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GB/T 40300-2021Microbeam analysis - Analytical electron microscopy - Vocabulary (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

August 20, 2021

Implementation date

March 1, 2022

Scope

GB/T 40300-2021 (Microbeam analysis - Analytical electron microscopy - Vocabulary) is available as an English-translated PDF.

GB/T 40300-2021 is the Chinese standard "Microbeam analysis - Analytical electron microscopy - Vocabulary". Its scope clause reads: This document defines the terms used in AEM practice.

The terms that contain general concepts and specific concepts are Self-level classification. This document applies to all standardized documents related to AEM practice.

In addition, some parts of this document are applicable to related fields (e.g. TEM, STEM, SEM, EPMA, EDX) definitions of general terms. Its clauses include abbreviations.

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Document preview — GB/T 40300-2021

National Standard of the People's Republic of China

ICS: 71.040.40
Classification: G 04

Issued by: State Administration for Market Regulation, China National Standardization Administration

Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviations
4 Analyze basic terminology of electron microscopy physics
5 Analytical electron microscope instrument terminology
6 Common terminology of analytical electron microscopy specimen preparation
7 Analyze the terminology of electron microscopy imaging and image processing
8 Analyze the interpretation of electron microscopy images and analytical terms
9 Analyze the terminology of electron microscopy image magnification and resolution measurement and calibration
10 Analyze the terminology of electron diffraction in electron microscopy

1 Scope

This document defines the terms used in AEM practice. The terms that contain general concepts and specific concepts are

Self-level classification.

This document applies to all standardized documents related to AEM practice. In addition, some parts of this document are applicable to related fields (e.g.

TEM, STEM, SEM, EPMA, EDX) definitions of general terms.

2 Normative references

There are no normative references in this document.

3 Abbreviations

AEM Analytical Electron Microscope/Analytical Electron Microscopy (analyticalelectronmicroscope/analyticalelectron microscopy)

CBED convergent beam electron diffraction (convergentbeamelectrondiffraction)

CCD charge-coupled device (charge-coupled device)

CRT cathode ray tube (cathoderaytube)

EDS X-ray energy spectrometer (energy-dispersiveX-rayspectrometer)

EDX X-ray energy spectroscopy (energy-dispersiveX-rayspectroscopy)

EELS electron energy loss spectrometer/electron energy loss spectrometer (electronenergylossspectrometer/electronen- ergylossspectroscopy)

EPMA electron probe microanalysis/electronprobe microanalysis instrument (electronprobemicroanalysis/electronprobe microanalyser)

FFT fast Fourier transform (fastFouriertransform)

FIB focused ion beam (focusedionbeam)

FWHM (spectral peak) full width at half maximum (fulwidthathalfmaximum)

HAADF (high-angleannulardarkfield) (high-angleannulardarkfield)

HREM high-resolution transmission electron microscopy/high-resolution transmission electron microscopy (high-resolution transmission electron microscopy) microscope/high-resolutiontransmissionelectronmicroscopy)

LAADF (low-angleannulardarkfield) (low-angleannulardarkfield)

MBA microbeamanalysis

SE secondary electron (secondaryelectron)

SEM scanning electron microscope/scanning electron microscopy (scanningelectronmicroscope/scanningelectronmi- croscopy)

STEM Scanning Transmission Electron Microscope/Scanning Transmission Electron Microscope (scanningtransmissionelectronmicroscope/ scanningtransmissionelectronmicroscopy)

TEM Transmission electron microscope/transmission electron microscopy (transmissionelectronmicroscope/microscopy)

GB/T 40244 | GB/T 35924 | GB/T 35930 | GB/T 22461.3 | GB/T 18295 | […]

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.

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