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GB/T 43034.3-2023Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

September 7, 2023

Implementation date

January 1, 2024

Scope

GB/T 43034.3-2023 (Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method) is available as an English-translated PDF.

This document specifies the method for measuring the immunity of integrated circuits to standard conducted electrical transient disturbances, where the disturbance is applied to the IC pins through a coupling network asynchronously with the operation of the device under test.

The method allows the relation between a conducted electrical transient disturbance and the degradation it causes in the IC's performance to be obtained and classified, whether or not the disturbance falls within the IC's specified operating voltage range.

It is the third part of the standard on the measurement of impulse immunity of integrated circuits, and covers the non-synchronous transient injection method.

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Document preview — GB/T 43034.3-2023

National Standard of the People's Republic of China

ICS: 31.200
Classification: L 56

Issued by: State Administration for Market Regulation, China National Standardization Administration

Preface
Introduction
1 Scope
2 Normative reference documents
3 Terms and Definitions
4 Overview
5 Coupling network
5.1 General
5.2 Power injection network
5.3 Input pin injection
5.4 Output pin injection
5.5 Multiple pins injected simultaneously
6 IC Configuration and Evaluation
6.1 IC configuration and operating modes
6.2 IC monitoring
6.3 IC performance classification
7 Test conditions
7.1 General
7.2 Electromagnetic environment
7.3 Ambient temperature
7.4 IC supply voltage
8 Test equipment
8.1 General requirements for test equipment
8.2 Cable
8.3 Shield
8.4 Transient Generator
8.5 Power
8.6 Monitoring and stimulation equipment
8.7 Control unit
9 Test layout
9.1 General
9.2 EMC test board
10 Test Procedure
10.1 Pilot Plan
10.2 Test preparation
10.3 Coupled pulse characteristics
10.4 Pulse Immunity Measurement
10.5 Explanation and comparison of test results
10.6 Transient Immunity Acceptance Level
11 Test report
Appendix A (informative) Test board requirements
Appendix B (Informative) Tips for Selecting Coupling and Decoupling Network Component Values
Appendix C (informative) Industrial environment and consumer environment tests
Appendix D (Informative) Vehicle Environmental Test

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.

This document is Part 3 of GB/T 43034 "Measurement of Pulse Immunity of Integrated Circuits". GB/T 43034 has released the following part.

---Part 3: Non-synchronous transient injection method.

This document is equivalent to IEC 62215-3:2013 "Measurement of pulse immunity of integrated circuits - Part 3: Non-synchronous transient injection method".

Introduction

In order to standardize the pulse immunity measurement of integrated circuits and provide pulse immunity measurement methods for integrated circuit manufacturers and testing institutions.

Method, GB/T 43034 specifies the general conditions, definitions and test procedures for different injection measurement methods of integrated circuit pulse immunity measurement. The test requirements are planned to consist of 2 parts.

---Part 2: Synchronous transient injection method. The purpose is to specify the test procedures and test requirements for the synchronous transient injection method.

---Part 3: Non-synchronous transient injection method. The purpose is to specify the test procedures and test requirements for the non-synchronous transient injection method.

1 Scope

This document specifies methods for measuring the immunity of integrated circuits (ICs) to standard conducted electrical transient disturbances. Run with device under test (DUT)

Asynchronous disturbance is applied to the IC pins through the coupling network. Regardless of whether the electrical transient disturbance is within the operating voltage range specified by the IC, this All methods can obtain and classify the correlation between conducted electrical transient disturbance and the IC performance degradation caused by it.

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.

GB/T 17626.4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient burst immunity test (IEC 61000-4-4:2012,IDT)

GB/T 17626.5-2019 Electromagnetic compatibility testing and measurement technology surge (impact) immunity test (IEC 61000-4-5. 2014,IDT)

Note: There is no technical difference between the quoted content of GB/T 17626.5-2019 and the quoted content of IEC 61000-4-5:2005.

ISO 7637-2:2011 Electrical disturbances due to conduction and coupling in road vehicles Part 2: Conducted electrical transients along power lines

Note: GB/T 21437.2-2021 Test method for electrical disturbance caused by conduction and coupling from electrical/electronic components of road vehicles Part 2: Along power lines Electrical transient conducted emissions and immunity (ISO 7637-2:2011, MOD) (IEV)-Chapter131.Circuittheory]

Note: GB/T 2900.74-2008 Electrical Terminology Circuit Theory (IEC 60050-131:2002, MOD)

Note: GB/T 4365-2003 Electrical Terminology Electromagnetic Compatibility (IEC 60050-161:1990 A1.1997 A2.1998, IDT)

IEC 62132-4:2006 Measurement of electromagnetic immunity of integrated circuits (150kHz~1GHz) Part 4: Radio frequency power direct injection

3 Terms and definitions

The terms and definitions defined in IEC 60050-131 and IEC 60050-161 and the following apply to this document.

3.1 Auxiliary equipment

Non-EUT that is necessary to establish full functionality and determine correct performance (operation) of the device under test when exposed to disturbances.

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.

Referenced standards

Normative references

ISO 7637-2:2011 · IEC 62132-4:2006

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