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GB/T 4937.20-2018Semiconductor devices -- Mechanical and climatic test methods -- Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

September 17, 2018

Implementation date

January 1, 2019

Scope

GB/T 4937.20-2018 (Semiconductor devices -- Mechanical and climatic test methods -- Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat) is available as an English-translated PDF.

GB/T 4937.20-2018 — This part of GB/T 4937 specifies the soldering heat evaluation method for plastic-sealed surface mount semiconductor devices (SMD). The test is broken Bad test.

Document preview — GB/T 4937.20-2018

National Standard of the People's Republic of China

ICS
31.080.01
Classification
L 40

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

  • Foreword
  • 1 Scope
  • 2 Normative references
  • 3 General
  • 4 Test equipment and materials
  • 4.1 Damp heat test chamber
  • 4.2 Reflow soldering equipment
  • 4.3 substrate
  • 4.4 Wave soldering equipment
  • 4.5 Solvents for gas phase reflow soldering
  • 4.6 Flux
  • 4.7 solder
  • 5 procedures
  • 5.1 Initial test
  • 5.2 Drying
  • 5.3 Water vapor impregnation
  • 30 ° C, 30% RH, 1 year -
  • 5.4 Welding heat
  • 5.5 Recovery
  • 5.6 Final inspection

Foreword

GB/T 4937 "Mechanical and Climatic Test Methods for Semiconductor Devices" consists of the following components.

--- Part 1. General;

--- Part 2. Low pressure;

--- Part 3. External visual inspection;

--- Part 4. Strongly accelerated steady-state damp heat test (HAST);

---Part 5. Steady-state temperature and humidity bias life test;

---Part 6. High temperature storage;

--- Part 7. Internal water vapor content test and other residual gas analysis;

--- Part 8. Sealing;

---Part 9. Logo durability;

--- Part 10. Mechanical shock;

--- Part 11. rapid temperature change double tank method;

--- Part 12. Sweeping vibration;

--- Part 13. Salt spray;

--- Part 14. Terminal strength (lead robustness);

---Part 15. Resistance to soldering of through-hole mounting devices;

--- Part 16. Particle collision noise detection (PIND);

---Part 17. Neutron irradiation;

---Part 18. Ionizing radiation (total dose);

---Part 19. Chip shear strength;

--- Part 20. The combined effects of moisture-resistant and soldering heat on plastic surface mount devices;

---Part 20-1. Operation, packaging, marking and transport of surface mount devices sensitive to the combined effects of moisture and soldering heat;

---Part 21. Solderability;

---Part 22. Bonding strength;

--- Part 23. High temperature working life;

--- Part 24. Accelerated moisture-resistant and non-biased strong accelerated stress test (HSAT);

---Part 25. Temperature cycling;

--- Part 26. Electrostatic discharge (ESD) sensitivity test human body model (HBM);

--- Part 27. Electrostatic discharge (ESD) sensitivity test mechanical model (MM);

--- Part 28. Electrostatic discharge (ESD) sensitivity test, charged device model (CDM), device level;

---Part 29. Latch test;

--- Part 30. Pre-treatment of unsealed surface mount devices prior to reliability testing;

--- Part 31. Flammability of plastic encapsulated devices (internal);

--- Part 32. Flammability of plastic encapsulated devices (external);

---Part 33. Accelerated moisture resistance without bias high pressure cooking;

--- Part 34. Power cycling;

--- Part 35. Acoustic scanning microscopy of plastic electronic components;

---Part 36. Constant acceleration;

--- Part 37. Plate-level drop test method using accelerometers;

--- Part 38. Soft error test methods for semiconductor memory devices;

--- Part 39. Measurement of moisture diffusivity and water dissolution rate of raw materials for semiconductor components;

--- Part 40. Plate-level drop test method using tension meter;

--- Part 41. Reliability test methods for non-volatile memory devices;

--- Part 42. Storage of temperature and humidity;

--- Part 43. Guide to the reliability identification scheme for integrated circuits (ICs);

--- Part 44. Test method for neutron beam irradiation single particle effect of semiconductor devices.

