GB/T 36655-2018Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method (English PDF)
电子封装用球形二氧化硅微粉中α态晶体二氧化硅含量的测试方法 XRD法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
September 17, 2018
Implementation date
January 1, 2019
Scope
GB/T 36655-2018 is the English-translated version of 电子封装用球形二氧化硅微粉中α态晶体二氧化硅含量的测试方法 XRD法.
GB/T 36655-2018 is an X-ray diffraction (XRD) method for measuring how much alpha crystalline silicon dioxide is present in the spherical silica powder used in electronic packaging.
The method relies on the fact that crystalline and amorphous silica give different X-ray scattering patterns, and that the scattering intensity of the crystalline phase is proportional to its content.
It gives a semi-quantitative result at 0.5% or less and a quantitative one from 0.5% to 5%. The standard defines spherical silica powder made by flame spheroidizing, high-temperature melt jetting or plasma, and specifies the polycrystalline X-ray diffractometer with copper target, the analytical balance and the crystalline silica reference powder.
Laboratories may also apply it to other amorphous silica. It was issued on 17 September 2018 and has applied since 1 January 2019.
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Document preview — GB/T 36655-2018
National Standard of the People's Republic of China
- ICS
- 31.030
- Classification
- L 90
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Principle of the method
- 5 Instruments and management samples
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
1 Scope
This standard specifies the XRD test method for the content of alpha-state crystalline silica in spherical silica micropowder for electronic packaging.
This standard is applicable to the detection of alpha-state crystalline silica content in spherical silica micropowder for electronic packaging, other amorphous silica.
The detection of the content can also be carried out with reference to this standard. alpha-state crystalline silica content test range of 0.5% or less semi-quantitative analysis, 0.5% to 5% Quantitative analysis.
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this document. For undated references, the latest edition (including all amendments) applies to this document.
General rules for JY/T 009 target polycrystalline X-ray diffraction method
3 Terms and definitions
The following terms and definitions apply to this document.
3.1 Spherical silica micropowder for electronic packaging
It is prepared by flame ball formation, high temperature melt jet method or plasma method, and is applied to spherical silica fine powder in the field of electronic packaging.
4 Principle of the method
Crystalline silica and amorphous silica each have a unique X-ray scattering pattern under characteristic X-ray irradiation, crystal dioxide The scattering intensity of silicon is proportional to its content.
5 Instruments and management samples
5.1 Instrumentation
5.1.1 Polycrystalline X-ray diffractometer
With microcomputer, copper target, slit, filter and step scan mode function.
5.1.2 Analytical balance
The sensation is 0.1 mg.
5.2 Management samples
5.2.1 Crystalline silica powder
The silica content is greater than 99.99%, and the suitable particle size ranges from 2 µm to 10 µm.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
Normative references
JY/T 009
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