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GB/T 43040-2023Semiconductor integrated circuits—Test method of AC/DC converters (English PDF)

半导体集成电路 AC/DC变换器测试方法

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

September 7, 2023

Implementation date

April 1, 2024

Scope

GB/T 43040-2023 is the English-translated version of 半导体集成电路 AC/DC变换器测试方法.

This document describes the methods for testing the parameters of the AC to DC converters made as semiconductor integrated circuits. The document applies to the parameter testing of those converters.

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Document preview — GB/T 43040-2023

National Standard of the People's Republic of China

ICS: 31.200
Classification: L 55

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Preface
1 Scope
2 Normative reference documents
3 Terms and Definitions
4 General test requirements
4.1 Test environment requirements
4.2 Test Notes
4.3 Test instruments and equipment
5 Test conditions and test procedures
5.1 Input voltage range (VIN_R)
5.2 Input frequency range (fIN_R)
5.3 No-load input current (IIN_NULL)
5.4 Full load input current (IIN_FULL)
5.5 Off-state input current (IIN_SD)
5.6 Output voltage accuracy (alpha)
5.7 Output voltage temperature coefficient (alphaTC)
5.8 Output ripple voltage (Vo_RIPPLE)
5.9 Voltage regulation (SV)
5.10 Current Regulation (SI)
5.11 Cross adjustment rate (SC)
5.12 Output voltage adjustment range (VOR_TRIM)
5.13 Efficiency (eta)
5.14 Leakage current (ICASE)
5.15 Input surge current (IINRUSH)
5.16 Output limiting current (IOPRO)
5.17 Startup output overshoot voltage (VOT)
5.18 Load change transient overshoot voltage (VLOR)
5.19 Load change transient response time (tROR)
5.20 Isolation impedance (RISO)
5.21 Switching frequency (fC)
5.22 Start-up delay time (tTR)
5.23 Output holding time (tH)
5.24 Enable turn-on voltage (VON)
5.25 Enable shutdown voltage (VOFF)
5.26 Enable input current (IEN)
5.27 Enable delay time (tEN)
5.28 Electrical strength (SD)

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.

1 Scope

This document describes the parametric testing methods for semiconductor integrated circuit AC to DC (AC/DC) converters (hereinafter referred to as devices).

This document is suitable for testing the parameters of AC/DC converters of semiconductor integrated circuits.

2 Normative reference documents

This document has no normative references.

3 Terms and definitions

The following terms and definitions apply to this document.

3.1 Input voltage range

During normal operation, the AC voltage range (effective value) allowed to be applied to the input terminal of the device.

3.2 Inputfrequencyrangeinputfrequencyrange

During normal operation, the frequency range of the AC voltage applied to the input terminal of the device.

3.3 No-load input current

Under the specified input voltage, input frequency and no load, the AC current (effective value) flowing through the input terminal of the device.

3.4 Full load input current

Under the specified input voltage, input frequency and full load, the AC current (effective value) flowing through the input terminal of the device.

3.5 Shut-downinputcurrent

Under the specified input voltage and input frequency, when the device output is in the off state, the AC current (effective value) flows through the input terminal.

3.6 Output voltage accuracy

The deviation of the device output voltage value from the nominal value under the specified input voltage, input frequency and output load.

Note: Usually expressed as a percentage.

3.7 Output voltage temperature coefficient

During normal operation, the relative change rate of the device output voltage with temperature.

3.8 Output ripple voltage

Under the specified input voltage, input frequency and output load, the peak-peak value of the AC component contained in the DC output voltage of the device.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 34 pages — is available in the English PDF.

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