This part is the 20th part of GB/T 4937.

This part is drafted in accordance with the rules given in GB/T 1.1-2009.

This part uses the translation method equivalent to IEC 60749-20.2008 "Semiconductor device mechanical and climatic test methods Part 20.

Plastic surface mount devices are resistant to moisture and solder heat.

The documents of our country that have a consistent correspondence with the international documents referenced in this part are as follows.

-- GB/T 4937.3-2012 Methods of test for mechanical and climatic methods of semiconductor devices - Part 3. External visual inspection (IEC 60749-

3.2002, IDT)

1 Scope

This part of GB/T 4937 specifies the soldering heat evaluation method for plastic-sealed surface mount semiconductor devices (SMD). The test is broken

Bad test.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article.

Pieces. For undated references, the latest edition (including all amendments) applies to this document.

IEC 60068-2-20.2008 Environmental testing of electric and electronic products - Part 2-20. Test methods Test T.

Weldability and solder heat resistance test method (Enviralmentaltesting-Part 2-20. Tests-TestT. Testmethodsforsolder-

Abilityandresistancetosolderingheatofdeviceswithleads)

Methods of mechanical and climatic test methods for semiconductor devices - Part 3. External visual inspection (Semiconductor devices -

Mechanicalandclimatictestmethods-Part 3. Externalvisualexamination)

Methods of mechanical and climatic test methods for semiconductor devices - Part 35. Scanning acoustic microscopy

Mirror inspection (Semiconductordevices-Mechanical and climatictestmethods-Part 35. Acousticmicroscopy

Forplasticencapsulatedelectroniccomponents)

3 General

The welding heat test will increase the pressure of moisture in the SMD (which SMD absorbs during storage), causing the SMD plastic package to rupture.

And electrical performance is ineffective. This section simulates the moisture absorbed by SMD stored in a warehouse or dry packaging environment.

Evaluation of welding thermal performance.

4 Test equipment and materials

4.1 Damp heat test chamber

The damp heat test chamber shall be capable of providing a temperature and relative humidity environment as specified in 5.3.

4.2 Reflow soldering equipment

The temperature profile provided by the infrared convection and gas phase reflow equipment shall be capable of complying with the welding heat conditions specified in 5.4.2 and 5.4.3. again

The temperature setting of the flow soldering equipment should be set according to the temperature curve, which refers to the surface temperature of the sample during the welding heat test, and the measuring method

As shown in Figure 1.

Note. Adhesives or thin tapes have good thermal conductivity.

Figure 1 Sample temperature curve measurement method

4.3 substrate

Except as otherwise provided in the relevant documents, any sheet, such as glass fiber or polyimide, can be used as the substrate. Use a conventional method to solidify the sample

Set on the substrate, as shown in Figure 1. If the shape of the sample terminal is changed according to Figure 1, and the electrical parameters are abnormal, it should be selected.

Choose the assembly method that avoids the shape change of the leading end and specify it in the relevant documents.

4.4 Wave soldering equipment

Wave soldering equipment shall meet the conditions specified in 5.4.4. Generally, molten solder should be able to flow.

4.5 Solvents for gas phase reflow soldering

Full fluorocarbons should be used.

4.6 Flux

Flux consists of 25% ethanol and 75% isopropanol, as specified in the relevant documents. See IEC 60068 for details.

2-20. Provisions of Appendix B of.2008.

4.7 solder

The solder composition specified in Table 1 of IEC 60068-2-20.2008 is used.

5 procedures

5.1 Initial test

5.1.1 Visual inspection

Before the test, the visual inspection shall be carried out under a 40-fold microscope in accordance with the provisions of IEC 60749-3, and special attention shall be paid to the cracks on the outer surface.

Drum kit.

5.1.2 Electrical test

Electrical performance tests shall be performed when required by relevant documents.

