GB/T 5201-1994Test procedures for semiconductor charged particle detectors (English PDF)

GB/T 5201-1994 is the English-translated version of 带电粒子半导体探测器测试方法.

GB/T 5201-1994 is the Chinese national standard "Test procedures for semiconductor charged particle detectors". It was issued on December 22, 1994 by the State Bureau of Technical Supervision, and took effect on October 1, 1995. It is obsolete: it has been replaced by GB/T 5201-2012.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.

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