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GB/T 46894-2025General specification for the EMC testing of vehicle integrated circuits (English PDF)

车辆集成电路电磁兼容试验通用规范

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

December 31, 2025

Implementation date

July 1, 2026

Scope

GB/T 46894-2025 is the English-translated version of 车辆集成电路电磁兼容试验通用规范.

GB/T 46894-2025 is the Chinese national standard covering the electromagnetic compatibility of a chip destined for a car - its emissions and its immunity measured at component level, because finding the problem in the vehicle at the end of development costs a redesign. First edition. It was issued on 31 December 2025 and has been in force since 1 July 2026, as a first edition. The document is under the responsibility of the Ministry of Industry and Information Technology. This page is published from the official record of the 2025 edition; the clause text of a standard this recent is not yet in circulation, and the figures, limits and tables it contains are those of the document itself, delivered in full with the English translation.

Document preview — GB/T 46894-2025

National Standard of the People's Republic of China

ICS
31.200
Classification
L 56

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

  • 1 Scope
  • 2 Normative references
  • 3 Terms, Definitions and Abbreviations
  • 3.1 Terms and Definitions The terms and definitions defined in GB/T 42968.1 and
  • 3.2 Abbreviations
  • 4 Direct injection of radio frequency power
  • 5 Requirements
  • 5.1 RF Transmission
  • 5.2 RF Immunity
  • 5.3 Impulse Immunity
  • 5.4 System-level ESD
  • 6 Test Methods
  • 6.1 General Requirements
  • 6.2 Launch
  • 6.3 Immunity
  • 8 Measurement of radiated immunity-IC stripline method
  • 20 References

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part

1.Structure and Drafting Rules of Standardization Documents". Drafting. Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents. This document was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Integrated Circuit Standardization Technical Committee (SAC/TC599). This document was drafted by: China Electronics Technology Standardization Institute, JWTE Microelectronics Co., Ltd., and China Automotive Engineering Research Institute. Joint-stock company, Beijing National New Energy Vehicle Technology Innovation Center Co., Ltd., Xiamen Hainoda Scientific Instruments Co., Ltd., China Automotive Technology and Research Center (CATARC) New Energy Vehicle Testing Center (Tianjin) Co., Ltd., Huawei Technologies Co., Ltd., China Automotive Technology and Research Center Co., Ltd., Beijing Zhixin Microelectronics Co., Ltd. Electronics Technology Co., Ltd., Tianjin Advanced Technology Research Institute, the Fifth Research Institute of Electronics of the Ministry of Industry and Information Technology, Sun Yat-sen University, Guangzhou Zhiyuan Electronics Co., Ltd. Co., Ltd., Henan Kerry Vehicle Testing and Certification Center Co., Ltd., Nanjing Rongxiang Testing Equipment Co., Ltd., Yangxin Technology (Shenzhen) Co., Ltd. The company, Jiangsu Aerospace Dawei Technology Co., Ltd., Shenzhen Hisilicon Semiconductor Co., Ltd., Beijing Institute of Technology, and NXP Semiconductors (Tianjin) Integrated Circuit Design Co., Ltd., Shenzhen Basic Semiconductor Co., Ltd., China Household Electric Appliance Research Institute, China National Accreditation Center for Conformity Assessment Shenzhen Hengchuang Technology Co., Ltd., Chongqing Qingshan Industrial Co., Ltd., Beiqi Foton Motor Co., Ltd., and Shenzhen Chengtian Technology Co., Ltd. Limited Liability Company, Freetech Intelligent Systems Co., Ltd., Guangzhou Huakai Vehicle Equipment Co., Ltd., EZ Microelectronics (Hangzhou) Co., Ltd. Hubei Kaili Special Vehicle Co., Ltd., Cixi Fengzhida Electric Co., Ltd., Ningbo Huichang Auto Parts Co., Ltd., Suzhou Subo Inspection Test Technology Service Co., Ltd., Shenzhen Saiyuan Microelectronics Co., Ltd., Shenzhen Tianwei Electronics Co., Ltd., Shenzhen Silicon Mountain Technology Limited Liability Company, Chery Automobile Co., Ltd. The main drafters of this document are. Cui Qiang, Fu Jun, Huang Xuemei, Lei Lili, Zhu Sai, Wu Jianfei, Fang Wenxiao, Li Qi, Ye Chang, Huang Biliang, and Liang Jiming. Li Huanran, Zhang Jie, Zhang Xinghai, Ji Guotian, Yang Xiaojuan, Shao Weiheng, Chen Meishuang, Chen Yongzhi, Wang Wenjie, Xing Liwen, Yang Hongbo, Xu Xiongxiong, Huang Yintao Zhai Li, Liu Pin, He Weiwei, Li Yan, Liu Jia, Yang Zhiqi, Wu Xing, Li Tengfei, Qian Lei, Shen Junqiang, Guo Ziqi, Kou Fan, Liang Jie, Sun Feng, Chen Chunbo Yu Qun, Zhai Guanjie, Men Hongda, Xiong Zhaochun, Tang Wei, Sun Xiaobao. General Specifications for Electromagnetic Compatibility Testing of Vehicle Integrated Circuits

1 Scope

GB/T 46894-2025 is the Chinese national standard covering the electromagnetic compatibility of a chip destined for a car - its emissions and its immunity measured at component level, because finding the problem in the vehicle at the end of development costs a redesign. First edition. It was issued on 31 December 2025 and has been in force since 1 July 2026, as a first edition. The document is under the responsibility of the Ministry of Industry and Information Technology. This page is published from the official record of the 2025 edition; the clause text of a standard this recent is not yet in circulation, and the figures, limits and tables it contains are those of the document itself, delivered in full with the English translation.

This document specifies the general testing requirements for electromagnetic compatibility (EMC) of vehicle integrated circuits (ICs) and describes the corresponding testing methods. This document applies to radio frequency (RF) transmission and RF immunity in the 150kHz~6GHz frequency range of vehicle ICs, as well as pulse immunity. Degree and system-level electrostatic discharge (ESD) immunity. This document provides a general specification. Specific IC testing items and levels should refer to the relevant product standards, or be agreed upon by the IC user and manufacturer. The agreement is finalized.

2 Normative references

The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included. For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies. This document.

GB/T 19951-2019 Test methods for the immunity of electrical/electronic components of road vehicles to electrostatic discharge

GB/T 42968.1 Measurement of electromagnetic immunity of integrated circuits - Part

3.1 Terms and Definitions The terms and definitions defined in GB/T 42968.1 and

GB/T 44937.1, as well as the following terms and definitions, apply to this document.

3.1.1 pin The interface between the IC and its circuit environment.

3.1.2 globalpin The pin that enters or leaves the circuit board containing the signal or power supply; there are no active devices between this pin and the circuit board. [Source:

GB/T 44806.1-2024, 3.1.1]

4 Direct injection of radio frequency power

GB/T 42968.8-2023 Measurement of electromagnetic immunity of integrated circuits-Part

8 Measurement of radiated immunity-IC stripline method

GB/T 43034.3-2023 Measurement of Pulse Immunity of Integrated Circuits - Part

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 25 pages — is available in the English PDF.

Referenced standards

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