5.1.3 Acoustic scanning internal inspection

Unless otherwise specified in the relevant documents, the internal cracks of the sample are examined using an acoustic scanning microscope in accordance with IEC 60749-35.

Layered.

5.2 Drying

Samples shall be baked at 125 ° C +/- 5 ° C for at least 24 h, unless otherwise specified in the relevant documentation.

5.3 Water vapor impregnation

5.3.1 General requirements

Unless otherwise specified in the relevant documents, the conditions of water vapor impregnation should be selected according to the packaging method of the sample (see A.1.1). If related text

The sample is specified to be baked before welding, and the sample is directly baked without water vapor impregnation.

5.3.2 SMD test conditions for non-dry packaging

The water vapor impregnation conditions shall be selected from Table 1 in accordance with the actual allowable limit storage conditions (see A.1.2.1).

Table 1 Water vapor immersion conditions of non-dry packaging SMD

condition

temperature

Relative humidity

duration

Actual allowable limit storage

A1 or B1 85+/-2 85+/-5 168+/-24 < 30°C, 85% RH

Note. Conditions A1 and B1 are SMD water vapor impregnation conditions for non-dry packaging in Method A or Method B.

5.3.3 Dry packaging of SMD water vapor impregnation
5.3.3.1 General requirements

The SMD water vapor immersion conditions of the dry package are shown in Table 2 or Table 3. Dry-packed SMD water vapor impregnation involves two steps. step one

Is to simulate the wet condition of SMD before opening the dry packaging or drying the locker; the second step is to simulate the SMD to open the package to the welding period.

Wet conditions. The SMD water vapor impregnation conditions for dry packaging should be selected from Method A or Method B. When the contractor specifies the SMD drying package

When the relative humidity in the installed or dried locker is between 10% and 30%, select Method A and select Method B when the relative humidity is less than 10%.

5.3.3.2 Method A

Except as otherwise provided in the relevant documents, the first step of condition A2 in Table 2 shall be carried out first, and then the table shall be carried out within 4 hours after the completion of step one.

Step 2 of Condition A2 in 2 (see A.1.2.2).

The relative humidity condition of step one should be consistent with the upper limit of the relative humidity in the moisture barrier bag. The relative humidity of step 2 should be related to the life of the workshop.

The pieces are consistent.

Water vapor immersion conditions other than moisture storage bag storage and workshop life are specified in Table 2, and other test conditions need to be relevant.

As stated in the document.

Table 2 SMD water vapor immersion conditions for dry packaging (Method A)

Conditional water vapor impregnation conditions

Dry packaging and drying lockers

Allowable storage conditions

Workshop life conditions

A2 step one condition

(85+/-2) °C, (30+/-5)% RH

168 24-0h

30 ° C, 30% RH, 1 year -

A2 step two conditions

(30+/-2) °C, (70+/-5)% RH

168 24-0h

- < 30°C, 70% RH, 168h

Note 1. Step 1 characterizes the storage conditions in SMD dry packaging or dry lockers, and also identifies the repackage caused by the distributor or user after inspection.

Storage conditions for increased relative humidity in dry packaging. When condition A2 is selected, the SMD is packaged in a moisture-proof bag with an IC reel and a desiccant.

Dry for a few weeks. The moisture barrier bag may be temporarily opened several times (once for a few hours). When the humidity indicator card in the dry package shows that the humidity is lower than

At 30%, SMD will return to its initial moisture absorption state after a few days of repackaging, allowing repackaging and inspection of SMD. under these circumstances,

It is considered that the moisture in the dry package is controlled, and it is not necessary to measure the water vapor content of the SMD (see A.2). For humidity control, humidity indication is required

Card correction.

Note 2. SMDs stored in dry packaging or dry lockers will gradually reach water vapor saturation after long-term storage, so when step 1

The water vapor immersion did not reach saturation, and the infiltration time was extended to 336 h. When the water vapor immersion in step one has reached saturation, the infiltration time is shortened.

5.3.3.3 Method B

The conditions for water vapor impregnation shall be selected from Table 3 and shall be consistent with the workshop life conditions specified in the relevant documents (see A.1.2.3).

