GB/T 18735-2014Microbeam analysis - General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) (English PDF)
微束分析 分析电镜（ＡＥＭ／ＥＤＳ）纳米薄标样通用规范
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
July 24, 2014
Implementation date
March 1, 2015
Scope
GB/T 18735-2014 is the English-translated version of 微束分析 分析电镜（ＡＥＭ／ＥＤＳ）纳米薄标样通用规范.
GB/T 18735-2014 is the Chinese standard "Microbeam analysis - General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)".
Its scope clause reads: This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with X-ray energy attachments Spectroscopy (EDS), measuring the scale factor KA-B nano-thin standard technical requirements, test conditions and measurement methods.
This standard applies to the use of electron microscopy analysis (AEM/EDS) micro-area element of the inorganic thin samples of quantitative analysis. This standard does not include Machines and biological standards. Its clauses include terms and definitions.
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Document preview — GB/T 18735-2014
National Standard of the People's Republic of China
- ICS
- 71.040.50
- Classification
- G 04
- Replacing
- GB/T 18735-2002
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 thin standard technical requirements
- 5.1 detection equipment
- 5.2 sample stage
- 5.3 measurement conditions and method
- 5.4 Standard discrimination based on thin
- 6 Standard Classification
- 6.1 Determination of the chemical composition of thin Sample
- 6.2 Thin standard level determined
- 7 Packaging and storage
- 7.1 Standard Package
- 7.2 Transport
- 7.3 safekeeping
- 7.4 Validity of the standard
1 Scope
This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with X-ray energy attachments
Spectroscopy (EDS), measuring the scale factor KA-B nano-thin standard technical requirements, test conditions and measurement methods.
This standard applies to the use of electron microscopy analysis (AEM/EDS) micro-area element of the inorganic thin samples of quantitative analysis. This standard does not include
Machines and biological standards.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 4930-2008 micro-beam electron microprobe analysis standard sample analysis the technical conditions Guidelines (ISO 14595.2003, IDT)
GB/T 21636-2008 micro beam analysis electron probe microanalysis (EPMA) Terminology (ISO 23833.2006, IDT)
3 Terms and Definitions
GB/T 21636-2008 define the following terms and definitions apply to this document.
3.1 Analysis of electron microscopy
Means is equipped with X-ray energy dispersive spectroscopy (EDS) transmission electron microscope or a transmission electron microscope equipped with a scanning attachment can be performed simultaneously on Micro
Elemental analysis.
3.2 Critical thickness
TS Under certain acceleration voltage absorption effect of the X-ray region of the sample analysis can be ignored and do not need the maximum absorption correction when thickness.
Note. TS available critical thickness formula (1).
TS = 1 (5rho | µB-µA | cscalpha) (1)
Where.
rho --- density of the sample;
MA --- A characteristic element of the X-rays in the sample mass absorption coefficient;
Characterized µB --- element B X-rays in the sample mass absorption coefficient;
alpha --- X-ray spectrometer associated X-ray detection angle.
3.3 Scaling factor ratiofactor
KA-B
At a certain voltage, the known composition and thickness less than or equal to the critical thickness of thin samples, from the same micro-elements measured simultaneously […]
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Similar standards
Editions of GB/T 18735
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 18735-2014 | Microbeam analysis - General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) | current edition | Current |
| GB/T 18735-2002 | Microbeam analysis - General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) | previous edition | Superseded |
This page sells the current edition, GB/T 18735-2014. Earlier editions are listed for reference only.
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