GB/T 42972-2023Microwave circuits—Test methods for detector (English PDF)
微波电路 检波器测试方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
September 7, 2023
Implementation date
January 1, 2024
Scope
GB/T 42972-2023 is the English-translated version of 微波电路 检波器测试方法.
This document describes the methods for testing the electrical parameters of detectors in microwave circuits. The document applies to the testing of detectors in single-device, monolithic and hybrid integrated microwave circuits, including detector diodes, root mean square detectors, logarithmic detectors and envelope or peak detectors. Annex A gives which parameters are tested for each type of detector.
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Document preview — GB/T 42972-2023
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 55
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- PrefaceI
- 1 Scope
- 2 Normative reference documents
- 3 Terms and Definitions
- 4 General requirements
- 4.1 Test environment requirements
- 4.2 Test instrument
- 4.3 Note
- 5 Detailed requirements
- 5.1 Output voltage
- 5.2 Forward voltage drop
- 5.3 Forward voltage drop difference
- 5.4 Forward current
- 5.5 Reverse current
- 5.6 Reverse breakdown voltage
- 5.7 Input voltage standing wave ratio
- 5.8 Voltage sensitivity
- 5.9 Current sensitivity
- 5.10 Video resistor
- 5.11 Tangential sensitivity
- 5.12 Frequency response flatness
- 5.13 Output slope
- 5.14 Output intercept
- 5.15 Linearity
- 5.16 Dynamic range
- 5.17 Maximum input power
- 5.18 Minimum input power
- 5.19 Dynamic range center point
- 5.20 Temperature sensitivity
- Appendix A (informative) Correspondence between detector types and test parameters
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.
1 Scope
This document describes the electrical parameter testing methods of detectors (hereinafter referred to as "detectors") in microwave circuits.
This document is suitable for electrical parameter testing of detectors in single-tube, monolithic and hybrid integrated microwave circuits, including detector diodes, root mean square Detectors, logarithmic amplification detectors, envelope/peak detectors, etc.
Note: See Appendix A for the correspondence between detector types and test parameters.
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1: General principles
3 Terms and definitions
The following terms and definitions apply to this document.
3.1 Output voltage
The voltage value of the output signal.
3.2 Forward voltage drop
forwardvoltage The voltage produced between two terminals by the flow of forward current.
3.3 DeltaVF
The voltage difference between two ends caused by the flow of different forward currents.
3.4 Forward current
The current caused by the forward voltage drop across the detector.
3.5 Reverse current
The current caused by the reverse voltage drop across the detector.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 18 pages — is available in the English PDF.
Referenced standards
Normative references
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