Table 3 SMD water vapor immersion conditions for dry packaging (Method B)

Conditional water vapor impregnation conditions

From baking to dry packaging and drying

Packaging conditions for short opening

Workshop life conditions

B2

(85+/-2) °C, (60+/-5)% RH,

168 24-24h

< 30 ° C, 60% RH, 24 h < 30 ° C, 60% RH, 1 year

B2a

(30+/-2) °C, (60+/-5)% RH,

696 24-24h

< 30 ° C, 60% RH, 24 h < 30 ° C, 60% RH, 28d

B3

(30+/-2) °C, (60+/-5)% RH,

192 24-0h

< 30°C, 60% RH, 24h < 30°C, 60% RH, 168h

B4

(30+/-2) °C, (60+/-5)% RH,

96 24-0h

< 30 ° C, 60% RH, 24 h < 30 ° C, 60% RH, 72 h

B5

(30+/-2) °C, (60+/-5)% RH,

72 24-0h

< 30 ° C, 60% RH, 24 h < 30 ° C, 60% RH, 48 h

B5a

(30+/-2) °C, (60+/-5)% RH,

48 24-0h

< 30 ° C, 60% RH, 24 h < 30 ° C, 60% RH, 24 h

B6

(30+/-2) °C, (60+/-5)% RH,

6 24-0h

- < 30°C, 60% RH, 6h

Note 1. The water vapor immersion conditions of conditions B2 to B6 cover the conditions of Step 1 (30 ° C, 60% RH, 24 h) and the conditions of Step 2 (Workshop life).

Note 2. The relative humidity in the dry package exceeds 10% due to the moisture released by the wetted material and the degraded desiccant. Therefore, in SMD dry packaging

Items, IC reels, and other materials are thoroughly dried before being packaged in a moisture barrier bag. Relative humidity in dry packaging through humidity indicator card and SMD water

The steam content measurement is calibrated, see A.2.

Note 3. Because very low relative humidity cannot be obtained in dry lockers, it is not recommended to store SMD in a drying cabinet instead of a dry package.

Note 4. Condition B covers the entire SMD storage process from baking to soldering, including SMD from baking to packaging into dry packaging and dry packaging

Temporary opening and shelf life of the entire room temperature storage duration.

5.4 Welding heat

5.4.1 Overview

Unless otherwise specified in the relevant documents, the sample shall be subjected to a welding heat test within 4 hours after the completion of the water vapor impregnation or high temperature baking test.

According to the requirements of the relevant documents, the test methods and conditions for welding heat are selected from 5.4.2 to 5.4.4. No matter which test method you choose, soldering

The number of hot cycles is at least 1 time and up to 3 times. Except as otherwise provided in the relevant documents, the number of cycles of welding heat is one. If the number of cycles

More than 1 time, after the completion of one test, the temperature of the sample should be reduced to below 50 °C before the next test.

Note. If the sample is stored at room temperature for more than 4 hours without being affected by water vapor impregnation or baking, the storage time of more than 4 hours after water vapor impregnation or baking can be completed.

It is clearly stated in the relevant documents.

5.4.2 Heating method for infrared convection or convection reflow welding
5.4.2.1 Preparation

The sample is placed on a substrate.

5.4.2.2 Preheating

Except as otherwise provided in the relevant documents, the sample shall be placed in the reflow soldering equipment and preheated for 60 s in accordance with the temperature conditions specified in A.3.1.

120s.

5.4.2.3 Welding heat

After preheating, the temperature of the sample should first be raised to the peak temperature and then lowered to room temperature. According to the actual welding conditions, from Table 4 or Table 5

Select the heating conditions, which should be consistent with the relevant documents. See A.3.1 for temperature and time tolerances.

Note 1. In Tables 4 and 5, the test conditions of A are used for the temperature curve with a short actual welding time, and B is used for the temperature curve with a long actual welding time.

Note 2. After preheating, the sample temperature meets the requirements in Figure A.9, Figure A.10 or Table A.2.

