement Technology Conducted Disturbance Immunity of Radio Frequency Field Induction;

---GB/T 17626:7-2017 Electromagnetic Compatibility Test and Measurement Technology Power Supply System and Connected Equipment Harmonics and Interharmonics Measurement

Guidelines for quantities and measuring instruments;

---GB/T 17626:8-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Magnetic Field Immunity Test;

---GB/T 17626:9-2011 Electromagnetic Compatibility Test and Measurement Technology Pulse Magnetic Field Immunity Test;

---GB/T 17626:10-2017 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillating Magnetic Field Immunity Test;

---GB/T 17626:11-2023 Electromagnetic Compatibility Test and Measurement Technology Part 11: For each phase input current less than or equal

Immunity tests for voltage dips, short interruptions and voltage changes for 16A equipment;

---GB/T 17626:12-2023 Electromagnetic compatibility test and measurement technology Part 12: Ring wave immunity test;

---GB/T 17626:13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal

No: low frequency immunity test;

---GB/T 17626:14-2005 Electromagnetic Compatibility Test and Measurement Technology Voltage Fluctuation Immunity Test;

---GB/T 17626:15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications;

---GB/T 17626:16-2007 Electromagnetic Compatibility Test and Measurement Technology 0Hz~150kHz Common Mode Conducted Disturbance Immunity

test;

---GB/T 17626:17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test;

---GB/T 17626:18-2016 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillatory Wave Immunity Test;

---GB/T 17626:19-2022 Electromagnetic Compatibility Test and Measurement Technology Part 19: AC Power Port 2kHz~

150kHz differential mode conduction disturbance and communication signal immunity test

---GB/T 17626:20-2014 Electromagnetic Compatibility Test and Measurement Technique Transverse Electromagnetic (TEM) Waveguide Emission and Immunity

degree test;

---GB/T 17626:21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;

---GB/T 17626:22-2017 Electromagnetic Compatibility Test and Measurement Technology Radiated Emission and Immunity in Fully Anechoic Chamber

Measurement;

---GB/T 17626:24-2012 Electromagnetic Compatibility Test and Measurement Technology HEMP Conducted Disturbance Protection Device Test

method;

---GB/T 17626:27-2006 Electromagnetic Compatibility Test and Measurement Technology Three-phase Voltage Unbalance Immunity Test;

---GB/T 17626:28-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Frequency Change Immunity Test;

---GB/T 17626:29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term

Immunity test for interruption and voltage change;

---GB/T 17626:30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method;

---GB/T 17626:31-2021 Electromagnetic Compatibility Test and Measurement Technology Part 31: AC Power Port Broadband Conduction

Disturbance immunity test;

---GB/T 17626:34-2012 Electromagnetic compatibility test and measurement technology for equipment with main power supply current greater than 16A per phase

Voltage dips, short interruptions and voltage variations immunity tests:

This document is equivalent to IEC 61000-4-33:2005 "Electromagnetic Compatibility (EMC) Part 4-33: Test and measurement techniques for high power

Transient Parameter Measurement Methods": The document type is adjusted from the IEC standard to the national standardization guiding technical document of our country:

The following minimal editorial changes have been made to this document:

--- In order to maintain unity with the name of the standard system, the name of the standard is changed to "Electromagnetic Compatibility Testing and Measurement Technology Part 33: High

Power Transient Parameter Measurement Method":

Please note that some contents of this document may refer to patents: The issuing agency of this document assumes no responsibility for identifying patents:

Introduction

Electromagnetic compatibility is the ability of electrical and electronic equipment or systems to function properly in their electromagnetic environment without causing adverse effects to anything in that environment:

Ability to withstand electromagnetic disturbances: Electromagnetic compatibility is one of the important factors affecting the environment and product quality, and its standardization work has

aroused widespread attention at home and abroad: In this regard, the IEC 61000 series of publications developed by the International Electrotechnical Commission (IEC )

Common standards in the fields of industry, electrical engineering and energy, transportation, social undertakings and health, quality and safety of consumer goods, etc:, divided into

There are 6 categories: generalization, environment, limit values, testing and measurement techniques, installation and mitigation guidelines, and general standards: my country has launched a series of publications

The domestic transformation work has been carried out, and the corresponding national standard system has been established:

In this standard system, GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology" is about the field of electromagnetic compatibility test and measurement

The basic standard in terms of technology, which aims to describe the immunity test of electromagnetic compatibility phenomena such as conduction disturbance and radiation disturbance, etc:, is proposed to be composed of 39

Partial composition:

--- Part 1: General remarks on immunity test: The purpose is to provide usability guidelines for testing and measurement techniques in EMC standards

guide and provide general advice on the selection of relevant tests:

--- Part 2: Electrostatic discharge immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic devices

performance of equipment subjected to electrostatic discharge:

--- Part 3: RF electromagnetic field radiation immunity test: The purpose is to establish when electrical and electronic equipment is radiated by radio frequency electromagnetic fields

