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GB/T 31359-2015Test methods of semiconductor lasers (English PDF)

半导体激光器测试方法

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

February 4, 2015

Implementation date

August 1, 2015

Scope

GB/T 31359-2015 is the English-translated version of 半导体激光器测试方法.

GB/T 31359-2015 is the Chinese standard "Test methods of semiconductor lasers". Its scope clause reads: This standard specifies the test method for a semiconductor laser main photoelectric parameters.

This standard applies to testing the semiconductor laser main photoelectric parameters. The semiconductor laser component can refer executed. Its clauses include terms, definitions and symbols.

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Document preview — GB/T 31359-2015

National Standard of the People's Republic of China

ICS
31.260
Classification
L 51

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

  • Introduction
  • 1 Scope
  • 2 Normative references
  • 3 Terms, definitions and symbols
  • 3.1 Terms and definitions
  • 3.2 Symbols and units
  • 4 Test conditions and requirements
  • 4.1 Environmental Requirements
  • 4.2 Test equipment and measurement requirements
  • 4.3 Laser Safety Requirements
  • 4.4 tested products to work in claim
  • 4.5 Other Requirements
  • 5 Test Method
  • 5.1 output optical power test
  • 5.2 average power test
  • 5.3 Peak Power Test
  • 5.4 Test pulse energy
  • 5.5 output power instability Test
  • 5.6 output energy instability test
  • 5.7 Operating Current
  • 5.8 Operating voltage
  • 5.9 threshold current
  • 5.10 slope efficiency of
  • 5.12 Wavelength - Temperature drift
  • 5.13 peak wavelength of
  • 5.16 degree of polarization
  • 5.18 pulse width
  • 5.19 light intensity distribution
  • 5.20 beam width
  • 5.21 fast axis divergence and the slow axis divergence
  • 5.23 cut-off frequency of

1 Scope

This standard specifies the test method for a semiconductor laser main photoelectric parameters.

This standard applies to testing the semiconductor laser main photoelectric parameters. The semiconductor laser component can refer executed.

2 Normative references

The following documents for the application of this document is essential, dated references, only the dated version suitable for use herein

Member. For undated references, the latest edition (including any amendments) applies to this document.

GB 7247.1 Safety of laser products - Part 1. Equipment classification, requirements

Electrical safety GB/T 10320 laser equipment and facilities

GB/T 15313 Laser term

GB/T 31358-2015 General specification for semiconductor lasers

3 Terms, definitions and symbols

3.1 Terms and Definitions

GB/T 15313, the terms and definitions GB/T 31358-2015 defined apply to this document.

3.2 Symbols and units

The symbols and units listed in Table 1 are applicable to this document.

Table 1 Symbols and units

Term Symbol Unit

Optical output power Pop mW, W

Average power Pavg mW, W

Pulse energy EJ, mJ

Peak power Pp mW, W

Output power instability SPt -

Output energy instability SEt -

Peak wavelength lambdap nm

deltalambdaFWHM nm spectral width

Center wavelength lambdac nm

Operating current Iop mA, A

Operating voltage Vop mV, V […]

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 27 pages — is available in the English PDF.

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