Note 3. According to the context, the methods A and B in Table 4 and Table 5 and in the infrared convection reflow soldering are more suitable for condition IA and condition IB.

Table 4 Sn-Pb eutectic process---reflow soldering temperature classification

Package thickness

Mm

condition

Specified welding temperature

Test time

Corresponding volume temperature

< 350mm3 350mm3~2000mm3 >=2000mm3

< 2.5

A 10 240°C 240°C 225°C

B 20 240°C 225°C 225°C

>=2.5

A 10 240°C 240°C 225°C

B 20 225°C 225°C 225°C

Table 5 Lead-free process---Reflow soldering temperature classification

Package thickness

Mm

condition

Specified welding temperature

Test time

Corresponding volume temperature

< 350mm3 350mm3~2000mm3 >2000mm3

< 1.6

260°C 260°C 260°C

1.6~2.5

260°C 250°C 245°C

>2.5

250°C 245°C 245°C

5.4.3 Heating method for gas phase reflow soldering
5.4.3.1 Preparation

The sample should be mounted on a substrate.

5.4.3.2 Preheating

Unless otherwise specified in the relevant documents, the sample shall be placed in a gas phase reflow soldering apparatus and preheated for 60 s at a temperature of 100 ° C to 160 ° C.

120s.

5.4.3.3 Welding heat

After preheating, the temperature of the sample rises. When the sample temperature reaches 215 °C +/- 5 °C, keep 40s +/- 4s according to Table 6,

See A.3.2.

Table 6 Heating conditions for gas phase reflow soldering

condition

temperature

time

II-A 215+/-5 40+/-4

5.4.4 Wave soldering heating method
5.4.4.1 Preparation

The bottom surface of the sample is mounted on the substrate using an adhesive as specified in the relevant documentation. In addition to the relevant documents, in the sample and base

Do not use flux between the plates.

Note 1. If flux is used, vaporization of the solvent in the flux will affect the temperature rise of the sample. The flux cannot coat the body of the sample and is coated as much as possible

Pin and away from the sample body.

Note 2. If the pitch (the difference between the height of the bottom surface of the SMD body and the bottom surface of the lead) is less than 0.5 mm (the thickness of the SMD body is exceeded by using a heat sink to reduce the thermal resistance)

When the 2.0mm is excluded, it shall be tested by the welding heat test in A or B. When the thickness of the SMD body exceeds 3.0 mm, the welding heat in B is used.

Test conditions test. For SMD, the test conditions for A and B are more severe than the conditions for wave soldering III-A and III-B (refer to A.3.3).

Thus, conditions III-A and III-B are generally not employed.

5.4.4.2 Preheating

Except as otherwise provided in the relevant documents, the sample shall be placed in the welding equipment and preheated at 80 ° C ~ 140 ° C for 30 s ~ 60 s.

5.4.4.3 Welding heat

After preheating, the sample and substrate are immersed together in molten solder as shown in FIG. The infiltration conditions were selected from Table 7.

a) Infiltration begins b) End of infiltration

Figure 2 Wave soldering heating

Table 7 Wetting conditions of wave soldering

condition

Welding temperature

Infiltration time

Actual welding method

III-A 260+/-5 5+/-1 single peak

III-B 260+/-5 10+/-1 doublet

5.4.4.4 Cleaning

If flux is used, it should be removed according to the cleaning method specified in the relevant documents.

5.5 Recovery

If the recovery conditions are specified in the relevant documents, the samples shall be stored under standard atmospheric conditions for a specified period of time as required by the documentation.

Note. Wave soldering is not the welding method commonly used by the contractor. If the contractor does not have this equipment, the corresponding welding heat method is between the contractor and the user.

Provisions are made in the agreement between the two.

5.6 Final inspection

5.6.1 Visual inspection

After the test is completed, visual inspection is carried out under a 40-fold microscope in accordance with IEC 60749-3, and the cracks on the outer surface...

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.

Referenced standards

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