Basis for immunity evaluation:

--- Part 4: Electrical fast transient burst immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical

Immunity of power supply ports, signal, control and ground ports of electronic equipment and electronic equipment when disturbed by electrical fast transient bursts

performance:

--- Part 5: Surge (shock) immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic

The immunity performance of the equipment when it is subjected to surge (shock):

--- Part 6: Immunity to conducted disturbances induced by radio frequency fields: The purpose is to establish a common and reproducible benchmark for evaluating electrical

and the immunity performance of electronic equipment when receiving conducted disturbances induced by radio frequency fields:

--- Part 7: Guidelines for measuring and measuring instruments for harmonics and interharmonics of power supply systems and connected equipment: The purpose is to specify the root

Test the equipment item by item according to the emission limits given by some standards, and measure the harmonic current and voltage in the actual power supply system

instrument:

--- Part 8: Power frequency magnetic field immunity test: The purpose is to establish a common and reproducible benchmark for evaluating household, commercial and

Immunity performance of industrial electrical and electronic equipment exposed to power frequency (continuous and short-duration) magnetic fields:

--- Part 9: Pulse magnetic field immunity test: The purpose is to establish common and reproducible benchmarks for evaluating residential, commercial and

Immunity of electrical and electronic equipment for industrial use in pulsed magnetic fields:

--- Part 10: Damped oscillating magnetic field immunity test: The purpose is to establish a general and reproducible benchmark for evaluating medium and high pressure

Immunity performance of electrical and electronic equipment in substations in damped oscillating magnetic fields:

--- Part 11: Immunity to voltage dips, short interruptions and voltage changes for devices with an input current of less than or equal to 16A per phase

test: The purpose is to establish a general and reproducible benchmark for evaluating the performance of electrical and electronic equipment subjected to voltage dips, short-term

Immunity performance against interruptions and voltage variations:

--- Part 12: Ring wave immunity test: The purpose is to establish a general and reproducible benchmark for evaluating

The immunity performance of residential, commercial and industrial electrical and electronic equipment is also applicable to equipment in power stations and substations:

--- Part 13: Low frequency immunity test of AC port harmonics, interharmonics and grid signals: The purpose is to establish a general and

Reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and grid signal frequencies:

--- Part 14: Voltage fluctuation immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic

Immunity of equipment when subjected to positive and negative voltage fluctuations of low magnitude:

--- Part 15: Scintillator function and design specifications: The goal is to show the correct flicker for all actual voltage fluctuation waveforms

perceived level:

--- Part 16: 0Hz~150kHz common mode conducted disturbance immunity test: The purpose is to establish electrical and electronic equipment to withstand common

Generic and repeatable guidelines for mode-conducted disturbance testing:

--- Part 17: DC power input port ripple immunity test: The purpose is to establish a general and reproducible benchmark for

Superimposed on direct current when charging electrical and electronic equipment under laboratory conditions from e:g:

Immunity test for ripple voltage on source:

--- Part 18: Damped oscillatory wave immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electrical

Immunity performance of sub-equipment when subjected to damped oscillatory waves:

--- Part 19: AC power port 2kHz~150kHz differential mode conducted disturbance and communication signal immunity test: purpose is

Confirm that electrical and electronic equipment can withstand the power from power electronics and power line communication systems (PLC) when operating on the utility grid:

and other differential mode conducted disturbances:

--- Part 20: Emission and immunity tests in transverse electromagnetic (TEM) waveguides: The purpose is to give the performance of TEM waveguide,

Confirmation method of TEM waveguide for electromagnetic compatibility test, test for radiated emission and immunity test in TEM waveguide

Test layout, steps and requirements:

--- Part 21: Mixing chamber test methods: The purpose is to establish the use of mixing chambers to evaluate electrical and electronic equipment in radio frequency electromagnetic fields

General specification for the performance and determination of radiated emission levels for electrical and electronic equipment:

--- Part 22: Radiated emission and immunity measurements in a fully anechoic chamber: The purpose is to stipulate that in the same fully anechoic chamber

General confirmation procedures for radiated emission and radiated immunity, test layout requirements for equipment under test and full anechoic chamber measurement methods:

--- Part 23: Test methods for HEMP and other radiation disturbance protection devices: The purpose is to describe the HEMP test by

Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, data processing

and other important concepts:

--- Part 24: Test methods for HEMP conducted disturbance protection devices: The purpose is to specify the HEMP conducted disturbance protection device

Test methods, including the test of voltage breakdown and voltage limiting characteristics, and the residual voltage when the voltage and current change rapidly

Measurement methods:

--- Part 25: Equipment and systems HEMP immunity test methods: The purpose is to establish a general and reproducible benchmark for

When evaluating exposure to HEMP radiation environments and their conducted transient disturbances on power supplies, antennas, I/O signal lines, and control lines

performance of electrical and electronic equipment:

