GB/T 21548-2021Methods of measurement of the high speed semiconductor lasers directly modulated for optical fiber communication systems (English PDF)

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009.

This standard replaces GB/T 21548-2008 "Measurement method of high-speed direct modulation semiconductor lasers for optical communications".

Compared with GB/T 21548-2008, the main technical changes are as follows.

---Modified the scope description (see Chapter 1, Chapter 1 of the 2008 edition);

--- Deleted GB/T 17626 series standards, YD/T 701-1993, YD/T 1111.2-2001, YD/T 767-1995 and

IEC 62007-2 cited GB/T 15651-1995 and GB/T 31359-2015 (see Chapter 2, 2008 Chapter 2 of the Year Edition);

--- Deleted peak wavelength and center wavelength, threshold current, optical power-drive current linearity, distribution feedback, spectral width, multiple quantum The definitions of well distributed feedback, side mode suppression ratio, carrier-to-noise ratio, combined second-order intermodulation, combined third-order beat, and modified semiconductor lasers The definition of its components (see Chapter 3, 3.2 of the 2008 edition);

--- Deleted many abbreviations such as analog bandwidth, and added PAM4 abbreviations (see Chapter 4, 2008 edition 3.1);

--- Deleted the laser characteristics and classification (see 5.2 in the 2008 edition);

---Added the description of the measurement scheme for wavelength division multiplexing semiconductor laser components (see 5.1);

---Modified the requirements for environmental conditions and measuring instruments (see 5.2 and 5.3, 5.3.1 of the 2008 edition);

---Deleted requirements for measuring equipment and instruments (see 5.3.1.2, 5.3.2.1, 5.3.3.1, 5.3.4.1, 5.3.5.1, 5.3.6.1, 5.3.7.1, 5.3.8.1, 5.3.9.1, 5.3.10.1, 5.3.11.1, 5.3.12.1);

---Modified the threshold current measurement method (see 5.4.2, 5.3.3 of the 2008 edition);

---The measurement method of slope efficiency has been added (see 5.4.2);

---Added the description of the eye diagram measurement method of four-level pulse amplitude modulation (see 5.4.6);

---Modified the measurement of S11 parameters (see 5.4.7, 5.3.8 of the 2008 edition);

---Modified the measurement of the wavelength-temperature drift coefficient (see 5.4.10, 5.3.11 of the 2008 edition);

---Modified the measurement method of relative intensity noise (see 5.4.11, 5.3.12 of the 2008 edition);

---The measurement methods of carrier-to-noise ratio, combined second-order intermodulation and combined third-order beat, reliability test and classification and product inspection methods have been deleted (See Appendix A, Appendix B, Appendix C and Appendix D of the 2008 edition);

---Added the single-channel semiconductor laser component packaging structure and the wavelength division multiplexing laser component packaging structure diagram (see appendix A).

1 Scope

This standard specifies the classification and measurement methods of high-speed direct modulation lasers and their components for optical communications.

This standard applies to high-speed direct modulation lasers and their components used in optical communication systems such as optical transmission networks, optical access networks, and data centers.

The photoelectric characteristics measurement of the analog optical communication system and other optical systems used in the laser and its components can also be used as a reference.

2 Normative references

The following documents are indispensable for the application of this document. For dated reference documents, only the dated version applies to this document. For undated reference documents, the latest version (including all amendments) is applicable to this document.

GB/T 15651-1995 Semiconductor Devices Discrete Devices and Integrated Circuits Part 5: Optoelectronic Devices

GB/T 31359-2015 Semiconductor laser test method

3 Terms and definitions

The following terms and definitions defined in GB/T 15651-1995 apply to this document.