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JB/T 13150-2017Nondestructive testing instrument - Variable array probe for eddy current testing instrument (English PDF)

无损检测仪器涡流检测仪用变阵列探头

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Issued by

MIIT

Level / Type

Industry · Recommended

Issue date

April 12, 2017

Implementation date

January 1, 2018

Scope

JB/T 13150-2017 is the English-translated version of 无损检测仪器涡流检测仪用变阵列探头.

JB/T 13150-2017 is a recommended standard of the Chinese mechanical and machinery industry and belongs to the group covering nondestructive testing instruments.

Its subject is the variable array probe used with eddy current testing instruments. The standard lays down the technical requirements for such probes, the performance tests by which they are checked, and the inspection rules that govern their acceptance.

It is filed under the Chinese classification N77, and the issuing agency is the Ministry of Industry and Information Technology. It quotes GB/T 191-2008, GB/T 6587-2012, GB/T 12604.6, GB/T 25480-2010, JB/T 6147 and JB/T 11780-2014.

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Document preview — JB/T 13150-2017

National Standard of the People's Republic of China

Issued by: Ministry of Industry and Information Technology of the People's Republic of China

Foreword
Scope
Normative references
About this standard
Classification and status

1 Foreword

JB/T 13150-2017 was issued by MIIT on 12 April 2017.

2 Scope

This standard is a recommended standard of the Chinese mechanical and machinery industry and belongs to the group covering nondestructive testing instruments. Its subject is the variable array probe used with eddy current testing instruments. The standard lays down the technical requirements for such probes, the performance tests by which they are checked, and the inspection rules that govern their acceptance. It is filed under the Chinese classification N77, and the issuing agency is the Ministry of Industry and Information Technology. It quotes GB/T 191-2008, GB/T 6587-2012, GB/T 12604.6, GB/T 25480-2010, JB/T 6147 and JB/T 11780-2014.

3 Normative references

JB/T 13150-2017 cites the following standards, which apply in full or in part through the references made to them in its clauses.

GB/T 191-2008

GB/T 6587-2012 — General specification for electronic measuring instruments

GB/T 12604.6

GB/T 25480-2010 — Basic environmental conditions and testing methods for transportation and storage of instruments

JB/T 6147

JB/T 11780-2014 — Non-destructive Testing Instrument - Characterization and Verification of Array Eddy Current Testing Instrument

4 About this standard

Issued by: MIIT

English translation: about 15 pages

5 Classification and status

Prefix JB/T: recommended standard.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

Referenced standards

Normative references

Similar standards

NB/T 47013.18-2024|GB/T 33889-2017|JB/T 13158-2017|GB/T 41055-2021|GB/T 34370.7-2020|NB/T 47013.13-2015

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