--- Part 27: Three-phase voltage unbalance immunity test: The purpose is to provide electrical and electronic equipment for unbalanced power supply

Establish a reference for the immunity evaluation under pressure:

--- Part 28: Power frequency frequency variation immunity test: The purpose is to protect electrical and electronic equipment when they are subjected to changes in power frequency

Provide basis for immunity evaluation:

--- Part 29: Immunity test for voltage dips, short interruptions and voltage changes at the DC power input port: The purpose is to establish a

General guidelines for the immunity of DC electrical and electronic equipment to voltage dips, short interruptions and voltage variations:

--- Part 30: Power quality measurement methods: The purpose is to specify the measurement method of power quality parameters in 50Hz AC power supply system

and interpretation of measurement results:

--- Part 31: AC power port broadband conducted disturbance immunity test: The purpose is to establish a common benchmark for evaluating electrical

Immunity of electrical and electronic equipment AC power ports subjected to conducted disturbances from intentional and/or unintentional broadband signal sources:

--- Part 32: Overview of the high-altitude nuclear electromagnetic pulse (HEMP) simulator: The purpose is to provide international existing system-level HEMP

Simulators and their associated information required as immunity testing and verification equipment:

--- Part 33: High power transient parameter measurement methods: The purpose is to give the measurement method and method of high power electromagnetic transient response waveform

Information about the characteristic parameters:

--- Part 34: Voltage dips, short interruptions and voltage variations immunity tests for equipment with main power supply current greater than 16A per phase:

The purpose is to establish a general method for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage changes:

guidelines:

--- Part 35: Overview of high power electromagnetic (HPEM) simulators: The purpose is to provide the existing international system-level HPEM narrow

Band (narrow-spectrum) and broadband (broad-spectrum, sub-ultra-broadband and ultra-broadband) simulators and their use as immunity test and verification equipment

relevant information required:

--- Part 36: Intentional electromagnetic disturbance immunity test for equipment and systems: The purpose is to evaluate equipment and systems against intentional electromagnetic

The immunity of the source of interference provides a means of determining the test level:

--- Part 37: Harmonic emission test system calibration and verification protocol: The purpose is to provide manufacturers, end users, independent laboratories,

Other organizations provide systematic guidance to specify the applicable compliance status within a range of harmonic current emissions:

--- Part 38: Testing, verification and calibration protocols for voltage fluctuation and flicker compliance test systems: type test

The system of equipment provides guidelines and methods for periodic calibration and verification:

--- Part 39: Near-field radiation immunity test: The purpose is to establish a common benchmark for assessing exposure to radiation from close-in sources

Immunity requirements for electrical and electronic equipment in radio frequency electromagnetic fields:

--- Part 40: Digital measurement methods for modulated or distorted signal power: The purpose is to introduce two methods suitable for volatile or non-periodic negative

A digital algorithm for power quantity measurement is downloaded and the working principle of the proposed algorithm is explained:

Electromagnetic Compatibility Test and Measurement Technology

Part 33: Measurement methods of high power transient parameters

1 Scope

This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following

content:

--- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field);

--- Current I (for example: transient field induction or within the system under test);

--- Voltage U (for example: induced by transient field or in the system under test);

--- Induced charge Q on cables or other conductors:

Note: The charge Q on the conductor is a basic quantity with definite significance at any frequency: However, the voltage U is a constant only at low frequencies

A defined (subordinate) quantity: At high frequencies, the voltage cannot be determined from the line integral of the electric field, since this integral is path-dependent: so, yes

Due to the pulse with a fast rising edge (with a large number of high-frequency components), it is not appropriate to use voltage as the measurement quantity: In this case, it is necessary to measure the voltage

Load capacity:

These measurands are usually complex time-varying waveforms that can be approximately described by scalar parameters or "measurable parameters":

include:

--- the peak value of the response;

---Waveform rise time;

--- The falling time (or duration) of the waveform;

---Pulse Width;

--- The norm obtained from the waveform in the mathematical sense:

This document provides information on the measurement methods and characteristic parameters of these waveforms, but does not provide information on the specific level requirements for measurement:

information:

2 Normative references

The contents of the following documents constitute the essential provisions of this document through normative references in the text: Among them, dated references

For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to

this document:

Note: GB/T 4365-2003 Electrotechnical Terminology Electromagnetic Compatibility (IEC 60050-161:1990, IDT)

IEC 61000-2-9 Electromagnetic Compatibility Part 2: Environment Part 9: HEMP Environment Description Radiated Disturbance [Electro-

magnetic compatibility (EMC)-Part 2:Environment-Section 9: Description of HEMP

environment-Radiated disturbance]

Note: GB/T 18039:10-2018 Electromagnetic Compatibility Environment HEMP Environment Description Radiation Disturbance (IEC 61000-2-9:1996, IDT)

IEC 61000-2-10 Electromagnetic compatibility Part 2-10: Description of the environment HEMP environment Conducted disturbances