GB/T 42744-2023Microwave circuit—Measuring methods for electrically controlled attenuator (English PDF)
微波电路 电调衰减器测试方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
August 6, 2023
Implementation date
March 1, 2024
Scope
GB/T 42744-2023 is the English-translated version of 微波电路 电调衰减器测试方法.
This document describes the methods for measuring the principal electrical parameters of electrically controlled attenuators in microwave circuits. The document applies to the measurement of those parameters for monolithic and hybrid integrated microwave electrically controlled attenuators.
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Document preview — GB/T 42744-2023
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 56
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- 1 Scope
- 2 Normative reference documents
- 3 Terms and Definitions
- 4 General requirements
- 4.1 Test environment
- 4.2 Test instrument
- 4.3 Note
- 5 Detailed requirements
- 5.1 Insertion loss (Lins)
- 5.2 In-band fluctuation (deltaL0)
- 5.3 Attenuation (Aatt)
- 5.4 Attenuation flatness (deltaA)
- 5.5 Attenuation range (Aran)
- 5.6 Attenuation temperature stability (Atem), attenuation temperature coefficient (alphaA)
- 5.7 Attenuation accuracy (Aaur)
- 5.8 Amplitude consistency (deltaAn0)
- 5.9 Phase consistency (deltaphin0)
- 5.10 Input and output standing wave ratio (VSWRin, VSWRout)
- 5.11 ndB compression input power (Pi(ndB))
- 5.12 Intermodulation distortion (dual frequency) (Pn/P1)
- 5.13 n-order intersection point input power (IIPn)
- 5.14 Additional phase shift (Phrlv)
- 5.15 Turn-on time (ton), turn-off time (toff), rise time (trise), fall time (tfal)
- 5.16 Maximum power withstand (Pmax)
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting.
1 Scope
This document describes the testing methods for the main electrical parameters of electronically controlled attenuators in microwave circuits.
This document is applicable to the relevant electrical parameter testing of monolithic and hybrid integrated microwave electrically adjustable attenuators (hereinafter referred to as attenuators).
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document.
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1: General principles
3 Terms and definitions
The following terms and definitions apply to this document.
3.1 Insertion loss
Lins In the linear working area of the attenuator, the ratio of incident power to output power in the reference state.
3.2 In-band ripple pass band ripple
deltaL0 The maximum change in reference state insertion loss in decibels (dB) at different frequencies.
3.3 Attenuation attenuation value
In the linear working area of the attenuator, the attenuation state insertion loss and reference state insertion loss under the specified control voltage are expressed in decibels (dB). bit difference.
3.4 Attenuation flatness
deltaA At different frequencies, the maximum change in attenuation at a specified control voltage in decibels (dB).
3.5 Attenuation range
Aran The available attenuation controls the maximum amount of attenuation.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 20 pages — is available in the English PDF.
Referenced standards
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