YS/T 719-2009Flat magneting sputtering target. Silicon target for optical coating (English PDF)
平面磁控溅射靶材光学薄膜用硅靶
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
December 4, 2009
Implementation date
June 1, 2010
Scope
YS/T 719-2009 is the English-translated version of 平面磁控溅射靶材光学薄膜用硅靶.
YS/T 719-2009 — This standard specifies the optical thin film planar magnetron sputtering using a silicon target requirements, test methods, inspection rules, marking, packaging, transportation and storage and purchase order (or contract) content. This standard applies to planar magnetron sputter optical film silicon target.
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Document preview — YS/T 719-2009
National Standard of the People's Republic of China
- ICS
- 77.150.99
- Classification
- H 63
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This standard specifies the planar magnetron sputtering target of optical thin film silicon requirements, test methods, inspection rules, marking, packaging, transportation, storage and purchase order (or contract) content. This standard applies to planar magnetron sputtering optical thin film silicon target.
Document data
International classification (ICS): 77.150.99.
Chinese classification (CCS): H63.
Estimated length of the Chinese original: 6,633 words.
Standards quoted by this document
GB/T 1551; GB/T 2040; GB/T 5121; GB/T 5231; GB/T 12963
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 4 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 1551Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 2040Copper and copper alloy sheet
- GB/T 5231Designation and chemical composition of wrought copper and copper alloys
- GB/T 12963Electronic-grade polycrystalline silicon
GB/T 5121
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Related Standards
GB/T 12963-2022 — Electronic-grade polycrystalline silicon
GB/T 1551-2021 — Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
GB/T 15510-2008 — General rules for reliability test of electromagnetic relay for control circuits
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YS/T 719-2009
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