GB/T 42970-2023Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits (English PDF)

National Standard of the People's Republic of China

ICS

31.200

Classification

L 56

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

• Preface
• 1 Scope
• 2 Normative reference documents
• 3 Terms and Definitions
• 4 General Rule
• 4.1 Test environment requirements
• 4.2 Test items
• 4.3 Related documents
• 5 Static parameter test
• 5.1 Output high-level voltage VOH, output low-level voltage VOL
• 5.2 Input high-level current IIH, input low-level current IIL
• 5.3 Output high impedance current IOZ
• 6 Dynamic Parameter Test
• 6.1 Digital interface timing parameters
• 6.2 Video signal amplitude VO
• 6.3 Luminance nonlinear distortion LNL
• 6.4 Brightness short-term waveform distortion STDLUM
• 6.5 Brightness signal-to-noise ratio SNRLUM
• 6.6 Chroma signal-to-noise ratio SNRCHROM
• 6.7 Differential gain distortion DG
• 6.8 Differential Phase Distortion DP
• 6.9 Amplitude-frequency characteristics AF
• 6.10 Chroma-luminance gain difference deltaSC-LUM
• 6.11 Chroma-luminance delay difference tSC-LUM
• 6.12 Field Time Waveform Distortion DVS
• 6.13 Line time waveform distortion DHS
• 6.14 Horizontal sync signal amplitude VHS, color burst signal amplitude VSC
• 6.15 Color burst signal frequency fSC
• 6.16 Pixel clock frequency fLLC
• 6.17 Line frequency fHS
• 6.18 Field frequency fVS
• 6.19 Video resolution Resolution
• 6.20 Clamping current ICLAMP